• 제목/요약/키워드: BTMSE

검색결과 3건 처리시간 0.017초

반도체 배선용 저 유전 물질에서의 구리 확산에 대한 전기적 신뢰성 평가 (Characterization of Electrical Properties on Cu Diffusion in Low-k Dielectric Materials for ULSI Interconnect)

  • 이희찬;주영창;노현욱;윤도영;이진규;차국헌
    • 마이크로전자및패키징학회지
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    • 제11권3호
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    • pp.9-15
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    • 2004
  • PMSSQ (Poly Methyl Silsesquioxane)-based matrix에 BTMSE (Bis Tri Methoxy Silyl Ethane) 를 첨가한 low-k물질의 전기적 특성을 조사하였다. 우리는 절연체로 copolymer를 사용하여 금속-절연체 -실리콘 구조를 만들고 BTS 실험을 통하여 누설 전류와 파괴 시간을 측정하였다. 코 폴리머의 기공이 $30\%$ 이상이 되었을 때, 파괴 시간이 급속하게 감소되어 진다. 온도에 관하여 파괴 시간으로부터 코 폴리머를 통한 구리 확산의 활성화 에너지는 1.51eV가 측정되었다.

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유기실리카와 나노기공형성 수지의 상용성 변화에 의한 나노기공의 구조 변화

  • 차국헌;최연승;김상율;진문영
    • 한국결정학회:학술대회논문집
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    • 한국결정학회 2002년도 정기총회 및 추계학술연구발표회
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    • pp.52-52
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    • 2002
  • Recently, nanoporous low-k materials using porogen (pore generating material) template method have gained much attraction due to the feasible advantage of dielectric constant decrease with the increase of porogen content, which is burning out and making air void by thermal curing. In nanoporous thin films, further, control of pore size and its distribution is very important to retain suitable thermal, mechanical and electrical properties. In this study, nanoporous low-k films were prepared with MTMS-BTMSE copolymer and porogen. The effect of interaction of copolymer matrix and porogen on pore size and distribution was comparatively to investigate with molecular structure and end functional group. The characterization of nanoporous thin film prepared was also performed using various techniques including NMR, GPC, Ellipsometer, FE-SEM, TGA, and FT-IR.

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OTFT용 용액공정의 에틸렌-브리지드 실세스퀴옥산 게이트 절연체 (Solution-Processed Gate Insulator of Ethylene-Bridged Silsesquioxnae for Organic Field-Effect Transistor)

  • 이덕희;정현담
    • 통합자연과학논문집
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    • 제3권1호
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    • pp.7-18
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    • 2010
  • Ethylene-bridged silsesquioxane resins were synthesized from two monomers: 1,2-bis(trimethoxysilyl)ethane and methyltrimethoxysilane. The silsesquioxane thin films were spin-coated from the copolymerized resins on silicon wafer. Metal insulator metal (MIM), metal insulator semiconductor (MIS) devices were utilized to investigate the electrical properties of the copolymerized thin films. As the films were inserted as gate insulator in the OTFT devices, the field effect mobilitites were evaluated by employing Poly(3-hexylthiophene) (P3HT) as organic semiconductor, which shows that their dielectric properties and mobility values are dependent on the molecular structures and Si-OH concentration involving in the films.