• 제목/요약/키워드: 진동 전기화학 폴리싱

검색결과 4건 처리시간 0.025초

미세표면 평활화를 위한 진동 전기화학 폴리싱 (Vibration Electrochemical Polishing for Localized Surface Leveling)

  • 김욱수;김영빈;박정우
    • 한국정밀공학회지
    • /
    • 제30권2호
    • /
    • pp.148-153
    • /
    • 2013
  • This study demonstrates a novel hybrid surface polishing process combining non-traditional electrochemical polishing(ECP) with external artificial ultrasonic vibration. ECP, typical noncontact surface polishing process, has been used to improve surface quality without leaving any mechanical scratch marks formed by previous mechanical processes, which can polish work material by electrochemical dissolution between two electrodes surfaces. This research suggests vibration electrochemical polishing(VECP) assisted by ultrasonic vibration for enhancing electrochemical reaction and surface quality compared to the conventional ECP. The localized roughness of work material is measured by atomic force microscopy(AFM) for detailed information on surface. Besides roughness, overall surface quality, material removal rate(MRR), and productivity etc. are compared with conventional ECP.

스테인리스강의 표면 결점 개선을 위한 진동 전기화학 폴리싱 (Vibration Electrochemical Polishing (VECP) for Improved Surface Defects of Stainless Steel)

  • 김욱수;박정우
    • 한국생산제조학회지
    • /
    • 제22권5호
    • /
    • pp.795-799
    • /
    • 2013
  • This paper describes a novel hybrid surface polishing process combining non-traditional electrochemical polishing (ECP) with external artificial ultrasonic vibration. The purpose of this study is to develop an easier method for improving stainless steel surfaces. To this end, vibration electrochemical polishing (VECP), a novel ultrasonic manufacturing process, for enhancing electrochemical reaction and surface quality compared with that achieved using conventional ECP is suggested. In addition, for finding the optimized experimental conditions, the two methods are compared under various current densities. Localized roughness of the work material is measured with atomic force microscopy (AFM) and scanning electron microscopy (SEM) for obtaining detailed surface information.