• 제목/요약/키워드: 결정 배향성

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Relative Timing of Shear Zone Formation and Granite Emplacement in the Yechon Shear Zone, Korea (예천(醴泉) 전단대(剪斷帶)의 생성(生成)과 화강암(花崗岩) 관입(貫入)의 상대적(相對的)인 시기(時期))

  • Chang, Tae Woo
    • Economic and Environmental Geology
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    • v.23 no.4
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    • pp.453-463
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    • 1990
  • The Yechon shear zone developed by strike-slip movement was formed in a relatively high temperature condition just after the Jurassic syntectonic granites had been emplaced during Daebo Orogeny. Post-emplacement formation of the shear zone is favored by continuity of foliations and lineations within and without the granites, development of mylonitic structures in the wallrocks, deformation of pegmatite and felsite dikes, and pretectonic growth of porphyroblasts in the wallrocks. A variety of shear sense indicators in the shear zone are predominantly observed in the intensely to extremely deformed rocks. They show that bulk non-coaxial detormation has occurred, and that the sense of shear is consistently dextral with S-C fabrics, grain shape fabrics, asymmetric porphyroclast systems, mica fish, asymmetric extension structures and quartz C-axis fabrics.

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Effects of Seed Layers on Formation of Barium Ferrite Thin Films and Their Magnetic Properties (씨앗층이 바륨훼라이트 박막의 형성과 자기적 성질에 미치는 영향)

  • 나종갑;이택동;박순자
    • Journal of the Korean Magnetics Society
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    • v.2 no.1
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    • pp.22-28
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    • 1992
  • Barium ferrite thin films were reactively deposited with Fe and BaO composite targets by a facing tergects sputtering unit. When thermally oxidized silicon wafers were used as substrates, minimum substrate heating of $750^{\circ}C$ was necessary for the perfect c-axis alignment in barium ferrite films. To lower the critical substrate temperature for the good c-axis alignment, such seed layers as ZnO, ${\alpha}-Fe_{2}O_{3}$ and ${\gamma}-Fe_{2}O_{3}$ were tested. The excellent c-axis algnment of BaM was obtained at a substrate temperature of $600^{\circ}C$ on ZnO seed layer whose (002) plane was parallel to the substrate surface. The magnetic properties of the BaM film showed saturation magnetization of 295 emu/cc, perpendicular coercivity of 1.7 kOe and squareness of 0.75. Optimum deposition rate of $230\;{\AA}/min$ was obtained with the composite target and this was 5 to 20 times higher than those of other investigators with oxide targets.

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Characteristics of Copper Film Fabricated by Pulsed Electrodeposition with Additives for ULSI Interconnection (펄스전착법과 첨가제를 사용하여 전착된 ULSI배선용 구리박막의 특성)

  • Lee Kyoung-Woo;Yang Sung-Hoon;Lee Seoghyeong;Shin Chang-Hee;Park Jong-Wan
    • Journal of the Korean Electrochemical Society
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    • v.2 no.4
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    • pp.237-241
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    • 1999
  • The characteristics of copper thin films and via hole filling capability were investigated by pulsed electrodeposition method. Especially, the effects of additives on the properties of copper thin films were studied. Copper films, which were deposited by pulsed electrodeposition using commercial additives, had low tensile stress value under 83.4 MPa and high preferred Cu (111) texture. Via holes with $0.25{\mu}m$ in diameter and 6 : 1 aspect ratio were successfully filled without any defects by superfilling. It was observed that copper microstructure deformed by twining. After heat treatment at $500^{\circ}C$ for 1 k in vacuum furnace, grain size was 1 or 2 times as large as film thickness and the bamboo structure was formed. Heat treated copper films showed good resistivities of $1.8\~2.0{\mu}{\Omega}{\cdot}cm$.

