• 마이크로전자및패키징학회지
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• 제20권3호
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• pp.45-51
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• 2013

3차원 적층 패키지를 위한 Cu/Sn-3.5Ag 미세범프의 솔더 구조에 따른 금속간화합물 성장거동을 분석하기 위해 솔더 두께가 각각 $6{\mu}m$, $4{\mu}m$인 서로 다른 구조의 미세범프를 $130^{\circ}C$, $150^{\circ}C$, $170^{\circ}C$ 조건에서 실시간 주사전자현미경을 이용하여 실시간 금속간화합물 성장 거동을 분석하였다. Cu/Sn-3.5Ag($6{\mu}m$) 미세범프의 경우, 많은 양의 솔더로 인해 접합 직후 솔더가 넓게 퍼진 형상을 나타내었고, 열처리 시간경과에 따라 $Cu_6Sn_5$ 및 $Cu_3Sn$금속간화합물이 성장한 후, 잔류 Sn 소모 시점 이후 $Cu_6Sn_5$가 $Cu_3Sn$으로 상전이 되는 구간이 존재하였다. 반면, Cu/Sn-3.5Ag($4{\mu}m$) 미세범프의 경우, 적은양의 솔더로 인해 접합 직후 솔더의 퍼짐 현상이 억제 되었고, 접합 직후 잔류 Sn상이 존재하지 않아서 금속간화합물 성장구간이 억제되고, 열처리 시간경과에 따라 $Cu_6Sn_5$가 $Cu_3Sn$으로 상전이 되는 구간만 존재하였다. 두 시편의 $Cu_3Sn$상의 활성화 에너지의 값은 Cu/Sn-3.5Ag($6{\mu}m$) 및 Cu/Sn-3.5Ag($4{\mu}m$) 미세범프가 각각 0.80eV, 0.71eV로 나타났고, 이러한 차이는 반응기구 구간의 차이에 따른 것으로 판단된다. 따라서, 솔더의 측면 퍼짐 보다는 접합 두께가 미세범프의 금속간화합물 반응 기구를 지배하는 것으로 판단된다.

• 한국결정성장학회지
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• 제28권3호
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• pp.130-134
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• 2018

솔더(solder) 재료는 수 천년 이상 인류 문명과 함께해온 대표적인 금속 합금으로서 현재까지도 전자 패키징(electronic packaging) 및 표면 실장(SMT, surface mount technology) 분야의 핵심 소재로 사용되고 있다 그러나 최근 Ag 가격의 급격한 상승과 전자산업의 저가격화 전략으로 인해 솔더 재료에서의 Ag 함량의 감소가 지속적으로 요구되고 있다. 본 연구에서는 Sn-3.0Ag-0.5Cu, Sn-0.7Cu 및 Sn-0.3Ag-0.5Cu(weight%) 조성의 무연납 솔더바 샘플을 주조법으로 합금화 하였다. 제조한 Sn-3.0Ag-0.5Cu, Sn-0.7Cu 및 Sn-0.3Ag-0.5Cu 샘플에 대한 결정구조, 화학조성 및 미세구조를 XRD, XRF, 광학현미경, FE-SEM 및 EDS 분석을 이용하여 조사하였다. 분석결과, 제조된 샘플은 ${\beta}-Sn$, ${\varepsilon}-Ag_3Sn$ 및 ${\eta}-Cu_6Sn_5$ 결정으로 구성되어 있었을 확인할 수 있었다.

• 한국재료학회지
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• 제17권8호
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• pp.402-407
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• 2007

In electronics manufacturing processes, soldering process has generally been used in surface mounting technology. Because of environmental restriction, lead free solders as like a SnAgCu ternary system are being used widely. After soldering process, the formation and growth of intermetalic compounds(IMCs) are formed in the interface between solder and Cu substrate as follows isothermal temperature and time. In this studies, therefore, we investigated the effects of the Cu substrate thickness on the IMC formation and growth of Sn-40Pb/Cu and Sn-3.0Ag-0.5Cu/Cu solder joints, respectively. The effect of the Cu thickness in PCB Cu pad and pure Cu plate was analyzed as measuring of thickness of each IMC. After solder was soldered on PCB and Cu plate which have different Cu thickness, we measured the IMC thickness in solder joints respectively. Also we compared with the effectiveness of Cu thickness on the IMC growth. From these results, we calculated the activation energy.

