• Title/Summary/Keyword: 전자소자

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A Study on The Multi-point Signal and It's Directivity detection of FBG Hydrophone Using Hopper WDM be in The Making (Hopper WDM을 이용한 FBG(Fiber Bragg Grating) 하이드로폰(Hydrophone)의 다중점신호검출 및 지향성 연구)

  • Kim, Kyung Bok
    • Journal of the Institute of Electronics and Information Engineers
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    • v.52 no.11
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    • pp.156-163
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    • 2015
  • In the using of FBG(Fiber Bragg Grating) developed in home land, we designed and manufactured united FBG acoustic transducers the first in Korea. they are being applied to multi-point signal detection of FBG Hydrophone used Hopper WDM(national patent NO 10-1502954) in the underwater. On united FBG transducers manufactured, we made an demonstrated on respective frequency response peculiarities in the underwater and analyzed the special characters. As the experimental result on frequency response peculiarities, we made it possible underwater acoustic detection on united FBG acoustic transducers type to maximum 30Hz~2.5KHz. it's the optimum conditions of 1.2KHz frequency in detection. And for the purpose of realization on multi-point signal detection on wide scope in the underwater, in the using of WDM(Wavelength Division Multiplexing) method and passive band-pass filter system, established arrays system and succeeded in multi-point underwater acoustic signal detection to the frequency 200Hz~1.3KHz out of the two united type FBG transducers. Additionally, it would be possible directivity detection for the object of its source as the intensity of detection signal varies with the sound source's direction and angle. From now on we prepared a new moment on the practical use study on FBG hydrophone in the future.

Relationship between the Deposition of Tear Constituents and the Adherence of Candida albicans according to Soft Contact Lens Materials and Pigmentation (소프트콘택트렌즈 재질과 착색에 따른 눈물성분 침착과 칸디다균 흡착의 상관관계)

  • Park, So Hyun;Kim, So Ra;Park, Mijung
    • Journal of Korean Ophthalmic Optics Society
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    • v.21 no.3
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    • pp.215-225
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    • 2016
  • Purpose: The aim of this study was to figure out how the characteristics of soft contact lens materials and pigmentation affect the adherence of C. albicans on soft contact lenses pre-deposited with tear constituents. Methods: The adherent number of C. albicans on clear soft contact lenses (hereinafter clear lenses) and circle soft contact lenses (hereinafter circle lenses) made of etafilcon A, hilaiflcon B and nelfilcon A, respectively, was measured before and after the deposition of artificial tear. Also, bacteria adherence on lenses were observed by a scanning electron microscope. Results: Adherence of C. albicans was significantly different according to lens materials. The amount of adsorption was not different between clear lenses and circle lenses made of etafilcon A however, the number of bacteria absorption was bigger in hilafilcon B and nelfilcon A lenses. More absorption of C. albicans was found in the non-pigmented central area compared the pigmented area, and non-pigmented peripheral area has more bacterial absorption than non-pigmented central area. The number of C. albicans decreased in the case that tear protein was pre-deposited. The maintenance of antibacterial activity against C. albicans was different according to lens materials thus, etafilcon A has the longest period of its maintenance. Conclusions: It was revealed that the number of C. albicans was different according to the characteristics of lens materials, pigmentation or non-pigmentation, the pigmented area of soft contact lenses. Thus, it is suggested that the management method should be different according to the adsorption characteristics of C. albicans.

A Study on Dose and Image Quality according to X-ray Photon Detection Method in Digital Radiography System (Digital Radiography System에서 X선 광자 검출 방식에 따른 선량 및 화질 특성에 관한 연구)

