• 기계와재료
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• v.23 no.2
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• pp.36-47
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• 2011

반도체적 성질을 가지는 유기 전자 재료를 활성층으로 활용한 유기 박막 트랜지스터(OTFT)는 제작 공정이 간단하고 비용이 저렴하다는 장점과 더불어 유기 반도체 자체가 가지는 가공성, 유연성 등으로 인해 유연한(flexible) 전자기기를 구현 할 수 있다는 가능성으로 미래형 전자기기의 핵심 구동 소자로서 많은 관심을 받고 있다. 특히 한 소자에서 p-type과 n-type이 동시에 구현되는 양극성(abipolar) OTFT는 구동 회로의 설계 및 제작 공정을 단순화 시키고 다양한 가능을 부가 시킬 수 있어 좀 더 경량화, 소형화된 미래형 전자 기기를 구현 할 수 있도록 해준다. 본 논문에서는 이러한 ambipolar OTFT의 구조 및 구동 원리를 알아보고 소자에 사용되는 유기 반도체 소재와 소자 구현 기술에 대하여 살펴보고자 한다.

• Proceedings of the Korean Institute of Surface Engineering Conference
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• 2016.11a
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• pp.108-108
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• 2016

마그네트론 스퍼터링은 박막의 증착에 널리 사용되는 기술로 음극의 설계가 핵심적이다. 영구 자석과 전자석을 겸용하는 경우도 있고 고주파 코일을 추가하여 2차 플라즈마 발생을 유도하여 공정의 유연성을 한층 높인 방법도 오랫동안 사용되어 왔다. 전자의 자기장 하에서의 운동은 Lorentz force를 적분하여 예측할 수 있으며 가장 중요한 전자 - 중성간의 충돌 과정인 탄성 충돌, 여기 충돌, 이온화 충돌을 고려하면 보다 실질적인 마그네트론 플라즈마의 거동을 이해하고 그 결과를 기반으로 자석 배치를 설계할 수 있다. PIC (particle-in-cell) code를 이용하면 플라즈마 내의 전자기장 효과를 상세히 검증해볼 수 있지만 계산 시간의 부담 때문에 고성능 병렬 컴퓨터를 사용하여야 한다. 그 이유는 하전입자(전자, 이온)의 공간적인 분포에 변화가 발생하면 전위가 영향을 받고 전자의 가속이 발생하는 쉬스(sheath)의 두께가 따라서 변화하기 때문이다. 여기서 계산 시간의 단축을 위한 가정, 즉, 쉬스의 두께가 일정하다는 사실을 적용하면 계산시간을 획기적으로 단축 시킬 수 있으며 병렬 계산의 효율성도 향상시킬 수 있다. 본 연구에서는 이와 같은 원리에 입각한 코드를 개발하고 평판 디스플레이용 사각형 음극에 대해서 적용했던 경험을 바탕으로 원형의 스캔형 마그네트론 음극 구조의 이해와 설계에 적용하고자 코드를 개발하였다.

• Journal of the Korean Institute of Telematics and Electronics
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• v.24 no.3
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• pp.445-452
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• 1987

In this paper, a model for characteristics in the AlxGa1-xAs layer of MODFET's is presented. The characteristics of conduction band in the AlxGa1-xAs layer is analyzed with the Fermi-Dirac statistics. And using the conduction band energy which is calculated with the numerical calculation method (false-Positon method), the variations of the electric-field distribution, the ionized donor concentration, and the two-dimensional electron gas density with gate voltage are calculated, respectively. The channel formation process for the parasitic MESFET operation in the MOD structure is also analyzed, and the characteristics in the AlxGa1-xAs layer is analytically modeled. The throretical results describe well the general characteristics in the MOD structure.

• Journal of the Korean Ceramic Society
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• v.34 no.1
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• pp.23-30
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• 1997

Semiconductive SrTiO3 ceramic bodies were prepared by conventional ceramic powder processes in-cluding sintering in a reducing atmosphere. Sodium or potassium ions were diffused from the surface of the sintered bodies into the inner region using thermal diffusion process at 800-120$0^{\circ}C$. The effects of such ther-mal treatments on the electrical and chemical characteristics of the grain boundaries were investigated. The presence of sodium or potassium ions at grain boundaries produces non-linear current-voltage behaviors, electrical boundary potential barriers of 0.1-0.2eV, and threshold voltages of 10-70V. The diffused ions form diffusion layers with thicknesses of 20-50nm near the grain boundaries, reducing the concentration of strontium and oxygen.

• Journal of the Korea Institute of Military Science and Technology
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• v.2 no.1
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• pp.183-193
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• 1999

Semiconducting (Sr0.85Ca0.15)TiO3 ceramics were prepared by conventional powder synthesis techniques, and then alkaline metallic cations were diffused into the ceramic bodies. The threshold voltage of the ceramics increases with increasing diffusion time and the amount of diffused materials. The ceramics had boundary potential heights of 0.01 ~ 2.89 eV, while their boundary resistance ranged from 2.2 $M{\Omega}$ to 120.4 $M{\Omega}$. Such electrical characteristics of the boundaries were correlated with the boundary structure of the ceramics obtained by transmission electron microscopy.