• 한국재료학회지
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• 제9권7호
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• pp.747-752
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• 1999

Sn-3.5Ag, Sn-3.5Ag-lZn Eoa납과 Cu기판과의 계면반응 및 접합특성에 관하여 검토하였다. Eoa납과 Cu기판이 접합된 시편은 $100^{\circ}C$와 $160^{\circ}C$에서 60일간 열처리하였으며, 전단하중을 가하여 강도를 측정하였다. $150^{\circ}C$에서 열처리에 따른 계면반응층의 두게는 Sn-3.5Ag/Cu계면이 Sn-3.5A9-IZn/Cu계면보다 빠르게 성장하였으며, 반응생성물 성장은$ t_{1/2}$에 비례하여 체적 확산 경향을 나타냈다. 계면 반응생성물은 Sn-3.5Ag/Cu계면의 경우 $Cu_{6}Sn_{5}$상이 형성되었고, $Ag_3Sn$상은 반응층 내부 및 반응층과 땜납의 계면에 석출하였으며, Zn을 첨가한 경우에는 계면에 $Cu_{6}Sn_{5}$ 상과 함께 $Cu_{5}Zn_{8}$상이 형성되었다. 땜납/기판의 전단강도는 Sn-3.5Ag합금에 Zn을 1% 첨가하면 증가하였으며, 열처리를 한 경우에는 감소하였다.

• 한국표면공학회:학술대회논문집
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• 한국표면공학회 2006년도 추계학술발표회 초록집
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• pp.25-26
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• 2006

• Transactions on Electrical and Electronic Materials
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• 제16권3호
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• pp.112-116
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• 2015

This work studied the thickness and contact angle of solder joints between SAC 305 lead-free solder alloy and a Copper (Cu) substrate. Intermetallic compound (IMC) thickness and contact angle of 3Sn-Ag-0.5Cu (SAC 305) leadfree solder were measured using varying aging times, at a fixed temperature at 30℃. The thickness of IMC and contact angle depend on the aging time. IMC thickness increases as the aging increases. The contact angle gradually decreased from 39.49° to 27.59° as aging time increased from zero to 24 hours for big solder sample. Meanwhile, for small solder sample, the contact angle increased from 32.00° to 40.53° from zero to 24 hours. The IMC thickness sharply increased from 0.007 mm to 0.011 mm from zero to 24 hours aging time for big solder. In spite of that, for small solder the IMC thickness gradually increased from 0.009 mm to 0.017 mm. XRD analysis was used to confirm the intermetallic formation inside the sample. Cu₆Sn₅, Cu₃Sn, Ni₃Sn and Ni₃Sn₂ IMC layers were formed between the solder and the copper substrate. As the aging time increased, the strength of the solder joint mproved due to reduced contact angle.

• 마이크로전자및패키징학회지
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• 제27권3호
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• pp.29-34
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• 2020

본 연구에서는 무전해 니켈 도금액 pH 변화에 따른 electroless nickel immersion gold (ENIG)/Sn-3.0wt.%Ag-0.5wt.%Cu(SAC305) 솔더 접합부 취성 파괴 거동에 대하여 평가하였다. ENIG 표면처리를 위한 무전해 니켈 도금액의 pH는 4.0에서 5.5로 변화 시켰다. 무전해 니켈 도금 후 Ni-P 표면 관찰 결과, 도금액의 pH가 낮아질수록 Ni-P 층 nodule 표면에 핀홀이 증가하였다. 솔더링 후 접합부 계면에서는 (Cu,Ni)6Sn5 금속간화합물이 형성되었으며, 무전해 니켈 도금액의 pH가 증가할수록 솔더접합부의 계면 금속간화합물의 두께는 증가하였다. 고속전단 시험을 통하여 ENIG/SAC305 솔더 접합부의 취성파괴 거동을 확인하였으며, 무전해 니켈 도금액의 pH가 증가할수록 솔더접합부의 전단강도는 감소하는 경향을 보였다. 또한, 솔더 접합부의 취성 파괴율은 pH가 5일 때 가장 높은 값을 보였다.

