• Proceedings of the Korean Vacuum Society Conference
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• 2010.02a
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• pp.209-209
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• 2010

단위면적 당 메모리 집적도를 높이기 위해 플래시 기억소자의 크기를 줄일 때, 절연층 두께 감소에 의한 누설 전류의 발생, 단채널 효과 및 협폭 효과와 같은 문제 때문에 소자 크기의 축소가 한계에 도달하고 있다. 이러한 문제점들을 개선하기 위해 본 연구에서는 FinFET구조위에 Oxide-Nitride-Oxide (ONO) 층을 적층하여 2-비트 특성을 갖는 플래시 메모리 소자를 제안하였다. 소자의 작동전압을 크게 줄일 수 있으며 소자의 크기가 작아질 때 일어나는 단채널 효과의 문제점을 해결할 수 있는 FinFET 구조를 가진 기억소자에서 제어게이트를 제어게이트1과 제어게이트2로 나누어 독립적으로 쓰기 및 소거 동작하도록 하였다. 2-비트 동작을 위해 제어 게이트1의 게이트 절연막의 두께를 제어게이트2의 게이트 절연막의 두께보다 더 얇게 함으로써 두 제어게이트 사이의 coupling ratio를 다르게 하였다. 제어게이트1의 트랩층의 두께를 제어게이트2의 트랩층의 두께보다 크게 하여 제어게이트1의 트랩층에 더 많은 양의 전하가 포획될 수 있도록 하였다. 제안한 기억소자가 2-비트 동작하는 것을 확인 하기위하여 2차원 시뮬레이션툴인 MEDICI를 사용하여 제시한 FinFET 구조를 가진 기억소자의 전기적 특성을 시뮬레이션하였다. 시뮬레이션을 통해 얻은 2-비트에 대한 각 상태에서 각 전하 포획 층에 포획된 전하량의 비교를 통해서 coupling ratio 차이와 전하 포획층의 두께 차이로 인해 포획되는 전하량이 달라졌다. 각 상태에서 제어게이트에 읽기 전압을 인가하여 전류-전압 특성 곡선을 얻었으며, 각 상태에서의 문턱전압들이 잘 구분됨을 확인함으로써 제안한 FinFET 구조를 가진 플래시 메모리 소자가 셀 당 2-비트 동작됨을 알 수 있었다.

• Transactions of the Korean Society of Mechanical Engineers A
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• v.38 no.3
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• pp.259-267
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• 2014

Fatigue tests were performed in various simulated body environments reflecting various factors (such as body fluids, artificial saliva) relevant within a living body. First, the fatigue limit under a simulated body environment (artificial saliva) was evaluated and the governing factors of implant fatigue strength were looked into by observing the fracture mode. The fatigue life of an implant decreased in the artificial saliva environment compared with that in the ringer environment. Furthermore, in the artificial saliva environment, the implant fracture mode was fatigue failure of fixture as opposed to the abutment screw mode in the ringer environment. In the fatigue test, corrosion products were observed on the implant in the simulated body environment. A larger amount of corrosion products were generated on the artificial saliva specimen than on the ringer specimen. It is thought that the stronger corrosion activity on the artificial saliva specimen as compared with that on the ringer specimen led to an overall decrease of fatigue life of the former specimen. In the case of the implant with a nitrided abutment screw eliminated hardened layer (TixN), a several times increase in fatigue life is achieved in comparison with tungsten carbide-coated implants.

• Journal of Welding and Joining
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• v.13 no.3
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• pp.134-146
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• 1995

Aluminium nitride(AlN) is currently under investigation as potential candidate for replacing alumium oxide(Al$_{2}$ $O_{3}$) as a substrate material for for electronic circuit packaging. Brazing of aluminium nitride(AlN) to Cu with Ag base active alloy containing Ti has been investigated in vacuum. Binary Ag$_{98}$ $Ti_{2}$(AT) and ternary At-1wt.%Al(ATA), AT-1wt.%Ni(ATN), AT-1wt.% Mn(ATM) alloys showed good wettability to AlN and led to the development of strong bond between brate alloy and AlN ceramic. The reaction between AlN and the melted brazing alloys resulted in the formation of continuous TiN layers at the AlN side iterface. This reaction layer was found to increase by increase by increasing brazing time and temperature for all filler metals. The bond strength, measured by 4-point bend test, was increased with bonding temperature and showed maximum value and then decreased with temperature. It might be concluded that optimum thickness of the reaction layer was existed for maximum bond strength. The joint brazed at 900.deg.C for 1800sec using binary AT alloy fractured at the maximum load of 35kgf which is the highest value measured in this work. The failure of this joint was initiated at the interface between AlN and TiN layer and then proceeded alternately through the interior of the reaction layer and AlN ceramic itself.

