• KIEE International Transactions on Electrophysics and Applications
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• v.3C no.1
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• pp.15-18
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• 2003

The characteristics of accelerated soft error rate (ASER) for fabricated 8M SRAM are evaluated for various well structures. The application of the Buried NWell (BNW) and the variations of each well structure, well dose in process conditions are checked by ASER failure in time (FIT) in terms of reliability. The application of only the BNW shows the lowest ASER FIT value. The BNW added to the Buried PWell (BPW) shows a 200% increase and the BNW plus the Striped BPW (SBPW) shows a 100% increase compared to applying the BNW. The cases of applying SBPW show very high ASER FIT.

• Transactions of the Korean Society for Noise and Vibration Engineering
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• v.22 no.10
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• pp.968-973
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• 2012

Slam testing is a mandatory testing process to evaluate the fatigue resistance of a door plate module before delivering it to car makers. This process is very hard job to complete it since the testing facilities are considerably expensive and the required testing time is relatively very long, i.e. more than eight days for a single specimen. In this paper, an accelerated testing method of a door plate module is proposed using vibration test equipment instead of the current one by exposing to the critical excitation of a door glass. Under the proposed excitation method, the similar testing result can be evaluated within less than two hours. The suitability of the proposed testing method was demonstrated by comparing failure modes of both the current testing method and the proposed one.

• Proceedings of the Korean Reliability Society Conference
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• 2004.07a
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• pp.239-246
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• 2004

Accelerated degradation test (ADT) can be a useful tool for assessing the reliability when few or even no failure are expected in an accelerated life test. In this paper, MLCC (Multilayer Ceramic Capacitors), a sort of passive components which have large capacitance(X7R -55$^{\circ}C$~1$25^{\circ}C$) have been tested, and least-square analyses are used to illustrate our approach in which amount of degradation of a DUT following log-normal distribution. We assumed a simple and useful linear model to describe the amount of degradation over time subjected to different voltage levels applied. Tests for linearity of the performance-time relationship, and provide tests for how well the assumptions hold. Also, by using Eyring Model, MLCC's mean life time is assessed.

• Journal of the Korean Society of Safety
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• v.27 no.4
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• pp.13-19
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• 2012

The purpose of this study is to extract the major factors related to the deterioration mechanism of white organic light-emitting diodes(WOLED) by performing accelerated testing of temperature, voltage, time, etc., and to develop an accelerated life test(ALT) model. The measurement results of the brightness of the WOLED exhibited that their average brightness tended to increase as the operating voltage increased and that the half-life period of the brightness appeared after approximately 400 hours when the operating voltage was 20V and the ambient temperature was $85^{\circ}C$. It could be seen that although the WOLED showed comparatively the same brightness when the initial acceleration began after the operating voltage was applied to it, its brightness changed excessively after the WOLED's thermal storage had been made. In addition, it was observed that the half-life period was reduced as the ambient temperature and applied voltage increased. The strength of the WOLED which had been maintained in the range of visible light at the maximum load was reduced by the deterioration of the organic light emitting material due to the influence of the operating voltage and temperature, and the reduction of emitted light was small at low voltage and temperature. It could be seen that the failure of the WOLED during the ALT was caused by wear due to load accumulation over time, and that Weibull distribution was appropriate for the life distribution and acceleration was established between test conditions. From the WOLED analysis, it is thought that factors influencing the brightness deterioration are voltage, temperature, etc., and that comprehensive analysis considering discharge control, dielectric tangent margin, etc., would further increase the reliability.

• Proceedings of the Korean Reliability Society Conference
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• 2005.06a
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• pp.69-73
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• 2005

The failure of geogrids used for soil reinforcement application can be defined as an excessive creep strain which causes the collapse of slopes and embankments. Accordingly, the lifetime is evaluated as a time to reach the excessive creep strain using two accelerated creep testing methods, time-temperature superposition(TTS) and stepped isothermal methods(SIM). TTS is a well-accepted acceleration method to evaluate creep behavior of polymeric materials, while SIM was developed in the last ten years mainly to shorten testing time and minimize the uncertainty associated with inherent variability of multi-specimen tests. The SIM test is usually performed using single rib of geogrids for temperature steps of $14^{\circ}C$ and a dwell time of 10,000 seconds. However, for multi-ribs of geogrids, the applicability of the SIM has not been well established. In this study, the creep behaviors are evaluated using multi-ribs of polyester geogrids using SIM and TTS creep procedures and the newly designed test equipment. Then the lifetime of geogrids are predicted by analyzing the failure times to reach the excessive creep strains through reliability analysis.