• 대한용접접합학회:학술대회논문집
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• 대한용접접합학회 2005년도 춘계학술발표대회 개요집
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• pp.54-56
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• 2005

Ultrasonic soldering using of Si-wafer to FR-4 PCB atroom temperature was investigated. Sn3.5Ag foil rolled $100{\mu}m$ was used for solder. The UBM of Si-die was Cu/ Ni/ Al from top to bottom and its thickness was $0.4{\mu}m$, $0.4{\mu}m$, $0.3{\mu}m$ respectively. Pad on FR-4 PCB comprised of Au/ Ni/ Cu from top to bottom and its thickness was $0.05{\mu}m$, $5{\mu}m$, $18{\mu}m$ respectively. The ultrasonic soldering time was changed from 0.5sec to 3.0sec and its power 1400W. As experimental result, reliable bond joint by ultrasonic at room temperature was obtained. The shear strength increased with soldering time up to 2.5 sec. That means at 2.5sec, the shear strength showed maximum rate of 65.23N. The strength decreased to 33.90N at 3.0 sec because the cracks generated along the intermetallic compound between Si-wafer and Sn-3.5mass%Ag solder. intermetallic compound produced by ultrasonic between the solder and the Si-die was $(Cu, Ni)_{6}Sn_{5}$ and the intermetallic compound between solder and pad on FR-4 was $(Ni, Cu)_{3}Sn_{4}$.

• Current Photovoltaic Research
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• 제7권3호
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• pp.65-70
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• 2019

As a demand of higher power photovoltaic modules, shingled, multi-busbar, half-cell, and bifacial techniques are developed. Multi-busbar module has advantage for large amount of light havesting. And, half-cell is high power module for reducing resistive losses and higher shade tolerance. Recently, researches on multi-busbar is focused on reliability according to adhesion and intermetallic compound between Sn-Pb solder and Ag electrode. And half-cell module is researched to comparing with full-sized cell module for structure difference. In this study, we investigated the factors affecting to efficiency and adhesion of multi-wires half-cell module according to wire thickness, solder thickness, and flux. The results of solar simulator and peel test was that peel strength and efficiency of soldered cell is not related. But samples with flux including high solid material showed high efficiency. The results of FE-SEM and EDX line scan on cross-section between wire and Ag electrode for different flux showed thickness of solder joint between wire and Ag electrode is increasing through solid material increasing. Flux including high solid material would affect to solder behavior on Ag electrode. Higher solid material occurred lower growth of IMC layer because solder permeate to sider of wire ribbon than Ag electrode. And it increased fill factor for high efficiency. In soldering process, amount of solid material in flux and solder thickness are the factor related with characteristic of soldered photovoltaic cell.

• 한국생산제조학회지
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• 제20권5호
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• pp.559-563
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• 2011

Drop impact reliability assessment of solder joints on the flip chip is one of the critical issues for micro system packaging. Our previous researches have been showing that new solder ball compositions of Sn-3.0Ag-0.5Cu has better mechanical reliability than Sn-1.0Ag-0.5Cu. In this paper, dynamic reliability analysis using Finite Element Analysis (FEA) is carried out to assess the factors affecting flip chip in drop simulation. The design parameters are size and thickness of chip, and size, pitch and array of solder ball with composition of Sn1.0Ag0.5Cu. The board systems by JEDEC standard including 15 chips, solder balls and PCB are modeled with various design parameter combinations, and through these simulations, maximum yield stress and strain at each chip are shown at the solder balls. It is found that larger chip size, smaller chip array, smaller ball diameter, larger pitch, and larger chip thickness have bad effect on maximum yield stress and strain at solder ball of each chip.