• Journal of Korea Foundry Society
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• v.28 no.3
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• pp.124-128
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• 2008

The nitride layer was formed on Ti and Ti-10 wt.%Ta-10 wt.%Nb alloy by a plasma nitriding method. Temperature was selected as the main experimental parameter for plasma nitriding. XRD, EDX, and hardness test were employed to analyze the evolution and material properties of the layer. The SEM observation of TiN nitride layer revealed that the thickness of nitride layer tended to increase with increasing temperature. ${\delta}-TiN$, ${\varepsilon}-Ti_{2}N$ and ${\alpha}-Ti$ phases were detected by XRD analysis and the preferred orientation of TiN nitride layer was obviously observed at (220) plane with increasing temperature. From XRD analysis after step polishing the nitride specimens treated at $850^{\circ}C$, as polishing from the surface, TiN and $Ti_{2}N$ phases decreased gradually. After polishing the surface by $4{\um}m$, a small amount of $Ti_{2}N$ and ${\alpha}-Ti$ phases were observed. The adhesive strength test result indicated that adhesive strength increased with increasing temperature.

• Journal of the Microelectronics and Packaging Society
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• v.3 no.1
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• pp.11-24
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• 1996

부분압이 다른 여러 가지 반응성 가스분위기하에서 이른곤 이온을 이용하여 PC, PET PMMA 그리고 PTFE 폴리머 표면의 삼차 증류수에대한 진수성을 증대하였다. 폴리머 표면의 친수성의 변화는 여러 가지 반응성 가스 분위기하에서 아르곤 이온의 조사량을 1014 부터 1x1017cm2까지 변화하면서 조사하였다. 접촉감은 아르곤 이온이 조사되는 폴리머 표면 근처에 유입된 가스의 방응성(O2>N2>H2)에 따라 많이 감소하였다, 폴리머 표면에 형성된 친수성기는 XPS Cls, Ols, 그리고 Nls 스펙트럼을 분석하여 확인하였다. 표면 개질된 PC와 PTFE에 대한 Al 금속의 접착력 증대를 Scotch tape와 인장실험을 통하여 확인하였다. 접착 력 증가는 표면 에너지 중 polar force의 증가에 의한 것으로 입증되었다. 에너지를 가진 아 르곤 입자 폴리머 체인 그리고 반응성 가스 사이의 반응기구는 2단계 모델로 설명가능하였 는데 그 기구는 첫 번째 이온의 조사에 의한 불안정한 폴리머 체인의 형성과 두 번째 단계 로 이렇게 형성된 폴리머 체인과 반응성 가스들 사이의 화학반응으로 이루어진다. 질화아루 미늄의 표면을 산소분위기하에서 아르곤 빔을 조사하여 표면개질한후 AlON층이 새롭게 형 성된 것을 XPS를 이용하여 확인할수 있었다. 개질된 질화알루미늄과 구리금속 박막간의 접 착력을 scratch 실험을 통하여 조사하였다.

• Journal of the Korean Society for Heat Treatment
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• v.4 no.4
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• pp.1-14
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• 1991

In PECVD(Plasma-Enhanced Chemical Vapor Deposition) process, titanium nitride is thin and its adhesion is poor for the protective coatings. Therefore it has been studied that intermediate layer forms between substrate and TiN thin film. Using R.F. plasma nitriding, nitride layer was first formed, then TiN thin film coated by PECVD. The chemical composition of the coatings has been characterized using AES, EDS and their crystallographic structure by means of XRD. Mechanical properties such as microhardness and film adhesion have also been determined by vickers hardness test, scratch test and indentation test. As a result, there was no difference in chemical composition and structure between the TiN deposition only and the composite of TiN deposition on nitrided steel. It was found that nitrided substrate increased the hardness of TiN coatings and was beneficial in preventing the plastic deformation in the substrate. Therefore the effective load bearing capacity of the TiN coatings on nitrided steel was increased and their adhesion was improved as well. According to the results of this study, the processes that lead to the formation of composite layers characterized by good working properties, i.e., high microhardness, adhesion and resistance to deformation.

