• Title/Summary/Keyword: 전계효과

Search Result 443, Processing Time 0.032 seconds

열 화학기상증착법을 이용한 BCN 나노시트의 합성과 전기적 특성 분석

  • Jeon, Seung-Han;Cha, Myeong-Jun;Song, U-Seok;Kim, Seong-Hwan;Jeon, Cheol-Ho;Park, Jong-Yun
    • Proceedings of the Korean Vacuum Society Conference
    • /
    • 2012.08a
    • /
    • pp.399-399
    • /
    • 2012
  • 최근 그래핀 연구와 더불어 2차원 구조의 나노소재에 대한 관심이 급증하면서 육각형의 질화붕소(hexagonal boron nitride; h-BN) 나노시트(nanosheet)[1]나 붕소 탄화질화물(boron caronitride;BCN) 나노시트[2, 3]와 같은 2차원 구조체에 대한 연구가 활발히 진행되고 있다. 그 중 BCN은 반금속(semimetal)인 흑연(graphite)과 절연체인 h-BN이 결합된 나노시트로 원소의 구성 비율에 따라 전기적 특성을 제어할 수 있다는 장점이 있다. 따라서 다양한 나노소자로의 응용을 위한 연구가 활발히 진행되고 있다. 본 연구에서는 열 화학기상증착법(thermal chemical vapor deposition)을 이용하여 폴리스틸렌(polystyrene)과 보레인 암모니아(borane ammonia)를 사용하여 BCN 나노시트를 합성하였다. 합성된 BCN 나노시트의 구조적 특징과 화학적 조성 및 결합 상태를 주사전자현미경(scanning electron microscopy), 투과전자현미경(transmission electron microscopy), X-선 광전자 분광법(X-ray photoelectron spectroscopy), 라만 분광법(Raman spectroscopy)을 통해 조사하였고, 이온성 용액법 (ionic liquid)[4]을 이용하여 전계효과 특성을 측정하였다.

  • PDF

저온공정 InSnZnO 채널층을 이용한 산화막/산화막/산화막 비휘발성 메모리 소자의 전기적 특성 연구

  • Lee, So-Jin;Nguyen, Cam Phu Thi;Jang, Gyeong-Su;Kim, Tae-Yong;Lee, Yeong-Seok;Lee, Jun-Sin
    • Proceedings of the Korean Vacuum Society Conference
    • /
    • 2016.02a
    • /
    • pp.317-317
    • /
    • 2016
  • 이 연구에서는 산화막/산화막/산화막 적층구조의 블로킹산화막/전하저장층/터널링산화막과 InSnZnO를 채널층으로 이용한 비휘발성 메모리 (NVM) 소자의 메모리 특성을 확인하였다. NVM 소자의 기본 전기적 특성의 경우 $19.8cm2/V{\cdot}s$의 높은 전계효과 이동도, 0.09V의 낮은 문턱전압, 0.127 V/dec의 낮은 기울기 및 $1.47{\times}107$의 높은 전류점멸비를 나타내었다. 또한, InSnZnO의 경우 가시광영역에서 85% 이상의 투과도를 가짐을 확인하였다. NVM소자의 경우, +12V의 Programming과 1ms의 Programming duration time에서 104s 이후 86%이상의, 그리고 10년 후 67% 이상의 우수한 전하보유시간 특성을 나타내었다. 이를 통해 투명플렉서블 메모리 시스템에 산화막/산화막/산화막 적층구조의 InSnZnO NVM소자의 응용 가능성이 높다고 판단한다.

  • PDF

Analysis on the Field Effect Mobility Variation of Tin Oxide Thin Films with Oxygen Partial Pressure (산소 분압에 따른 산화주석 박막의 전계효과 이동도 변화 분석)

  • Ma, Tae Young
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
    • /
    • v.27 no.6
    • /
    • pp.350-355
    • /
    • 2014
  • Bottom-gate tin oxide ($SnO_2$) thin film transistors (TFTs) were fabricated on $N^+$ Si wafers used as gate electrodes. 60-nm-thick $SnO_2$ thin films acting as active layers were sputtered on $SiO_2/Al_2O_3$ films. The $SiO_2/Al_2O_3$ films deposited on the Si wafers were employed for gate dielectrics. In order to increase the resistivity of the $SnO_2$ thin films, oxygen mixed with argon was introduced into the chamber during the sputtering. The mobility of $SnO_2$ TFTs was measured as a function of the flow ratio of oxygen to argon ($O_2/Ar$). The mobility variation with $O_2/Ar$ was analyzed through studies on crystallinity, oxygen binding state, optical properties. X-ray diffraction (XRD) and XPS (X-ray photoelectron spectroscopy) were carried out to observe the crystallinity and oxygen binding state of $SnO_2$ films. The mobility decreased with increasing $O_2/Ar$. It was found that the decrease of the mobility is mainly due to the decrease in the polarizability of $SnO_2$ films.

