• 제어로봇시스템학회:학술대회논문집
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• 2003.10a
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• pp.73-77
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• 2003

This paper presents a high-speed algorithmic analog-to-digital converter (ADC), which is based on gray coding. The realization method makes use of a two-input maximum circuit to provide a high-speed operation and a low-distortion in the transfer characteristic. The proposed ADC based on the CMOS integrated circuit technique is simple and suitable for implementing a highresolution ADC. The performances of the proposed circuit were studied using the PSPICE analog simulation program. The simulation-results verifying the circuit performances are agreed with the expected values.

• The Journal of Korean Institute of Communications and Information Sciences
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• v.32 no.11C
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• pp.1102-1110
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• 2007

In this paper, we design the FPGA (Field-Programmable Gate Array) of the CAMB (Constant-Amplitude Multi-code Biorthogonal) modulation, and implement the SoC (System on Chip). The ASIC (Application Specific Integrated Circuit) chip is be implemented through targeting and board test. This 12Mbps modem SoC includes the ARM (Advanced RISC Machine)7TDMI, 64Kbyte SRAM(Static Random Access Memory) and ADC (Analog to Digital Converter)/DAC (Digital to Analog Converter) for flexible applications. Additionally, the modem SoC can support the variable communication interfaces such as the 16-bits PCMCIA (Personal Computer Memory Card International Association), USB (Universal Serial Bus) 1.1, and 16C550 Compatible UART (Universal Asynchronous Receiver/Transmitter).

• Journal of the Korea Institute of Information and Communication Engineering
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• v.16 no.9
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• pp.1847-1855
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• 2012

A 1V 1.6-GS/s 6-bit flash analog-to-digital converter (ADC) with a clock calibration circuit is proposed. A single track/hold circuit with a bootstrapped analog switch is used as an input stage with a supply voltage of 1V for the high speed operation. Two preamplifier-arrays and each comparator composed of two-stage are implemented for the reduction of analog noises and high speed operation. The clock calibration circuit in the proposed flash ADC improves the dynamic performance of the entire flash ADC by optimizing the duty cycle and phase of the clock. It adjusts the reset and evaluation time of the clock for the comparator by controlling the duty cycle of the clock. The proposed 1.6-GS/s 6-bit flash ADC is fabricated in a 1V 90nm 1-poly 9-metal CMOS process. The measured SNDR is 32.8 dB for a 800 MHz analog input signal. The measured DNL and INL are +0.38/-0.37 LSB, +0.64/-0.64 LSB, respectively. The power consumption and chip area are $800{\times}500{\mu}m2$ and 193.02mW.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.48 no.2
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• pp.20-27
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• 2011

A CMOS Image Sensor(CIS) mounted on mobile appliances always needs a low power consumption because of the battery life cycle. In this paper, we propose novel power reduction techniques such as a data flip-flop circuit with leakage current elimination, a low power single slope A/D converter with a novel comparator, and etc. Based on 0.13um CMOS process, the chip satisfies QVGA resolution($320{\times}240$ pixels) whose pitch is 2.25um and whose structure is 4-Tr active pixel sensor. From the experimental results, the ADC in the middle of CIS has a 10-b resolution, the operating speed of CIS is 16 frame/s, and the power dissipation is 25mW at 3.3V(Analog)/1.8V(Digital) power supply. When we compare the proposed CIS with conventional ones, the power consumption is reduced approximately by 22% in sleep mode, 20% in operating mode.

• Journal of IKEEE
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• v.26 no.2
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• pp.299-305
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• 2022

Analog-digital converter (ADC) should be one of the most important blocks that convert various physical signals to digital ones for signal processing in the digital signal domain. As most operations of the analog circuit for sensor signal processing have been replaced by digital circuits, high-resolution performance is required for ADC. In addition, low-power must be the critical issue in order to extend the battery time of mobile system. The existing integrating sigma-delta ADCs has a characteristic of high resolution, but due to its low supply voltage condition and advanced technology, circuit error and corresponding resolution degradation of ADC result from the finite gain of the operational amplifier in the integrator. Buffer compensation technique can be applied to minimize gain errors, but there is a disadvantage of additional power dissipation due to the added buffer. In this paper, incremental signal-delta ADC is proposed with buffer switching scheme to minimize current and igh-pass bias circuit to improve the settling time.

