• Journal of the Institute of Electronics Engineers of Korea SP
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• v.46 no.3
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• pp.1-9
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• 2009

Using the projected 2-dimensional tilted images obtained from the transmission electron microscopy, we can reconstruct the 3-dimensional structures of objects, such as cells. As a preprocessing procedure, the tilted images should be registered and compensated in terms of the spatial position and the intensity difference, respectively. In this paper, we employ the fiducial marker-based approach to perform a registration, and introduce a simple intensity compensation scheme. Based on the transmissivity image formation model, we propose an algorithm that can compensate the components of the illumination and transmissivity of each image according to the tilted angle. Numerical analysis using real images obtained from the transmission electron microscopy are shown in this paper to show the performance of the proposed algorithm.

• Journal of the Korean Society for Nondestructive Testing
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• v.35 no.3
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• pp.200-205
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• 2015

An ultra-precise infrared microscope consisting of a high-resolution infrared objective lens and infrared sensors is utilized successfully to obtain location information on the plane and depth of local heat sources causing defects in a semiconductor device. In this study, multi-layer semiconductor chips are analyzed for the positional information of heat sources by using a lock-in infrared microscope. Optimal conditions such as focal position, integration time, current and lock-in frequency for measuring the accurate depth of the heat sources are studied by lock-in thermography. The location indicated by the results of the depth estimate, according to the change in distance between the infrared objective lens and the specimen is analyzed under these optimal conditions.

• Journal of the Korean Society for Nondestructive Testing
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• v.35 no.1
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• pp.12-17
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• 2015

In this study, we analyzed and showed the enhanced thermal resolution of a lock-in infrared thermography system by employing a blackbody system and micro-register sample. The noise level or thermal resolution of an infrared camera system is usually expressed by a noise equivalent temperature difference (NETD), which is the mean square of the deviation of the different values measured for one pixel from its mean values obtained in successive measurements. However, for lock-in thermography, a more convenient quantity in the phase-independent temperature modulation amplitude can be acquired. On the basis of results, it was observed that the NETD or thermal resolution of the lock-in thermography system was significantly enhanced, which we consider to have been caused by the averaging and filtering effects of the lock-in technique.

• Proceedings of the Korea Multimedia Society Conference
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• 2003.11b
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• pp.561-564
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• 2003

일반적으로 피부 미용분야에서 건강모발과 손상모발을 구분하기 위해 전자현미경으로 촬영된 영상에서 모발의 벌어짐, 갈라짐, 젖혀짐, 탈락, 용해 등의 특징을 관찰하여 사용하고 있다. 그러나 주관적이고 정성적인 판단에 의존하기 때문에 수치적인 기준을 적용하는 객관성이 있는 판단이 요구된다. 본 논문에서는 영상처리 분야에서 에지 특성이 영상 분류나 검색에 사용되는 점을 활용, 에지처리된 영상의 구간별 밝기 누적정보를 비교하여 건강모발과 손상모발의 구분이 가능함을 보인다.

• Journal of the Korean Society of Radiology
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• v.2 no.2
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• pp.23-30
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• 2008

X-ray microscopy with synchrotron radiation(SR) might be a useful tool for novel x-ray imaging in the clinical and laboratory settings. Microscopically, it enables us to observe detailed structure of animal organs samples with a great magnification power and an excellent resolution. The phase contrast mechanisms in image by X-ray are described. The phase-contrast X-ray imaging with SR from in-vivo and in-vitro mouse tail, rat nerve and rat lung were obtained with an 8 KeV monochromatic beam. The visual image was magnified using 10x microscope objective lens and captured using an digital CCD camera. The results showed more structural details and high resolution images with SR imaging system than conventional X-ray radiography system. The SR imaging system may have a potential for imaging in biological researches, material applications and clinical radiography.

• Proceedings of the Korean Society of Precision Engineering Conference
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• 2012.05a
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• pp.827-828
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• 2012

• Applied Microscopy
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• v.39 no.2
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• pp.175-183
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• 2009

In this paper we present sub-50 pm resolution images of atom columns simulated with the negative of the second derivative of the exit-plane wave function (EPW). The EPW can be retrieved from a focal series reconstruction in the (high resolution) transmission electron microscopy (HRTEM). The simulated images are for Si and InAs in [114] and [116] orientations, which give about sub-50 pm separations of atom columns. The theoretical reason for the validity of this method is given from analysis based on the kinematical diffraction theory, and the limitation for applicability of this method also is discussed.

• Proceedings of the Korea Multimedia Society Conference
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• 2012.05a
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• pp.215-218
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• 2012

농업에 있어 해충 방제는 중요한 일이다. 특히, 볼록총채벌레는 최근 감귤원 해충 피해의 주요 해충으로 인식되어 주기적인 예찰이 이루어지고 있으나 성충의 크기가 0.8mm 정도로 작아 육안 식별에 어려움이 있다. 본 논문에서는 예찰 트랩에 포집된 볼록총채벌레를 자동으로 판별하기 위한 전처리 알고리즘을 제안하였다. 광학 현미경의 배율을 30, 40, 50배로 조정하여 영상을 획득하였고, 제안한 알고리즘을 적용하여 판별 성능을 측정한 결과, 50배율에서 가장 높은 판별율을 보였으나 더 많은 볼록총채벌레 영상을 대상으로 알고리즘을 테스트하고 개선할 필요가 있다.

• Journal of the Institute of Electronics Engineers of Korea SP
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• v.42 no.6
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• pp.121-132
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• 2005

In the formation of images in a camera, the exposure time is appropriately adjusted to obtain a good image. Hence for a successful alignment of a sequence of images to the same scene, it is required to compensate the different exposure times. If we have no knowledge regarding the exposure time, then we should develop an algorithm that can compensate an image with respect to a reference image without using any camera formation models. In this paper, an exposure compensation is performed by designing predictors based on the conditional expectation between the reference and input images. Further, an adaptive predictor design is conducted to manage the irregular exposure or histogram problem. In order to alleviate the blocking artifact and the overfitting problems in the adaptive scheme, a smoothing technique, which uses the pixels of the adjacent blocks, is proposed. We successfully conducted the exposure compensation using real images obtained from digital cameras and the transmission electron microscopy.

• Applied Microscopy
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• v.38 no.4
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• pp.363-374
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• 2008

In this paper we have examined the usefulness of IWFR (the iterative wave-function reconstruction) analysis for through-focal series of high-resolution images for a relative thick crystal. In the work we employed JEOL ARM 1300S, and observed the high-resolution images for a Si crystal at the two orientations of [01-1] and [11-2] having 30 nm and 35 nm thickness respectively. As a result of applying IWFR method on the images we found out that even for a thick crystal by the method we can retrieve the exit-surface wave function. However because of the strong dynamical scattering effect, the image pattern of the function reflects only qualitatively the atomic column structure of the crystal examined. Nevertheless it is no doubt that the pattern would give important clue for the crystal structure.