  • Hong, Sun Suk;Kim, Ho Chul
    • Journal of the Institute of Electronics and Information Engineers
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    • v.50 no.12
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    • pp.247-253
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    • 2013
  • The purpose is a comparative evaluation in the DR System according to the dosimetry and image quality of the quantitative and objective via Direct digital radiography, Indirect digital radiography, Image intensifier (Charge Coupled Device type) digital radiography. The experimental method used rando phantom and measured the entrance surface dose. And through using the measured entrance surface dose and then using the PCXMC program were evaluated risk due to irradiation and the effective dose. SNR and NPS and CNR were measured and analyzed by using 21cm acryl phantom. Significance of measured value was evaluated by statistics method. Entrance surface dose, major organ dose, effective dose all of them were measured the lowest rated in direct DR when it is on the basis of direct DR dose, high-dose ratio were measured in I.I DR approximately 1.3 times, indirect DR approximately 2.4 times. Risk in accordance with radiation also was measured same as dose ratio. On the conclusion that SNR measurement result based on direct DR SNR measurements, low-SNR ratio were measured in I.I DR approximately 7.25 times, indirect DR approximately 1.48 times. On the conclusion that CNR measurement result based on direct DR CNR measurements, high-dose ratio were measured in I.I type DR approximately 1.16 tims and low-dose ratio were measured in indirect DR approximately 0.87 times. Therefore Direct DR system using a-selenium sensing element to detect x-ray photon is thought effectively at the examination such as infant to sensitive irradiation and the genital gland. Because quality image is built by low dose. Also when it is necessary that image test requiring many diagnosis information, indirect DR system is thought effectively.

Optical Current Sensors with Improved Reliability using an Integrated-Optic Reflective Interferometer (반사형 간섭계를 이용하여 신뢰성을 향상시킨 광전류센서)

  • Kim, Sung-Moon;Chu, Woo-Sung;Oh, Min-Cheol
    • Journal of the Institute of Electronics and Information Engineers
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    • v.54 no.5
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    • pp.17-23
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    • 2017
  • Optical current sensors are suitable for operation in high voltage and high current environments such as power plants due to they are not affected by electromagnetic interference and have excellent insulation characteristics. However, as they operate in a harsh environment such as large temperature fluctuation and mechanical vibration, high reliability of the sensor is required. Therefore, many groups have been working on enhancing the reliability. In this work, an integrated optical current sensor incorporating polarization-rotated reflection interferometer is proposed. By integrating various optical components on a single chip, the sensor exhibits enhanced stability as well as the solution for low-cost optical sensors. Using this, we performed the characterization for the actual field application. By using a large power source, the current of 0.3 kA~36 kA was applied to the photosensor and the linear operation characteristics were observed. The error of the sensor was within $0{\pm}.5%$. Even when operating for a long time, the error range of the sensor was kept within $0{\pm}.5%$. In addition, the measurement of the frequency response over the range of 60 Hz to 10 kHz has confirmed that the 3-dB frequency band of the proposed OCT is well over 10 kHz.

Miniaturized Ground-Detection Sensor using a Geomagnetic Sensor for an Air-burst Munition Fuze (공중폭발탄용 신관에 적용 가능한 초소형 지자기 지면감지 센서)

  • LEE, HanJin
    • Journal of the Institute of Electronics and Information Engineers
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    • v.54 no.5
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    • pp.97-105
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    • 2017
  • An air-burst munition is limited in space, so there is a limit on the size of the fuze and the amount of ammunition. In order to increase a firepower to a target with limited ammunition, it is necessary to concentrate the firepower on the ground instead of the omnidirectional explosion after flying to the target. This paper explores the design and verification of a ground-detection sensor that detects the direction of the ground and determines the flight-distance of an air-burst munition using a single axis geomagnetic sensor. Prior to the design of the ground detection sensor, a geomagnetic sensor model mounted on the spinning air-burst munition is analyzed and a ground-detection algorithm by simplifying this model is designed. A high speed rotating device to simulate a rotation environment is designed and a geomagnetic sensor and a remote-recording system are fabricated to obtain geomagnetic data. The ground detection algorithm is verified by post-processing the acquired geomagnetic data. Taking miniaturization and low-power into consideration, the ground detection sensor is implemented with analog devices and the processor. The output signal of the ground detection sensor rotating at an arbitrary rotation speed of 200 Hz is connected to the LED (Light Emitting Diode) in the high speed rotating device and the ground detection sensor is verified using a high-speed camera.

