• Title/Summary/Keyword: Binary diffractive optical element (DOE)

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Diffractive Alignment of Dual Display Panels

  • Shin-Woong Park;Junghwan Park;Hwi Kim
    • Current Optics and Photonics
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    • v.8 no.1
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    • pp.72-79
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    • 2024
  • Recent flat-panel displays have become increasingly complicated to facilitate multiple display functions. In particular, the form of multilayered architectures for next-generation displays makes precise three-dimensional alignment of multiple panels a challenge. In this paper, a diffractive optical alignment marker is proposed to address the problem of three-dimensional alignment of distant dual panels beyond the depth-of-focus of a vision camera. The diffractive marker is effective to analyze the positional correlation of distant dual panels. The possibility of diffractive alignment in multilayer display fabrication is testified with numerical simulation and a proof-of-concept experiment.

Design and Fabrication of Binary Diffractive Optical Elements for the Creation of Pseudorandom Dot Arrays of Uniform Brightness (균일 밝기 랜덤 도트 어레이 생성을 위한 이진 회절광학소자 설계 및 제작)

  • Lee, Soo Yeon;Lee, Jun Ho;Kim, Young-Gwang;Rhee, Hyug-Gyo;Lee, Munseob
    • Korean Journal of Optics and Photonics
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    • v.33 no.6
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    • pp.267-274
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    • 2022
  • In this paper, we report the design and fabrication of binary diffractive optical elements (DOEs) for random-dot-pattern projection for Schlieren imaging. We selected the binary phase level and a pitch of 10 ㎛ for the DOE, based on cost effectiveness and ease of manufacture. We designed the binary DOE using an iterative Fourier-transform algorithm with binary phase optimization. During initial optimization, we applied a computer-generated pseudorandom dot pattern of uniform intensity as a target pattern, and found significant intensity nonuniformity across the field. Based on the evaluation of the initial optimization, we weighted the target random dot pattern with Gaussian profiles to improve the intensity uniformity, resulting in the improvement of uniformity from 52.7% to 90.8%. We verified the design performance by fabricating the designed binary DOE and a beam projector, to which the same was applied. The verification confirmed that the projector produced over 10,000 random dot patterns over 430 mm × 430 mm at a distance of 5 meters, as designed, but had a slightly less uniformity of 84.5%. The fabrication errors of the DOE, mainly edge blurring and spacing errors, were strong possibilities for the difference.