The Change of I-V Characteristics by Gate Voltage Stress on Few Atomic Layered MoS2 Field Effect Transistors (수 원자층 두께의 MoS2 채널을 가진 전계효과 트랜지스터의 게이트 전압 스트레스에 의한 I-V 특성 변화)

  • Lee, Hyung Gyoo;Lee, Gisung
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
    • /
    • v.31 no.3
    • /
    • pp.135-140
    • /
    • 2018
  • Atomically thin $MoS_2$ single crystals have a two-dimensional structure and exhibit semiconductor properties, and have therefore recently been utilized in electronic devices and circuits. In this study, we have fabricated a field effect transistor (FET), using a CVD-grown, 3 nm-thin, $MoS_2$ single-crystal as a transistor channel after transfer onto a $SiO_2/Si$ substrate. The $MoS_2$ FETs displayed n-channel characteristics with an electron mobility of $0.05cm^2/V-sec$, and a current on/off ratio of $I_{ON}/I_{OFF}{\simeq}5{\times}10^4$. Application of bottom-gate voltage stresses, however, increased the interface charges on $MoS_2/SiO_2$, incurred the threshold voltage change, and degraded the device performance in further measurements. Exposure of the channel to UV radiation further degraded the device properties.

Electrical Properties of CuPC FET with Varying Substrate Temperature (CuPC PET의 기판온도에 따른 전기적 특성 연구)

  • Lee, Ho-Shik;Cheon, Min-Woo;Park, Yong-Pil
    • Journal of the Korea Institute of Information and Communication Engineering
    • /
    • v.13 no.1
    • /
    • pp.110-114
    • /
    • 2009
  • Organic field-effect transistors (OFETs) are of interest for use in widely area electronic applications. We fabricated a copper phthalocyanine (CuPc) based field-effect transistor with different substrate temperature. The CuPc FET device was made a top-contact type and the substrate temperature was room temperature and $150^{\circ}C$. The CuPc thickness was 40nm, and the channel length was $50{\mu}m$, channel width was 3mm. We observed a typical current-voltage (I-V) characteristics in CuPc FET.

BCN 박막의 합성과 전기적 특성 분석

  • Jeon, Seung-Han;Song, U-Seok;Jeong, Dae-Seong;Cha, Myeong-Jun;Kim, Seong-Hwan;Park, Jong-Yun
    • Proceedings of the Korean Vacuum Society Conference
    • /
    • 2013.02a
    • /
    • pp.617-617
    • /
    • 2013
  • 최근 그래핀 연구와 더불어 2차원 구조의 나노소재에 대한 관심이 급증하면서 육각형의 질화붕소(hexagonal boron nitride; h-BN) 박막(nanosheet) [1]이나 붕소 탄화질화물(boron caronitride; BCN) 박막 [2,3]과 같은 2차원 구조체에 대한 연구가 활발히 진행되고 있다. 그 중 BCN은 반금속(semimetal)인 흑연(graphite)과 절연체인 h-BN이 결합된 박막으로 원소의 구성 비율에 따라 전기적 특성을 제어할 수 있다는 장점이 있다. 따라서 다양한 나노소자로의 응용을 위한 연구가 활발히 진행되고 있다. 본 연구에서는 폴리스틸렌(polystyrene, PS)과 보레인 암모니아(borane ammonia)를 고체 소스로 이용하여 열화학기상증착법으로 BCN 박막을 SiO2 기판 위에 직접 합성하였다. SEM과 AFM 관측을 통해 합성된 BCN 박막의 두께가 약 10 nm이며, RMS roughness가 0.5~2.6 nm로 매우 낮은 것을 확인하였다. 합성과정에서 PS의 양을 조절하여 BCN 박막의 탄소의 밀도를 성공적으로 제어하였으며, 이에 따라 전기적인 특성이 제어되는 양상을 확인하였다. 또한 합성온도 변화에 따른 BCN 박막의 전기적인 특성이 제어되는 양상을 확인하였다. 추가적으로 같은 방법을 이용하여 BCN 박막을 Cu 위에서 합성하여 SiO2 기판위에 전사하였다. 합성된 BCN 박막의 구조적 특징과 화학적 조성 및 결합 상태를 투과전자현미경(transmission electron microscopy), X-선 광전자 분광법(X-ray photoelectron spectroscopy), 라만 분광법(Raman spectroscopy)을 통해 조사하였고, 이온성 용액법(ionic liquid) [4]을 이용하여 전계효과 특성을 측정하였다.

