Properties of metal-ferroelectric thin film-silicon(MFS) structure using BaMgF$_{4}$
(BaMgF$_{4}$ 를 이용한 금속-강유전체박막-실리콘(MFS) 구조의 특성)
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- Journal of the Korean Institute of Telematics and Electronics A
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- v.33A no.5
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- pp.102-107
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- 1996