Comparison Between the Facet Reflectivities of Buried Channel Waveguides and Those of Ridge Waveguides Using the Angular Spectrum Method (Angular spectrum 방법을 사용하여 구한 buried channel 도파로와 ridge 도파로의 단면 반사율 비교)

  • Kim, Sang-Taek;Kim, Dong-Hu;Kim, Bu-Gyun;Yu, Myeong-Sik
    • Journal of the Institute of Electronics Engineers of Korea SD
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    • v.38 no.9
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    • pp.634-642
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    • 2001
  • We calculate the facet reflectivity of buried channel waveguides and ridge waveguides as a function of the waveguide width for various thicknesses using the angular spectrum method and the two dimensional field profiles obtained by the variational method (VM) and the effective index method (EIM). The variation of the reflectivity of buried channel waveguides as a function of the waveguide width is large, while that of ridge waveguides is very small. The accuracy of the field profiles necessary for the calculation of the facet reflectivity using the angular spectrum method greatly affects that of the facet reflectivity. The difference between the exact reflectivity and that using EIM increases as the waveguide width and thickness decreases due to the inaccuracy of the field profiles obtained by EIM. However, the difference between the exact reflectivity and that using VM is smaller than that using EIM regardless of waveguide width and thickness. The difference between the facet reflectivities u sing EIM and VM is small in the area where the EIM works very well.

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High-performance 94 GHz Single Balanced Mixer Based On 70 nm MHEMT And DAML Technology (70 nm MHEMT와 DAML 기술을 이용한 우수한 성능의 94 GHz 단일 평형 혼합기)

  • Kim Sung-Chan;An Dan;Lim Byeong-Ok;Beak Tae-Jong;Shin Dong-Hoon;Rhee Jin-Koo
    • Journal of the Institute of Electronics Engineers of Korea SD
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    • v.43 no.4 s.346
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    • pp.8-15
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    • 2006
  • In this paper, the 94 GHz, low conversion loss, and high isolation single balanced mixer is designed and fabricated using GaAs-based metamorphic high electron mobility transistors (MHEMTs) with 70 nm gate length and the hybrid ring coupler with the micromachined transmission lines, dielectric-supported air-gapped microstrip lines (DAMLs). The 70 nm MHEMT devices exhibit DC characteristics with a drain current density of 607 mA/mm an extrinsic transconductance of 1015 mS/mm. The current gain cutoff frequency ($f_T$) and maximum oscillation frequency ($f_{max}$) are 320 GHz and 430 GHz, respectively. The fabricated hybrid ring coupler shows wideband characteristics of the coupling loss of $3.57{\pm}0.22dB$ and the transmission loss of $3.80{\pm}0.08dB$ in the measured frequency range of 85 GHz to 105 GHz. This mixer shows that the conversion loss and isolation characteristics are $2.5dB{\sim}>2.8dB$ and under -30 dB, respectively, in the range of $93.65GHz{\sim}94.25GHz$. At the center frequency of 94 GHz, this mixer shows the minimum conversion loss of 2.5 dB at a LO power of 6 dBm To our knowledge, these results are the best performances demonstrated from 94 GHz single balanced mixer utilizing GaAs-based HEMTs in terms of conversion loss as well as isolation characteristics.

An On-chip ESD Protection Method for Preventing Current Crowding on a Guard-ring Structure (가드링 구조에서 전류 과밀 현상 억제를 위한 온-칩 정전기 보호 방법)