• Journal of Sensor Science and Technology
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• v.21 no.1
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• pp.1-6
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• 2012

Using a current-mode multiple reset, a current-to-voltage(I-V) converter with a wide dynamic range was produced. The converter consists of a trans-impedance amplifier(TIA), an analog-to-digital converter(ADC), and an N-bit counter. The digital output of the I-V converter is composed of higher N bits and lower bits, obtained from the N-bit counter and the ADC, respectively. For an input current that has departed from the linear region of the TIA, the counter increases its digital output, this determines a reset current which is subtracted from the input current of the I-V converter. This current-mode reset is repeated until the input current of the TIA lies in the linear region. This I-V converter is realized using 0.35 ${\mu}m$ LSI technology. It is shown that the proposed I-V converter can increase the maximum input current by a factor of $2^N$ and widen the dynamic range by $6^N$. Additionally, the I-V converter is successfully applied to a photometric sensor.

• Proceedings of the KSRS Conference
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• 2002.10a
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• pp.587-592
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• 2002

A new digital correlator fur an airborne synthetic aperture radiometer was designed in order to replace the conventional analog correlator unit which will become very complicated while the number of channels is increasing. The digital correlator uses digital IQ demodulator instead of the intermediate frequency (IF) phase shifter to make the correlation processing performed digitally at base band instead of analogly at IF. This technique has been applied to the digital receiver in softradio. The down-converted IF signals from each pair of receiver channels become low rate base-band digital signals after under-sampled, Digitally Down-Converted (DDC), decimated and filtered by FIR filters. The digital signals are further processed by two digital multipliers (complex correlation), the products are integrated by the integrators and finally the outputs from the integrators compose of the real part and the imaginary part of a sample of the visibility function. This design is tested by comparing the results from digital correlators and that from analog correlators. They are agreed with each other very well. Due to the fact that the digital correlators are realized with the help of Analog-Digital Converter (ADC) chips and the FPGA technology, the realized volume, mass, power consumption and complexity turned out to be greatly reduced compared with that of the analog correlators. Simulations show that the resolution of ADC has an influence on the synthesized antenna patterns, but this can be neglected if more than 2bit is used.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.43 no.1 s.343
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• pp.59-64
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• 2006

The slope of the ramp generator in a single slope ADC(analog-to-digital converter) suffers from process and frequency variation. This variation in ramp slope causes ADC gain variation and eventually limits the performance of the ISP(image signal processing) in a CIS(CMOS image sensor) that uses the single slope ADC. This paper proposes a ramp slope BISC(built-in-self-calibration) scheme for CIS. The CIS with proposed BISC was fabricated with a $0.35{\mu}m$ process. The measurement results show that the proposed architecture effectively calibrate the ramp slope against process and clock frequency variation. The silicon area overhead is less than $0.7\%$ of the full chip area.

• Journal of the Korea Institute of Information and Communication Engineering
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• v.25 no.11
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• pp.1627-1634
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• 2021

This paper introduces a low-power compact ADC circuit for analog Convolutional filter for low-power neural network accelerator SOC. While convolutional neural network accelerators can speed up the learning and inference process, they have drawback of consuming excessive power and occupying large chip area due to large number of multiply-and-accumulate operators when implemented in complex digital circuits. To overcome these drawbacks, we implemented an analog convolutional filter that consists of an analog multiply-and-accumulate arithmetic circuit along with an ADC. This paper is focused on the design optimization of a low-power 8bit SAR ADC for the analog convolutional filter accelerator We demonstrate how to minimize the capacitor-array DAC, an important component of SAR ADC, which is three times smaller than the conventional circuit. The proposed ADC has been fabricated in CMOS 65nm process. It achieves an overall size of 1355.7㎛², power consumption of 2.6㎼ at a frequency of 100MHz, SNDR of 44.19 dB, and ENOB of 7.04bit.

• JSTS:Journal of Semiconductor Technology and Science
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• v.14 no.6
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• pp.706-711
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• 2014

A low power 6-bit flash ADC that uses an input voltage range detection algorithm is described. An input voltage level detector circuit has been designed to overcome the disadvantages of the flash ADC which consume most of the dynamic power dissipation due to comparators array. In this work, four digital input voltage range detectors are employed and each input voltage range detector generates the specific clock signal only if the input voltage falls between two adjacent reference voltages applied to the detector. The specific clock signal generated by the detector is applied to turn the corresponding latched comparators on and the rest of the comparators off. This ADC consumes 68.82 mW with a single power supply of 1.2V and achieves 4.3 effective number of bits for input frequency up to 1 MHz at 500 MS/s. Therefore it results in 4.6 pJ/step of Figure of Merit (FoM). The chip is fabricated in 0.13-um CMOS process.