• Journal of the Semiconductor & Display Technology
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• v.20 no.3
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• pp.71-76
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• 2021

Digital decimation filters are used in various digital signal processing systems using ADCs, including digital communication systems and sensor network systems. When the sampling rate of digital data is reduced, aliasing occurs. So, an anti-aliasing filter is necessary to suppress aliasing before down-sampling the data. Since the anti-aliasing filter has to have a sharp transition band between the passband and the stopband, the order of the filter is very high. However, as the order of the filter increases, the complexity and area of the filter increase, and more power is consumed. Therefore, in this paper, we propose two types of decimation filters, focusing on reducing the area of the hardware. In both cases, the complexity of the circuit is reduced by applying the required down-sampling rate in two times instead of at once. In addition, CIC decimation filters without a multiplier are used as the decimation filter of the first stage. The second stage is implemented using a CIC filter and a down sampler with an anti-aliasing filter, respectively. It is designed with Verilog-HDL and its function and implementation are validated using ModelSim and Quartus, respectively.

• Transactions on Semiconductor Engineering
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• v.2 no.3
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• pp.19-26
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• 2024

Semiconductors are considered as one of the essential technologies in modern electronic devices and systems. Thus, it is required to predict and propose the semiconductor technology development roadmap. This study describes the key semiconductor technology issues, research and development trends, and their future roadmap, in the four areas such as the semiconductor device More-Moore integration technology, system-specific application processor technology, artificial intelligence/machine learning (AI/ML) processor technology, and outside system connectivity via optical and wireless communication.

• Proceedings of the KIEE Conference
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• 2005.10b
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• pp.430-432
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• 2005

저에너지 중성자가 가톨리늄(Gd) 막에 입사되면 중성자 포획과정에서 전환전자가 생성된다. 이 전환전자에 의해 pMOSFET $SiO_2$ 산화층에서 발생된 전자-전공쌍이 발생되고, 이 가운데 정공은 산화층 내부에 쉽게 붙잡혀(Trap) 양전하 센터로 작용하게 된다. 이 축적된 전하는 pMOSFET의 문턱전압(Threshold voltage)을 변화시킨다. 본 연구에서는 이러한 간접측정 원리를 이용하여 열중성자를 실기간 탐지할 수 있는 반도체형 탐지소자를 개발하고 하나로(HANARO) 방사선장에서의 시험을 통해 성능을 검증하였다. 그리고 감도관련 변수의 최적화를 통하여 작업자가 사용 가능한 범위의 고감도 열중성자 선량계로 개선 제작하였다. 개발된 선량계는 소형으로 실시간 열중성자 측정이 가능하며 감마방사선으로부터 독립적으로 열중성자를 측정할 수 있는 장점도 지니고 있다.

• Journal of the Korean Institute of Telematics and Electronics T
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• v.36T no.1
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• pp.19-24
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• 1999

$In_2O_3$-based thick films for the ozone detection of ppb range have been investigated. The $In_2O_3$ sensing layer is quite sensitive to ozone, but the saturated stable sensitivity cannot be obtained at the ozone exposure of 100 ppb for 5 min. The addition of $Fe_2O_3$ into $In_2O_3$ indicates some improvement in response time and sensitivity, but it seems the improvement is not good enough for real applications. Firing of $In_2O_3$:$Fe_2O_3$ powder induces remarkable improvement in response and recovery, although the sensitivity decrease. The sensing layer fired at $1300^{\circ}C$ and operated $550^{\circ}C$ shows excellent properties of fast response time, saturated stable sensitivity and rapid recovery characteristics to 100 ppb ozone exposure for 5 min. Especially, it shows the reproducibility of the sensor signal for repeated measurements and the linearity between the ozone concentration and the sensor resistance. The preliminary results clearly demonstrated that the sensor can be successfully applied for the ozone detection of ppb range.

• Journal of the Korea Academia-Industrial cooperation Society
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• v.13 no.6
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• pp.2472-2478
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• 2012

This research is aiming to develop Semiconductor equipment maintenance certification course to train qualified maintenance experts more effectively requested in related semiconductor industry. In the course of research, we adopted diverse research technique such as interview, on-spot investigation, documentary references to analyze current status of related training facilities, and forecast the population of test applicants. We analyzed similar certification course(Craftsman SMT, Industrial Engineer SMT, Craftsman Mechatronics, Industrial Enginee Mechatronics, et) as reference to set up job objectives and curriculum of semiconductor equipment maintenance certification. We conducted survey on expectations on newly created certificate, presented evaluation standard and objective of test, and preliminary writing test and demonstration test. Based on the result of various research, we were able to present training program for semiconductor equipment maintenance certification and set the assessment standard of qualification exam.