• Korean Journal of Optics and Photonics
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• v.25 no.2
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• pp.72-77
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• 2014

We have demonstrated a terahertz (THz) time-domain spectroscopy and imaging system using compact fiber-coupled THz modules. Using this THz spectroscopy system we have measured the absorption spectrum of water vapor in free space over 3 THz, as well as the refractive indices of various substrates such as Si, $Al_2O_3$, and GaAs using the transfer-function method. Through the THz imaging system we have observed a high-quality THz image of a medical knife and metal clip sample, with a resolution of $192{\times}89$ pixels using a step size of 250 ${\mu}m$.

• Journal of the Korean Society for Nondestructive Testing
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• v.37 no.1
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• pp.1-6
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• 2017

In this study, a terahertz time domain spectroscopy (THz-TDS) imaging technique was used to measure doping concentration and physical properties (such as refractive index and permittivity) of the doped silicon (Si) wafers. The transmission and reflection modes with an incidence angle of $30^{\circ}$ were employed to determine the physical properties of the doped Si wafers. The doping concentrations of the prepared Si wafers were varied from $10^{14}$ to $10^{18}$ in both N-type and P-type cases. Finally, the correlation between the doping concentration and the power of the THz wave was determined by measuring the powers of the transmitted and reflected THz waves of the doped Si wafers. Additionally, the doped thickness, the refractive index, and permittivity of each doped Si wafer were calculated using the THz time domain waveform. The results indicate that the THz-TDS imaging technique is potentially a promising technique to measure the doping concentration as well as other optical properties (such as the refractive index and permittivity) of the doped Si wafer.

• Composites Research
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• v.34 no.3
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• pp.143-147
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• 2021

Full width half maximum (FWHM) analysis of superimposed terahertz (THz) signals in the glass fiber reinforced polymer (GFRP) was studied to detect fine delamination inside GFRP. The THz signals were measured for each fine delamination size inside the GFRP using the reflection mode of the terahertz time domain spectroscopy (THz-TDS) system. Then, the FWHM of the superimposed THz signal reflected at the fine delamination was extracted. Thereafter, the complex refractive index of the GFRP was measured using transmission mode of the THzTDS system. Based on this, the FWHM of the superimposed THz signal at the fine delamination were calculated and compared with respect to the fine delamination size. From the theoretically calculated superimposed signals, the relationship between the fine delamination size and the FWHM in the superimposed THz signal was derived. Consequently, the fine delamination size could be predicted through the analysis of the FWHM extracted from the THz signal at the fine delamination.

• Journal of Sensor Science and Technology
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• v.27 no.5
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• pp.317-327
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• 2018

Terahertz (THz) time-domain spectroscopy(TDS), imaging techniques, and related systems have become mature technologies, widely used in many universities and research laboratories. However, the development of creative technologies still requires improved THz application systems. A few key points are discussed, including the innovative advances of mode-locking energy-emitting semiconductor lasers and better photoconductive semiconductor quantum structures. To realize a compact, low cost, and high performance THz system, it is essential that THz spectroscopy and imaging technologies are better characterized by semiconductor and nano-devices, both static and time-resolved. We introduce the THz spectroscopy and imaging systems, the OSCAT(Optical Sampling by laser CAvity Tuning) system and the ASOPS(ASynchronous Optical Sampling) system, are constructed by our research team. We report on the THz images obtained from their use.