Structural, Optical and Electrical Properties of ZnO Thin Films with Zn Concentration (Zn 농도변화에 따른 ZnO 박막의 구조, 광학 및 전기적 특성 연구)

  • 한호철;김익주;태원필;김진규;심문식;서수정;김용성
    • Journal of the Korean Ceramic Society
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    • v.40 no.11
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    • pp.1113-1119
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    • 2003
  • We used isopropanol which has low boiling point to prepare thin films at low temperature and changed mole concentration of zinc acetate from 0.3 to 1.3 mol/l. The structural, optical and electrical properties of ZnO thin films with Zn content were investigated. ZnO thin films highly oriented along the c-axis were obtained at Zn concentration of 0.7 mol/l. ZnO thin films with Zn concentration of 0.7 mol/l showed a homogeneous surface layer of nano structure. The transmittance of ZnO thin films by UV-vis. measurement was about 87% under the Zn concentration of 0.7 mol/l, but rapidly decreased over the 1.0 mol/l. The optical band gap energy was obtained from 3.07 to 3.22 eV which is very close to the band gap of bulk ZnO (3.2 eV). The electrical resistivity of ZnO thin films was about 150 $\Omega$-cm that shows little difference with Zn concentration. I-V curves of ZnO thin films exhibited typical ohmic contact properties.

Fabrication and Characterization of Sn1-xSixO2 Anode for Lithium Secondary Battery by R.F. Magnetron Sputtering Method (R.F. Magnetron Sputtering을 이용한 리튬이차전지 부극용 Sn1-xSixO2의 제조 및 특성)

  • Lee, Sang-Heon;Park, Keun-Tae;Son, Young-Guk
    • Journal of the Korean Ceramic Society
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    • v.39 no.4
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    • pp.394-400
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    • 2002
  • Tin oxide thin films doped with silicon as anodes for lithium secondary battery were fabricated by R. F. magnetron sputtering technique. The electrochemical results for lithium secondary battery anodes showed that addition of silicon decreases the oxidic state of tin, and, hence, reduced the irreversible capacity during the first discharge/charge cycle. The (110),(101),(211) planes were grown with increasing substrate temperatures. The reversible capacity of thin films fabricated in conditions of $300^{\circ}C$ substrate temperature and 7:3 $Ar:O_2$ ratio was 700 mAh/g.

Development of Atomic Nitrogen Source Based on a Dielectric Barrier Discharge and Low Temperature Growth GaN (유전체장벽방전에 의한 질소함유 활성종의 개발 및 저온 GaN 박막 성장)

  • Kim, Joo-Sung;Byun, Dong-Jin;Kim, Jin-Sang;Kum, Dong-Wha
    • Korean Journal of Materials Research
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    • v.9 no.12
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    • pp.1216-1221
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    • 1999
  • GaN films were deposited on sapphire [$Al_2O_3(0001)$] substrates at relatively low temperature by MOCVD using N-atom source based on a Dielectric Barrier Discharged method. Ammonia gas($NH_3$is commonly used as an N-source to grow GaN films in conventional MOCVD process, and heating to high temperature is required to provide sufficient dissociation of $NH_3$. We used a dielectric barrier discharge method instead of $NH_3$ to grow GaN film relatively low temperature. DBD is a type of discharge, which have at least one dielectric material as a barrier between electrode. DBD is a type of controlled microarc that can be operated at relatively high gas pressure. Crystallinity and surface morphology depend on growth temperature and buffer layer growth. With the DBD-MOCVD method, wurtzite GaN which is dominated by the (0001) reflection was successfully grown on sapphire substrate even at $700^{\circ}C$.

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Sol-gel Derived-highly Transparent c-axis Oriented ZnO Thin Films (졸-겔법에 의한 c-축 배향성을 가진 고투과율 ZnO 박막의 제조)

  • Lee, Young-Hwan;Jeong, Ju-Hyun;Jeon, Young-Sun;Hwang, Kyu-Seog
    • Journal of Korean Ophthalmic Optics Society
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    • v.13 no.1
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    • pp.71-76
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    • 2008
  • Purpose: A simple and efficient method to prepare nanocrystalline ZnO thin film with pure strong UV emission on soda-lime-silica glass substrates by low-temperature annealing was improved. Methods: Crystal structural, surface morphological, and optical characteristics of nanocrystalline ZnO thin films deposited on soda-lime-silica glass substrates by prefiring final annealing process at 300$^{\circ}C$ were investigated by using X-ray diffraction analysis, field emission-scanning electron microscope, scanning probe microscope, ultraviolet-visible-near infrared spectrophotometer, and photoluminescence. Results: Highly c-axis-oriented ZnO films were obtained by prefiring at 300$^{\circ}C$. A high transmittance in the visible spectra range and clear absorption edge in the ultra violet range of the film was observed. The PL spectrum of ZnO thin film with a deep near band edge emission was observed while the defect-related broad green emission was nearly quenched. Conclusions: Our work will be possibly adopted to cheaply and easily fabricate ZnO-based optoelectronic devices at low temperature, below 300$^{\circ}C$, in the future.

