• 제목/요약/키워드: AFM probe

검색결과 204건 처리시간 0.026초

Molecular Dynamics Simulation of Contact Process in AFM/FFM Surface Observation

  • Shimizu, J.;Zhou, L.;Eda, H.
    • 한국윤활학회:학술대회논문집
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    • 한국윤활학회 2002년도 proceedings of the second asia international conference on tribology
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    • pp.61-62
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    • 2002
  • In order to clarify the contact mechanism between specimen surface and probe tip in the surface observation by the AFM (atomic force microscope) or the FFM (friction force microscope), several molecular dynamics simulations have been performed. In the simulation, a 3-dimensional simulation model is proposed where the specimen and the probe are assumed to consist of mono-crystal line copper and a carbon atom respectively and the effect of cantilever stiffness is also taken into considered. The surface observation process on a well-defined Cu{100} is simulated. The influences of cantilever stiffness on the reactive force images and the behavior of probe tip were evaluated. As a resuIt, several phenomena similar to those observed by the actual surface observation experiment, such as double-slip behavior and dispersion in the stick-slip wave period were observed.

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Modelling and Measurements of Normal and Lateral Stiffness for Atomic Force Microscopy

  • Choi, Jinnil
    • Applied Science and Convergence Technology
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    • 제23권5호
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    • pp.240-247
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    • 2014
  • Modelling and measurements of normal and lateral stiffness for atomic force microscopy (AFM) are presented in this work. Important issues, such as element discretisation, stiffness calibration, and deflection angle are explored using the finite element (FE) model. Elements with various dimension ratios are investigated and comparisons with several mathematical models are reported to verify the accuracy of the model. Investigation of the deflection angle of a cantilever is also shown. Moreover, AFM force measurement experiments with conical and colloid probe tips are demonstrated. The relationships between force and displacement, required for stiffness measurement, in normal and lateral directions are acquired for the conical tip and the limitations of the colloid probe tip are highlighted.

원자힘 현미경을 이용한 활액이 소 연골의 미세 마찰특성에 작용하는 역할 (The Role of Synovial Fluid in the Micro-scale Frictional Response of Bovine Articular Cartilage from Atomic Force Microscopy)

  • 박성훈
    • 한국정밀공학회지
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    • 제25권11호
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    • pp.119-125
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    • 2008
  • The objective of this study was to compare micro-scale friction coefficients with and without synovial fluid, and micro-scale measurements were performed using atomic force microscopy (AFM) with a $5{\mu}m$ spherical probe. Four cylindrical cartilage specimens were harvested from two fresh bovine humeral heads (4-6 months old). $Average{\pm}standard$ deviation values of the micro-scale AFM frictional coefficients calculated from the liner fit of friction versus normal force was $0.177{\pm}0.012$ and $0.130{\pm}0.010$ with and without synovial fluid coating on AFM probe respectively, showing its reduction by ${\sim}27%$ with synovial fluid. To the best of our knowledge, this experimental study investigates the first such comparisons of frictional response of articular cartilage with and without synovial fluid coating on AFM probe, and provides significant insights into the role of synovial fluid in the articular cartilage friction and lubrication independently of the confounding effect of fluid pressurization in the articular cartilage.

모발의 나노 트라이볼러지 특성해명을 위한 원자현미경(Atomic Force Microscopy) 프로브의 개발 (A New Design of AFM Probe for Nanotribological Characterizations Measurement of Human Hair)

  • 권현규;고언위
    • 반도체디스플레이기술학회지
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    • 제14권4호
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    • pp.1-7
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    • 2015
  • People are always pursuing the aesthetic feeling relentlessly. But some people have such problems with their hairs like alopecia, cancer chemotherapy, burns, and scalp injury. So the synthetic hair has played a very important role to make up for these deficiencies. But long term use can lead to adverse reactions or uncomfortable feeling. This is primarily caused by its properties differ with human hair. In particular, nanotribological characterizations (roughness, friction force and adhesive force) of synthetic hair surface are dissatisfy with the needs of normal hairs. This paper presents the experiments on nanotribological characterizations measurements of human hairs (coloring hair, permed hair and common hair) in shampooing condition or without shampooing condition. Using atomic force microscopy (AFM) to find out a range of synthetic hair nanotribological characterizations which can correspond with natural hair. The measurements of nanotribological characterizations focus on surface roughness, friction force and adhesive force, and a new design of AFM probe was used for measuring the nanotribological characterizations.

원자간격 현미경의 캔틸레버의 정량적 특성평가를 위한 계측 시스템 개발 (Development of Measurement System for Quantitative Measurement of Cantilever in Atomic Force Microscopy)

  • 권현규;남기호
    • 한국기계가공학회지
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    • 제6권2호
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    • pp.22-27
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    • 2007
  • In this study, the two methods of stiffness measurement(Spring constant) of cantilever were proposed for quantitative measurement in Atomic Force Microscopy(AFM). As the 1st method for the measurement of stiffness, the probe method, which is used in the measurement of the semiconductor mechanical and electrical properties, was applied to the measurement of the cantilever. Experiments by the probe method were performed finding the resistance value of cantilever. As the results, the resistance was measured differently along with the dimension and the thickness of cantilever that determined the stiffness(spring constant) of the lever. As the 2nd method, the vibration characteristics(Dunkerley expression) is used to obtain the stiffness of the complex structure which is combined by AFM cantilever and the standard cantilever. We measured the resonant frequency from the complex structure using the micro stages and stereo microscope. As the results, we confirmed that the vibration characteristics(Dunkerley expression) is effected the micro complex structure of AFM cantilever.

