• Proceedings of the KSME Conference
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• 2003.11a
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• pp.1932-1938
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• 2003

We have applied spectroscopic ellipsometry to investigate $high-{\kappa}$ dielectric thin films and correlate their optical properties with fabrication processes, in particular, with high temperature annealing. The use of high-k dielectrics such as $HfO_{2}$, $Ta_{2}O_{5}$, $TiO_{2}$, and $ZrO_{2}$ as the replacement for $SiO_{2}$ as the gate dielectric in CMOS devices has received much attention recently due to its high dielectric constant. From the characteristics found in the pseudo-dielectric functions or the Tauc-Lorentz dispersions, the optical properties such as optical band gap, polycrystallization, and optical density will be discussed.

• Journal of KIISE:Computing Practices and Letters
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• v.8 no.1
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• pp.88-95
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• 2002

In recent years, the security of hardware and software systems is one of the most essential factor of our safe network community. As elliptic Curve Cryptosystems proposed by N. Koblitz and V. Miller independently in 1985, require fewer bits for the same security as the existing cryptosystems, for example RSA, there is a net reduction in cost size, and time. In this thesis, we propose an efficient hardware architecture of underlying field arithmetic processor for Elliptic Curve Cryptosystems, and a very useful method for implementing the architecture, especially multiplicative inverse operator over GF$GF (2^m)$ onto FPGA and futhermore VLSI, where the method is based on optimized unit operation components. We optimize the arithmetic processor for speed so that it has a resonable number of gates to implement. The proposed architecture could be applied to any finite field $F_{2m}$. According to the simulation result, though the number of gates are increased by a factor of 8.8, the multiplication speed We optimize the arithmetic processor for speed so that it has a resonable number of gates to implement. The proposed architecture could be applied to any finite field $F_{2m}$. According to the simulation result, though the number of gates are increased by a factor of 8.8, the multiplication speed and inversion speed has been improved 150 times, 480 times respectively compared with the thesis presented by Sarwono Sutikno et al. [7]. The designed underlying arithmetic processor can be also applied for implementing other crypto-processor and various finite field applications.

• Electrical & Electronic Materials
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• v.27 no.8
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• pp.15-26
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• 2014

• Journal of the Korean Society of Surveying, Geodesy, Photogrammetry and Cartography
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• v.32 no.5
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• pp.527-537
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• 2014

In 2013, NGII(National Geographic Information Institute) has developed and provided the KNGeoid13(Korean National Geoid Model 2013) to support the fundamental computation of GNSS-derived orthometric height. In this study, the adjusted ellipsoidal height, the sum of geoidal height and height by the leveling, is applied to calculate the GNSS-derived orthometric height without the local bias, based on GNSS static surveying and KNGeoid13. The mean of errors in GNSS-derived orthometric heights could be verified with the leveling data, which was actually less than 0.5 cm with using the adjusted ellipsoidal heights, but 3 cm by calculating differences between ellipsoidal heights and geoidal heights. By analyze the accuracy of GNSS-derived orthometric height depending on the duration of observation, we could realized 95% of data shows less than 4 cm accuracy, when the GNSS survey conducting for 4 hours spread over two days, but while the case of GNSS survey conducting for 4 hours and 2 hours respectively, resulted in 95% of data less than 5cm level of accuracy. Also, if the ambiguity is fixed, less than 10cm of accuracy could be obtained at 95% of data for only 30 minutes GNSS survey over a day. Following the study, we expected that the height determination by GNSS and geoid models can be used in the public benchmark surveying.

• Korean Journal of Optics and Photonics
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• v.13 no.3
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• pp.215-222
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• 2002

Using an in-situ ellipsometer, we monitored the growth curve of optical recording media in real time. For confirmation of the thickness control using in-situ ellipsometry, we analyzed the deposited multi-layer sample made of Ge-Sb-Te alloy film and ZnS-Si0$_2$ dielectric films using an exsitu spectroscopic ellipsometer. The target material in the first sputtering gun is ZnS-SiO$_2$ as the protecting dielectric layer and that in the second gun is Ge$_2$sb$_2$Te$_{5}$ as the receding layer. While depositing ZnS-SiO$_2$, Ge$_2$Sb$_2$Te$_{5}$ and ZnS-SiO$_2$ films on c-Si substrate in sequence, we measured Ψ $\Delta$ in real time. Utilizing the complex refractive indices of Ge$_2$Sb$_2$Te$_{5}$ and ZnS-SiO$_2$ obtained from the analysis of spectroscopic ellipsometry data, the evolution of ellipsometric constants Ψ, $\Delta$ with thickness is calculated. By comparing the calculated evolution curve of ellipsometric constants with the measured one, and by analyzing the effect of density variation of the Ge$_2$Sb$_2$Te$_{5}$ recording layer on ellipsometric constants with thickness, we precisely monitored the growth rate of the Ge-Sb-Te multilayer and controlled the growth process. The deviation of the real thicknesses of Ge-Sb-Te multilayer obtained under the strict monitoring is post confirmed to be less than 1.5% from the target structure of ZnS-SiO$_2$(1400 $\AA$)IGST(200 $\AA$)$\mid$ZnS-SiO$_2$(200$\AA$).(200$\AA$).

