• Proceedings of the KIEE Conference
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• 2002.11c
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• pp.257-263
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• 2002

Test scheduling of SoC becomes more important because it is one of the prime methods to minimize the testing time under limited power consumption of SoCs. In this paper, a heuristic algorithm, in which test resources are selected for groups and arranged based on the size of product of power dissipation and test time together with total power consumption in core-based SoCs is proposed. We select test resource groups which has maximum power consumption but does not exceed the constrained power consumption and make the testing time slot of resources in the test resource group to be aligned at the initial position to minimize the idle test time of test resources.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.48 no.1
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• pp.31-38
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• 2011

With the increasing demand for high-speed transmission systems, adaptive equalizers have been widely used in receivers to overcome the limited bandwidth of channels. In order to reduce the cost for testing high-speed receiver chips, on-chip eye-opening monitoring (EOM) technique which measures the eye-opening of data waveform inside the chip can be employed. In this paper, a 10-Gb/s adaptive 2-tap look-ahead decision feedback equalizer (DFE) with EOM function is proposed. The proposed EOM circuit can be applied to look-ahead DFEs while existing EOM techniques cannot. The magnitudes of the post-cursors are measured by monitoring the eye of received signal, and coefficients of DFE are calculated using them by proposed adaptation algorithm. The circuit designed in 90nm CMOS technology and the algorithm are verified with post-layout simulation. The DFE core occupies $110{\times}95{\mu}m^2$ and consumes 11mW in 1.2V supply voltage.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.42 no.5 s.335
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• pp.39-46
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• 2005

This paper introduces a new At-speed Interconnect Test Controller (ASITC) that can detect and diagnose dynamic as well as static defects in an SoC. SoC is comprised of IEEE 1149.1 and P1500 wrapped cores which can be operated by multiple system clocks. In other to test such a complicated SoC, we designed a interface module for P1500 wrapped cores and the ASITC that makes it possible to detect interconnect delay faults during 1 system clock from launching to capturing the transition signal. The ASITC proposed requires less area overhead than other approaches and the operation was verified through the FPGA implementation

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.46 no.1
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• pp.76-84
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• 2009

This paper proposes a SOC platform which is eligible for education and application SOC design. The platform, fully synthesizable and reconfigurable, includes the OpenRISC embedded processor, some basic peripherals such as GPIO, UART, debug interlace, VGA controller and WISHBONE interconnect. The platform uses a set of development environment such as compiler, assembler, debugger and RTOS that is built for HW/SW system debugging and software development. Designed SOC, IPs and Testbenches are described in the Verilog HDL and verified using commercial logic simulator, GNU SW development tool kits and the FPGA. Finally, a multimedia SOC derived from the SOC platform is implemented to ASIC using the Magnachip cell library based on 0.18um 1-poly 6-metal technology.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.46 no.3
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• pp.26-31
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• 2009

A new LFSR based test compression scheme is proposed by reducing the maximum number of specified bits in the test cube set, smax, virtually. The performance of a conventional LFSR reseeding scheme highly depends on smax. In this paper, by using different clock frequencies between an LFSR and scan chains, and grouping the scan cells, we could reduce smax virtually. H the clock frequency which is slower than the clock frequency for the scan chain by n times is used for LFSR, successive n scan cells are filled with the same data; such that the number of specified bits can be reduced with an efficient grouping of scan cells. Since the efficiency of the proposed scheme depends on the grouping mechanism, a new graph-based scan cell grouping heuristic has been proposed. The simulation results on the largest ISCAS 89 benchmark circuit show that the proposed scheme requires less memory storage with significantly smaller area overhead compared to the previous test compression schemes.