  • PDF

Fabrication and Electrical Properties of CuPc FET with Different Substrate Temperature (CuPc FET의 기판온도에 따른 제작 및 전기적 특성 연구)

  • Lee, Ho-Shik;Yang, Seong-Ho;Park, Yong-Pil
    • Proceedings of the Korean Institute of Information and Commucation Sciences Conference
    • /
    • 2007.06a
    • /
    • pp.548-551
    • /
    • 2007
  • Organic field-effect transistors (OFETs) are of interest for use in widely area electronic applications. We fabricated a copper phthalocyanine (CuPc) based field-effect transistor with different substrate temperature. The CuPc FET device was made a top-contact type and the substrate temperature was room temperature and $150^{\circ}C$. The CuPc thickness was 40nm, and the channel length was $50{\mu}m$, channel width was 3mm. We observed a typical current-voltage (I-V) characteristics in CuPc FET.

  • PDF

Electromagnetic Pulse Coupling into Naval Warship and Protective Measures (해군 함정에서의 EMP 영향 및 대책)

  • Yang, Jin-Ho;Nam, Sang-Wook
    • The Journal of Korean Institute of Electromagnetic Engineering and Science
    • /
    • v.25 no.4
    • /
    • pp.426-433
    • /
    • 2014
  • The high-altitude electromagnetic pulse(HEMP) generated by a high-altitude nuclear explosion. This paper presents the comparison of electric field penetration in Bell laboratories and IEC 61000-2-9 standard when HEMP source penetrates through Naval Warship conducted coupling path and radiated coupling path. Also we analyze the effects of two kinds of coupling and propose Protective measures. Simulation results confirm IEC 61000-2-9 standard is more strict than the Bell Laboratories standard except for a lower frequency band, so we proposed IEC 61000-2-9 standard as a Naval HEMP standard. Finally, we offer the protective measures such as the shielding coating, Honeycomb ventilation, TVS in order to meet the military criteria.

Linearity of All Optical Dual EA Modulator for Narrow-band Microwave Optical Transmissions (협대역 마이크로파 광전송을 위한 전광 이중 전계흡수 광변조기의 선형특성)

  • Lee, Gyu-Woong;Han, Sang-Kook
    • Journal of the Korean Institute of Telematics and Electronics D
    • /
    • v.36D no.6
    • /
    • pp.87-96
    • /
    • 1999
  • For analog optical transmission of narrow-band microwave signal, a novel all-optical linearization technique of electro-absorption (EA) optical modulator by using dual modulation scheme is proposed and theoretically investigated. By using the dual modulation scheme where the sub-modulator has a different length, DC bias and band-gap wavelength, the DC bias operation point where the third-order intermodulation products of ~30dB and the following increase of spurious free dynamic range (SFDR) of ~20dB wave achieved in sub-octave narrow band operation.

  • PDF

Electrical Characteristics of IGBT for Gate Bias under $\gamma$ Irradiation (게이트바이어스에서 감마방사선의 IGBT 전기적 특성)

  • Lho, Young-Hwan
    • Journal of the Institute of Electronics Engineers of Korea SC
    • /
    • v.46 no.2
    • /
    • pp.1-6
    • /
    • 2009
  • The experimental results of exposing IGBT (Insulated Gate Bipolar Transistor) samples to gamma radiation source show shifting of threshold voltages in the MOSFET and degradation of carrier mobility and current gains. At low total dose rate, the shift of threshold voltage is the major contribution of current increases, but for more than some total dose, the current is increased because of the current gain degradation occurred in the vertical PNP at the output of the IGBTs. In the paper, the collector current characteristics as a function of gate emitter voltage (VGE) curves are tested and analyzed with the model considering the radiation damage on the devices for gate bias and different dose. In addition, the model parameters between simulations and experiments are found and studied.