• Proceedings of the Korean Vacuum Society Conference
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• 2000.02a
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• pp.83-83
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• 2000

MBE법으로 성장시킨 Cd1-xMgxTe 박막을 조성비 (x=0, 0.23, 0.32, 0.43)에 따라 타원편광 분석기로 측정하여 연구하였다. E0 critical point energy 아래에서 나타나는 간섭무늬를 제거하기 위해 multilayer calculation을 수행했고 ellipsometric data를 2번 미분하여 계산하는 Critical Point Parabolic Band(CPPB) model을 사용하여 E0, E0+Δ0, E1, E1,+Δ1, and E0'critical point energy 들을 구할 수 있었다. 특히 E2 peak region 에서는 종전의 고상시료 (bulk)에서 측정 발표된 값보다도 매우 높고 명확한 <$\varepsilon$2>값이 측정되어, E2와 E、0 peak가 명확하게 분리되는 것을 볼 수 있었다. 또한 Mg의 조성비에 따라 critical point energy 가 linear 하게 변화됨이 관측되었다.

• Progress in Medical Physics
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• v.19 no.4
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• pp.227-230
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• 2008

The purpose of this study was to design and construct an ultrasound phantom for volume calibration and evaluate the volume measurement accuracy of a 2 dimensional ultrasonic system. Ultrasound phantom was designed, constructed and tested. The phantom consisted of a background material and a target. The background was made by mixing agarose gel with water. A target, made with an elastic material, was filled with water to vary its volume and shape and inserted into background material. To evaluate accuracy of a 2 dimensional ultrasonic system (128XP, ACUSON), three different shapes of targets (a sphere, 2 ellipsoids and a triangular prism) were constructed. In case of ellipsoid shape, two targets, one with same size length and width (ellipsoid 1) and another with the length 2 times longer than width (ellipsoid 2) were examined. The target volumes of each shape were varied from 94cc to 450cc and measurement accuracy was examined. The volume difference between the real and measured target of the sphere shape ranged between 6.7 and 11%. For the ellipsoid targets, the differences ranged from 9.2 to 10.5% with ellipsoid 1 and 25.7% with ellipsoid 2. The volume difference of the triangular prism target ranged between 20.8 and 35%. An easy and simple method of constructing an ultrasound phantom was introduced and it was possible to check the volume measurement accuracy of an ultrasound system.

• Proceedings of the Optical Society of Korea Conference
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• 2004.07a
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• pp.226-227
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• 2004

• Journal of the Korean Society of Surveying, Geodesy, Photogrammetry and Cartography
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• v.36 no.4
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• pp.245-254
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• 2018

Impact of tropospheric correction techniques on accuracy of the GPS (Global Positioning System) derived ellipsoidal heights has been experimentally assessed in this paper. To this end, 247 baselines were constructed from a total of 88 CORS (Continuously Operating Reference Stations) in Korea. The GPS measurements for seven days, acquired from the so-called integrated GNSS (Global Navigation Satellite Systems) data center via internet connection, have been processed by two baseline processing software packages with an application of the empirical models, such as Hopfield, modified Hopfield and Saastamoinen, and the estimation techniques based on the DD (Double-Differenced) measurements and the PPP (Precise Point Positioning) technique; hence a total number of the baseline processed and tested was 8,645. Accuracy and precision of the estimated heights from the various correction schemes were analyzed about baseline lengths and height differences of the testing baselines. Details of these results are summarized with a view to hopefully providing an overall guideline of a suitable selection of the modeling scheme with respect to processing conditions, such as the baseline length and the height differences.

• Proceedings of the Korean Institute of Information and Commucation Sciences Conference
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• 2008.05a
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• pp.670-673
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• 2008

Optimized algorithms and numerical expressions which had been verified through C program simulation, should be analyzed again with HDL (hardware description language) such as Verilog, so that the verified ones could be modified to be applied directly to hardware implementation. The reason is that the characteristics of C programming language design is intrinsically different from the hardware design structure. The hardware IP verified doubly in view of hardware structure together with algorithmic verification, was implemented on the Altera Excalibur FPGA device equipped with ARM9 microprocessor core, to a real chip prototype, using Altera embedded system development tool kit. The implemented finite field calculation IPs can be used as library modules as Elliptic Curve Cryptography finite field operations which has more than 193 bit key length.