The Limit of the March Test Method and Algorithms (On Detecting Coupling Faults of Semiconductor Memories) (March Test 기법의 한게 및 알고리즘(반도체 메모리의 커플링 고장을 중심으로))
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- Journal of the Korean Institute of Telematics and Electronics A
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- v.29A no.8
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- pp.99-109
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- 1992