• Plant Breeding and Biotechnology
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• 제5권3호
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• pp.237-242
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• 2017

AT-hook proteins of plant have shown to be involved in growth and development through the modification of chromatin architecture to co-regulate transcription of genes. Recently, many genes encoding AT-hook protein have been identified and their involvement in senescence delay is investigated. In this study, soybean transgenic plants overexpressing chromatin architecture-controlling ATPG7 gene was produced by Agrobacterium-mediated transformation and investigated for the positive effect on the important agronomic traits mainly focusing on yield-related components. A total of 27 transgenic soybean plants were produced from about 400 explants. $T_1$ seeds were harvested from all transgenic plants. In the analysis of genomic DNAs from soybean transformants, ATPG7 and Bar fragments were amplified as expected, 975 bp and 408 bp in size, respectively. And also exact gene expression was confirmed by reverse transcriptase-PCR (RT-PCR) from transgenic line #6, #7 and #8. In a field evaluation of yield components of ATPG7 transgenic plants ($T_3$), higher plant height, more of pod number and greater average total seed weight were observed with statistical significance. The results of this study indicate that the introduction of ATPG7 gene in soybean may have the positive effect on yield components.

• JSTS:Journal of Semiconductor Technology and Science
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• 제7권4호
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• pp.221-228
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• 2007

In this paper, we propose a new symbolic simulation for scan chain diagnosis to solve the diagnosis resolution problem. The proposed scan chain fault simulation, called the SF-simulation, is able to analyze the effects caused by faulty scan cells in good scan chains. A new scan chain fault simulation is performed with a modified logic ATPG pattern. In this simulation, we consider the effect of errors caused by scan shifting in the faulty scan chain. Therefore, for scan chain diagnosis, we use the faulty information in good scan chains which are not contaminated by the faults while unloading scan out responses. The SF-simulation can tighten the size of the candidate list and achieve a high diagnosis resolution by analyzing fault effects of good scan chains, which are ignored by most previous works. Experimental results demonstrate the effectiveness of the proposed method.

• 한국정보처리학회논문지
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• 제7권10호
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• pp.3226-3235
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• 2000

반도체 집적 회로가 점점 복잡해지고 고속화되면서 반도체 집적 회로의 동작에 대한 검사 뿐 아니라, 회로가 원하는 시간 내에 동작함을 보장하는 지연 고장 검사의 중요성이 점점 커지고 있다. 본 논문에서는 경로 지연 고장에 대한 효율적인 테스트 입력 생성을 위하여 새로운 부분 확장 주사 방법을 제안한다. 본 논문에서는 유추와 할당을 적용한 테스트 입력 자동 생성기를 기반으로 하여 새로운 부분 주사 방법을 구현하였다. 우선적으로 표준 주사환경에서 테스트 입력을 생성한 후에 테스트 입력이 제대로 생성되지 않은 주사 사슬에 대하여 테스트 입력 생성기를 수행하는 동안의 정보를 이용하여 확장 주사 플립플롭이 적용될 플립플롭을 결정하였다. 확장 주사 플립플롭을 결정하는 기준으로서는 고장 검출율과 하드웨어 오버헤드를 사용하였다. 순차 회로인 ISCAS 89 벤치 마크 회로를 이용하여 실험을 수행하였으며, 실험을 통하여 표준 주사와 확장 주사 환경, 부분 확장 주사 환경에서 고장 검출율을 비교, 확인하였다. 그리고 새로운 알고리즘이 적용된 부분 확장 주사 방법에서 높은 고장 검출율을 확인함으로써 효율성을 입증하였다.