• Journal of the Korean Operations Research and Management Science Society
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• v.19 no.1
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• pp.145-152
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• 1994

This paper deals with an economic design of acelerated life test under constant stresses where failure times are exponentially distributed. In this case the optimization criterion is the information amount per unit cost. Fisher's information matrix of exponential distribution's parameters and expected cost considering fixed and variable costs are obtained. The decision variable is the censoring time in the model. In the 2-level constant stress case, it is proved that the optimal solution exists and is unique under some condition. Numerical examples are also included.

• Proceedings of the Safety Management and Science Conference
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• 2008.11a
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• pp.153-160
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• 2008

This paper presents the log likelihood function for integrated models for ALT such as exponential-general Eyring, Weibull-temperature and specific heat, lognormal-temperature and specific heat. Additionally this paper estimates the system reliability and mean time to failure(MTTF) for series, parallel, k of n, and standby system using ALT linkage parameter. Lastly this study designs three variable reliability acceptance sampling(RAS) plans such as type I, II censored test, sequential test by the use of integrated models for ALT.

• Journal of Applied Reliability
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• v.15 no.4
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• pp.262-269
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• 2015

Accelerated degradation mechanism of the heat-resistant steel for high temperature plant was analysed in terms of microstructure and hardness. In order to simulate the microstructure of the steel actually used at $540^{\circ}C$ in the field, isothermal exposure was carried out at $630^{\circ}C$ up to 4,800 hours. The artificial degradation mechanism was comparatively verified to successfully simulate degradation of the long-time used field material. For the artificially degraded specimens, databases including size and aspect ratio of carbide, chemical composition (i.e., Cr/Mo ratio) of grain boundary carbide were built up. These degradation parameters were suggested as fingerprints for PHM (i.e., prognostics health management) of power plants.

• International Journal of Reliability and Applications
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• v.15 no.2
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• pp.85-98
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• 2014

Accelerated life testing (ALT) is a well famous technique in life testing and reliability studies, this is particularly used to induce so high stress leading to failure of the highly reliable units quickly under stipulated duration of time. The step-stress ALT is one of the systematic experimental strategy of ALT applied to fail the units in steps. In this article we focus on two important issues (i) necessity of life tests at higher steps with relevant causes (ii) to develop a new optimum test plan for 3-step SSALT under the modified cumulative exposure model proposed by Khamis and Higgins (1998). It is assumed that the lifetime of test units follows Rayleigh distribution and its scale parameter at constant stress level is assumed to be a log-linear function of the stress. The maximum likelihood estimates of the parameters involved in the step-stress ALT model are obtained. A simulation study is performed for numerical investigation of the proposed new optimum plan 3-step, step-stress ALT. The necessity of the life test units at 3-step step-stress is also numerically examined in comparison to simple step-stress setup.

• Proceedings of the Korean Geotechical Society Conference
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• 2008.10a
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• pp.196-203
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• 2008

Durability of geosynthetics for soil reinforcement is accounted for creep and creep rupture, installation damage and weathering, chemical and biological degradation. Among these, the long-term creep properties have been considered as the most important factors which are directly related to the failure of geosynthetic-reinforced soil(GRS). However, the creep test methods and strain limits are too various to compare the test results with each other. The most widely used test methods are conventional creep test, time-temperature superposition and stepped isothermal method as accelerated creep tests. Recently developed design guidelines recommend that creep-rupture curve be used to determine the creep reduction factor($RF_{CR}$) which is a conservative approach. In this study, the different creep test methods were compared and the creep reduction factors were estimated at different creep strain limits of 10% of total creep strain and creep rupture. In order to minimize the impact of creep strain to the GRS structures, the various creep reduction factors using different creep test methods should be investigated and then the most appropriated one should be selected for incorporating into the design.