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Fabrication of Nano-Structures on NiFe Film by Anodization with Atomic Force Microscope

  • Okada, T.;Uchida, H.;Inoue, M.
    • Journal of Magnetics
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    • 제11권3호
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    • pp.135-138
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    • 2006
  • We studied local anodization on permalloy $(Ni_{80}Fe_{20})$ thin film with an atomic force microscope (AFM), which was performed by applying a voltage between the permalloy sample and conductive AFM tip. Comparing with anodization on Si (100) substrate, nano-structures on the permalloy thin film was fabricated with low processability.In order to improve the processability on the permalloy thin film, we used dot-fabrication method, thatis, a conductive AFM probe was kept at a position on the film during the anodization process.

글래스비드 정밀공급기구에 의한 바이오재료평가용 AFM프로브의 개발 (Development of A New Micro-fabricated AFM Probe for the Measurement of Biomaterials by using the Precision Glass Bead Supply Unit)

  • 권현규;임건
    • 한국기계가공학회지
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    • 제13권6호
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    • pp.30-36
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    • 2014
  • Many different cells types have been found to be highly sensitive to mechanical force imposed by their surroundings. The cellular response to external mechanical forces has very important effects on numerous biological phenomena. In spite of its importance in biological processes, the cell adhesion force remains difficult to measure quantitatively at the cellular level. In this paper, to enhance quantitative measurements of cell adhesive interactions, a new attaching system and a method in which a glass bead can be attached to an AFM cantilever was designed and fabricated, and the degree of range displacement was controlled in the system. In an experiment, the movement of the stage in the attaching system and the attaching process were measured. The effectiveness of this system was confirmed as well in the experiment. In addition, through a commercial AFM system, the spring constant of the modified AFM probe could be measured.

두 축간 Coupling 을 고려한 Scanning probe Data Storage 시스템 제어기 설계 (Controller Design for Decoupling of Scanning probe Data Storage System)

  • 문준;윤재상;정지영;이충우;정정주;김영식
    • 정보저장시스템학회논문집
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    • 제3권2호
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    • pp.73-80
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    • 2007
  • Atomic Force Microscopy (AFM)방식을 이용한 Scanning probe Data Storage (SDS) 시스템은 array cantilever 를 이용하여 나노 단위로 데이터 읽기, 쓰기를 하는 시스템이다. 따라서 미디어가 있는 stage 의 x 축과 y 축 및 두 축간 coupling 을 고려한 제어기 설계가 요구된다. 본 논문은 SDS 시스템의 축간 coupling 을 고려하지 않은 기존의 제안된 LQG 에 PI 를 추가한 제어기 구조를 사용한다. 두 축간 coupling 공진의 영향을 최소화 하기 위해 convex optimization 으로 설계된 최적의 position profile를 기준 입력신호로 사용한다. 제안된 제어기를 SDS 시스템에 적용하여 모의실험을 하고 그 결과 position profile 로 인해 각 축간 coupling 공진 영향이 감소하여 tracking performance 가 기존의 LQG 제어기 보다 향상된 것을 확인한다.

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전기화학적 에칭에 의한 AFM용 텅스텐 탐침의 강성 제어 (Effective Control of Stiffness of Tungsten Probe for AFM by Electrochemical Etching)

  • 한규범;이승제;안효석
    • Tribology and Lubricants
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    • 제30권4호
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    • pp.218-223
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    • 2014
  • This paper presents a method of controlling the stiffness of a tungsten probe for an atomic force microscope (AFM) in order to provide high-quality phase contrast images in accordance with sample characteristics. While inducing sufficient deformation on sample surfaces with commercial Si or $Si_3N_4$ probes is difficult because of their low stiffness, a tungsten probe fabricated by electrochemical etching with appropriately high stiffness can generate relatively large elastic deformation without damaging sample surfaces. The fabrication of the tungsten probe involves two separate procedures. The first procedure involves immersing a tungsten wire with both ends bent parallel to the surface of an electrolyte and controlling the stiffness of the tungsten cantilever by decreasing its diameter using electrochemical etching in the direction of the central axis. The second procedure involves immersing the end of the etched tungsten cantilever in the direction perpendicular to the surface of the electrolyte and fabricating a tungsten tip with a tip radius of 20-50 nm via the necking phenomenon. The latter etching process applies pulse waves every 0.25 seconds to the manufactured tip to improve its yield. Finite element analysis (FEA) of the stiffness of the tungsten probe as a function of its diameter showed that the stiffness of the tungsten probes greatly varies from 56 N/m to 3501 N/m according to the cantilever diameters from $30{\mu}m$ to $100{\mu}m$, respectively. Thus, the proposed etching method is effective for producing a tungsten probe having specific stiffness for optimal use with an AFM and certain samples.

Multiple Pivot loading 방법을 이용한 액체 환경에서의 수평방향 힘 교정 (Lateral Force Calibration in Liquid Environment using Multiple Pivot Loading)

  • 김류운;정구현
    • Tribology and Lubricants
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    • 제29권2호
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    • pp.91-97
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    • 2013
  • Quantifying the nanoscale force between the atomic force microscopy (AFM) probe of a force-sensing cantilever and the sample is one of the challenges faced by AFM researchers. The normal force calibration is straightforward; however, the lateral force is complicated due to the twisting motion of the cantilever. Force measurement in a liquid environment is often needed for biological applications; however, calibrating the force of the AFM probes for those applications is more difficult owing to the limitations of conventional calibration methods. In this work, an accurate nondestructive lateral force calibration method using multiple pivot loading was proposed for liquid environment. The torque sensitivity at the location of the integrated probe was extrapolated based on accurately measured torque sensitivities across the cantilever width along a few cantilever lengths. The uncertainty of the torque sensitivity at the location of the integrated tip was about 13%, which is significantly smaller than those for other calibration methods in a liquid environment.