• Electrical & Electronic Materials
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• v.9 no.5
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• pp.476-482
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• 1996

The multi-dielectric layer SiO$_{2}$/Si$_{3}$N$_{4}$/SiO$_{2}$(ONO) is used to improve electrical capacitance and to scale down the memory device. In this paper, improvement of the capacitance by reducing the bottom oxide thickness in the nitride deposition with load lock(L/L) vacuum system is studied. Bottom oxide thickness under the nitride layer is measured by ellipsometer both in L/L and non-L/L systems. Both results are in the range of 3-10.angs. and 10-15.angs., respectively, independent of the nitride and top oxide thickness. Effective thickness and cell capacitance for SONOS capacitor are in the range of 50-52.angs. and 35-37fF respectively in the case of nitride 70.angs. in L/L vacuum system. Compared with non-L/L system, the bottom oxide thickness in the case of L/L system decreases while cell capacitance increases about 4 fF. The results obtained in this study are also applicable to ONO scaling in the thin bottom oxide region of memory stacked capacitor.

• Journal of the Korean institute of surface engineering
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• v.34 no.3
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• pp.231-239
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• 2001

The structure and composition of Cr-nitrides formed on an electroplated hard Cr layer during an ionnitriding process was analyzed, and the growth kinetics of the Cr-nitrides was examined as a function of the ion-nitriding temperature and time in order to establish a computer simulation model prediction the growth behavior of the Cr-nitride layer. The Cr-nitrides formed during the ion-nitriding at $550~770^{\circ}C$ were composed of outer CrN and inner $Cr_2$N layers. A nitrogen diffusion model in the multi-layer based on fixed grid FDM (Finite Difference Method) was applied to simulate the growth kinetics of Cr-nitride layers. By measuring the thickness of each Cr-nitride layer as a function of the ion-nitriding temperature and time, the activation energy for growth of each Cr-nitride was determined; 82.26 KJ/mol for CrN and 83.36 Kj/mol for $Cr_2$N. Further, the nitrogen diffusion constant was determined in each layer; $9.70$\times$10^{-12}$ /$m^2$/s in CrN and $2.46$\times$10^{-12}$ $m^2$/s in $Cr_2$N. The simulation on the growth kinetics of Cr-nitride layers was in good agreements with the experimental results at 550~72$0^{\circ}C$.

• Korean Journal of Materials Research
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• v.11 no.4
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• pp.324-328
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• 2001

CrN films were deposited onto STD61 steel substrates using an arc-ion plating apparatus, with and without ion-nitriding pretreatment, and their oxidation was studied between 700 and $900^{\circ}C$ for 40hr in air. The oxidation behavior was examined by thermogravimetric analyses, X-ray diffraction. EDS and SEM. The deposited CrN films consisted of CrN and $Cr_2$N phases. The CrN films increased the oxidation resistance of the substrate by forming a protective $Cr_2$$O_3$ layer. The ion-nitriding pretreatment has not affected the oxidation resistance of the CrN film.

• Proceedings of the Materials Research Society of Korea Conference
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• 2010.05a
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• pp.32.2-32.2
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• 2010

본 연구에서는 고출력, 고휘도를 위해서 개발되고 있는 수직형 LED소자의 광출력향상을 위한 나노 패터닝 공정을 진행하였다. 수직형 LED는 기존 측면형 LED에 비해서 열방출 특성이 우수하고 대면적 칩으로 제작이 가능하기 때문에 높은 광출력이 필요한 조명 분야로의 적용이 가능하다. 하지만 수직형 LED 역시 기존 측면형 LED와 마찬가지로 질화갈륨 및 외부 공기와의 계면에서 전반사가 심하기 때문에 광추출효율이 낮은 문제점이 있으며 이를 해결하는 것이 큰 이슈가 되고 있다. 이를 해결하기 위해서 광결정 패턴을 LED 소자에 형성하여 광추출효율을 향상시키려는 연구가 활발히 진행되고 있으나 아직까지 수직형 LED 웨이퍼 전면적에 균일한 패턴을 형성할 수 있는 기술 개발이 미진한 상황이다. 본 연구에서는 유연 고분자 몰드를 이용한 대면적 나노 임프린팅 및 나노 프린팅 기술을 통해서 2 inch 수직형 LED 웨이퍼 전면적에 균일한 패턴을 전사하는 공정을 진행하였다. 구체적으로는 나노임프린트 및 건식식각 공정을 통해서 수직형 LED의 n형 질화갈륨 층에 높은 가로세로비의 광결정 패턴을 형성하였으며 이를 통해서 약 40% 정도의 광출력이 향상되었다. 또한 고 굴절률의 산화아연 나노 패턴 형성공정을 대면적 LED 기판에 시도하였다.