• Journal of the Institute of Electronics Engineers of Korea SD
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• v.39 no.5
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• pp.54-64
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• 2002

Recently System On a Chip(SoC) design based on IP cores has become the trend of If design To prevent the testing problem from becoming the bottleneck of the core-based design, defining of an efficient test architecture and a successful test methodology are mandatory. This paper describes a test architecture and a test control access mechanism for SoC based on IEEE 1149.1 boundary,scan. The proposed SoC test architecture is fully compatible with IEEE P1500 Standard for Embedded Core Test(SECT), and applicable for both TAPed cores and Wrapped cores within a SOC with the same test access mechanism. Controlled by TCK, TMS, TDI, and TDO, the proposed test architecture provides a hierarchical test feature.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.41 no.3
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• pp.93-100
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• 2004

Test scheduling of SoC (System-on-a-chip) is very important because it is one of the prime methods to minimize the testing time under limited power consumption of SoC. In this paper, a heuristic algorithm, in which test resources are selected for groups and arranged based on the size of product of power dissipation and test time together with total power consumption in core-based SoC is proposed. We select test resource groups which has maximum power consumption but does not exceed the constrained power consumption and make the testing time slot of resources in the test resource group to be aligned at the initial position in test space to minimize the idling test time of test resources. The efficiency of proposed algorithm is confirmed by experiment using ITC02 benchmarks.

• Proceedings of the Korean Information Science Society Conference
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• 2004.10a
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• pp.553-555
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• 2004

SoC 분야에서 온 칩 버스는 전체 시스템의 성능을 결정하는 중요한 요소이다. 이에 따라 최근 ARM 사에서는 고성능 온 칩 버스 구조인 ML(Multi-Layer) AHB 버스를 제안하였다. ML AHB 버스는 저전력 임베디드 시스템에 적합한 버스 구조로써 현재 널리 사용되고 있다. 하지만, 고가이기 때문에 ADK(AMBA$^{TM}$ Design kit) 구매에 대한 부담이 적지 않다. 본 논문은 ML AHB의 버스 구조인 버스 매트릭스 구현 및 ADK에서 제공되지 않는 테스트 환경 즉, Protocol Checker 및 Performance Monitor Module 구현에 관한 것이다.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.45 no.4
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• pp.105-116
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• 2008

Today's System-on-a-Chip (SoC) is designed with reusable IP cores to meet short time-to-market requirements. However, the increasing cost of testing becomes a big burden in manufacturing a highly integrated SoC. In this paper, we propose an efficient test access mechanism that exploits an on/off-chip bus bridge for the Advanced High-performance Bus (AHB) and Peripheral Component Interconnect (PCI) bus. The test application time is considerably reduced by providing dedicated test stimuli input paths and response output paths, and by excluding the bus direction tumaround delays. Experimental results show that area overhead and testing times are considerably reduced in both functional and structural test modes. The proposed technique can be a lied to the other types of on/off-chip bus bridges.

• The Journal of Korea Institute of Information, Electronics, and Communication Technology
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• v.4 no.3
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• pp.209-216
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• 2011

Recently the design of SoCs(System-on-Chips) in which TCM is embedded for high speed operation increases rapidly. In this paper, a parallel test structure for eDRAM-based TCM embedded in SoCs is proposed. In the presented technique, the MUT (Memory Under Test) is changed to parallel structure and it increases testability of MUT with boundary scan chains. The eDRAM is designed in structure for parallel test so that it can be tested for each modules. Dynamic test can be performed based on input-output data. The proposed techniques are verified their performance by circuits simulation.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.48 no.9
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• pp.40-49
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• 2011

Integrating massive components and low-power policies have been actively investigated for system-on-chip designs. But in recent years, finding the optimal interconnection structure among heterogeneous components has emerged as a critical system design issue. Therefore, various simulation tools to model interconnection designs are being developed and performance evaluation of simulation is reflected in the real design. But most of the simulation environments employ traffic generation based on the mathematical probability functions, and such traffic generation cannot fully cover for various situations that may be occurred in the real system. Therefore, the demand for traffic pattern generation based on real applications is increasing. However, there have been few simulators that adopt application-specific traffic generators. This paper proposes a novel traffic generation method in simulating various interconnection structures for multi-processor system-on-chip design. The proposed traffic generation method can generate traffic patterns that can reflect the actual characteristics of the application and evaluate the performance of an interconnection structure under more realistic circumstance than traffic patterns using mathematical probability functions. By comparing the differences between the proposed method and the one based on mathematical probability functions, this paper shows advantages of the proposed traffic generation method.

• Journal of KIISE:Computer Systems and Theory
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• v.34 no.2
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• pp.84-92
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• 2007

This paper proposes an interconnect delay fault test (IDFT) solution on boards and SoCs based on IEEE 1149.1 and IEEE P1500. A new IDFT system clock rising edge generator which forces output boundary scan cells to update test data at the rising edge of system clock and input boundary scan cells to capture the test data at the next rising edge of the system clock is introduced. Using this proposed circuit, IDFT for interconnects synchronized to different system clocks in frequency can be achieved efficiently. Moreover, the proposed IDFT technique does not require any modification of the boundary scan cells or the standard TAP controller and simplifies the test procedure and reduces the area overhead.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.43 no.10 s.352
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• pp.104-110
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• 2006

The huge test data volume, test time and power consumption are major problems in system-on-a-chip testing. To tackle those problems, we propose a new test data compression technique. Initially, don't-cares in a pre-computed test cube set are assigned to reduce the test power consumption, and then, the fully specified low-power test data is transformed to improve compression efficiency by neighboring bit-wise exclusive-or (NB-XOR) scheme. Finally, the transformed test set is compressed to reduce both the test equipment storage requirements and test application time.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.45 no.2
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• pp.61-68
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• 2008

This paper introduces an embedded core test wrapper for AMBA based System-on-Chip(SoC) test. The proposed test wrapper is compatible with IEEE 1500 and can be controlled by ARM Test Interface Controller(TIC). We use IEEE 1500 wrapper boundary registers as temporal registers to load test results as well as test patterns and apply a modified scan test procedure. Test time is reduced by simultaneously performing primary input insertion and primary output observation as well as scan-in and scan-out.

• Journal of Digital Contents Society
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• v.9 no.3
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• pp.471-481
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• 2008

Test scheduling considering power dissipation is an effective technique to reduce the testing time of complex SoCs and to enhance fault coverage under limitation of allowed maximum power dissipation. In this paper, a modeling technique of test resources and a test scheduling algorithm for efficient test procedures are proposed and confirmed. For test resources modeling, two methods are described. One is to use the maximum point and next maximum point of power dissipation in test resources, the other one is to model test resources by partitioning of them. A novel heuristic test scheduling algorithm, using the extended-tree-growing-graph for generation of maximum embedded cores usable simultaneously by using relations between test resources and cores and power-dissipation-changing-graph for power optimization, is presented and compared with conventional algorithms to verify its efficiency.