  • Song, Jong-Kyu;Jang, Chang-Soo;Jung, Won-Young;Song, In-Chae;Wee, Jae-Kyung
    • Journal of the Institute of Electronics Engineers of Korea SD
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    • v.46 no.12
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    • pp.105-112
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    • 2009
  • In this paper, we investigated abnormal ESD failure on guard-rings in the smart power IC fabricated with $0.35{\mu}m$ Bipolar-CMOS-DMOS (BCD) technology. Initially, ESD failure occurred below 200 V in the Machine Model (MM) test due to current crowding in the parasitic diode associated with the guard-rings which are generally adopted to prevent latch-up in high voltage devices. Optical Beam Induced Resistance Charge (OBIRCH) and Scanning Electronic Microscope (SEM) were used to find the failure spot and 3-D TCAD was used to verify cause of failure. According to the simulation results, excessive current flows at the comer of the guard-ring isolated by Local Oxidation of Silicon (LOCOS) in the ESD event. Eventually, the ESD failure occurs at that comer of the guard-ring. The modified comer design of the guard-ring is proposed to resolve such ESD failure. The test chips designed by the proposed modification passed MM test over 200 V. Analyzing the test chips statistically, ESD immunity was increased over 20 % in MM mode test. In order to avoid such ESD failure, the automatic method to check the weak point in the guard-ring is also proposed by modifying the Design Rule Check (DRC) used in BCD technology. This DRC was used to check other similar products and 24 errors were found. After correcting the errors, the measured ESD level fulfilled the general industry specification such as HBM 2000 V and MM 200V.

Fabrication Process of Single-walled Carbon Nanotube Sensors Aligned by a Simple Self-assembly Technique (간단한 자기 조립 기법으로 배열된 단일벽 탄소 나노 튜브 센서의 제작공정)

  • Kim, Kyeong-Heon;Kim, Sun-Ho;Byun, Young-Tae
    • Journal of the Institute of Electronics Engineers of Korea SC
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    • v.48 no.2
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    • pp.28-34
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    • 2011
  • In previous reports, we investigated a selective assembly method of fabricating single-walled carbon nanotubes (SWCNTs) on a silicon-dioxide ($SiO_2$) surface by using only a photolithographic process. In this paper, we have fabricated field effect transistors (FETs) with SWCNT channels by using the technique mentioned above. Also, we have electrically measured gating effects of these FETs under different source-drain voltages ($V_{SD}$). These FETs have been fabricated for sensor applications. Photoresist (PR) patterns have been made on a $SiO_2$-grown silicon (Si) substrate by using a photolithographic process. This PR-patterned substrate have been dipped into a SWCNT solution dispersed in dichlorobenzene (DCB). These PR patterns have been removed by using aceton. As a result, a selectively-assembled SWCNT channels in FET arrays have been obtained between source and drain electrodes. Finally, we have successfully fabricated 4 FET arrays based on SWCNT-channels by using our simple self-assembly technique.

Effect of Doubly Plasma Oxidation Time on TMR Devices (이중절연층 산화공정에서 플라즈마 산화시간에 따른 터널자기저항 효과)

  • Lee, Ki-Yung;Song, Oh-Sung
    • Journal of the Korean Magnetics Society
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    • v.12 no.4
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    • pp.127-131
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    • 2002
  • We fabricated MTJ devices that have doubly oxidized tunnel barrier using plasma oxidation method to from oxidized AlO$\sub$x/ tunnel barrier. Doubly oxidation I, which sputtered 10 ${\AA}$-bottom Al layer and oxidized it with oxidation time of 10 s. Subsequent sputtering of 13 ${\AA}$-Al was performed and the metallic layer was oxidized for 50, 80 and 120 s., respectively. Doubly oxidation II, which sputtered 10 ${\AA}$-bottom Al layer and oxidized it varying oxidation time for 30∼120 s. Subsequent sputtering of 13 ${\AA}$-Al was performed and the metallic layer was oxidized for 210 sec. Double oxidation process specimen showed MR ratio of above 27% in all experiment range. Singly oxidation process. 13 ${\AA}$-Al layer and oxidized up to 210 s, showed less MR ratio and more narrow process window than those of doubly oxidation. Cross-sectional TEM images would that doubly oxidized barrowers were thinner and denser than singly oxidized ones. XPS characterization confirmed that doubly oxidation of Fe with bottom insulating layer. As a result, doubly oxidation could have superior MR ratio in process extent during long oxidation time because of preventing oxidation of bottom magnetic layer than singly oxidation.