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Growth and electro-optical characteristics of CdSe/GaAs epilayers prepared by electron beam epitaxy (전자빔 증착법에 의한 CdSe/GaAs epilayer의 성장과 그 전기-광학적 특성)

  • Yang, D.I.;Shin, Y.J.;Lee, C.H.;Choi, Y.D.;Yu, P.R.
    • Journal of the Korean Crystal Growth and Crystal Technology
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    • v.7 no.1
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    • pp.70-75
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    • 1997
  • An improved technique based upon an electron beam evaporation system has been developed to prepare cubic thin films In crystalline semiconductors. Zinc blonde CdSe epilayers were grown on GaAs(100) substrate by an e-beam evaporation method. The lattice parameter obtained from (400) reflection is $6.077\AA$, which is in excellent agreement with the value reported in the literature for zinc blonde CdSe. The orientation of the as-grown CdSe epilayer is determined by electron channeling patterns. The crystallinity of epitaxial CdSe layers were investigated on the double crystal X-ray rocking curve. The carrier concentration and mobility of epilayers deduced by Hall effect measurement are about $10^{18}{\textrm}{cm}^{-3}$, $10^2\textrm{cm}^2/V{\cdot}sec$ at room temperature, respectively. The photocurrent spectrum peak of the epilayer at 30 K exhibits a sharp change at 1.746 eV due to the free exciton of cubic CdSe.

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RF magnetron sputtering법으로 형성된 ZnO 박막의 RF 파워 및 공정 압력이 미치는 영향

  • Kim, Jong-Uk;Hwang, Chang-Su;Kim, Hong-Bae
    • Proceedings of the Korean Vacuum Society Conference
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    • 2010.02a
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    • pp.181-181
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    • 2010
  • RF magnetron sputtering을 이용하여 RF power 및 공정 압력에 따라 ZnO 박막을 유리기판 위에 제작하고 구조적, 광학적, 전기적 특성을 조사하였다. 박막 증착 조건의 초기 압력은 $1.0{\times}10^{-6}\;Torr$, 증착온도는 상온으로 고정하였으며 기판은 Corning 1737 유리 기판을 사용하였다. 공정 변수로 RF파워는 25W, 50W, 75W, 100W로 변화시키고, 증착 압력은 20m, 100m, 200m 300mTorr로 변화시켰다. 유리기판 위에 증착된 모든 ZnO 박막에서 (002) 면의 우선배향성이 관찰되었고 RF power가 50 W와 75W 에서 좋은 결정성을 나타내었다. 공정조건별로 제작된 모든 ZnO박막에서 85% 이상의 투과율을 나타내었으며, 증착압력이 증가함에 따라 광학적인 밴드 갭이 증가하였다. Hall 측정 결과 모든 샘플에서 n타입 특성이 확인되으며, 75W와 300mTorr일 때 전기비저항 $3.56\;{\times}\;10^{+1}\;{\Omega}cm$, 전하의 농도 $2.8\;{\times}\;10^{17}cm^{-3}$, 이동도 $0.613\;cm^2V^{-1}s^{-1}$로 반도체 활성층으로 가장 적합한 전기적 특성을 얻었다. RF 파워가 증가하고, 증착압력이 증가할 수록 ZnO 박막 특성이 좋아지는 경향성을 확인하였다.

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Effects of Temperature and Current Density on the Characteristics of Electroplated Pd Films (온도 및 전류밀도 변화에 따른 Pd도금막 특성변화 연구)

  • Bae, In-Gyeong;Choe, Gwang-Jin;Kim, Ju-Hui;Kim, Yeong-Dae;Sim, Sang-Jun;U, Gyeong-Ja;Jo, Yeong-Sang
    • Korean Journal of Materials Research
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    • v.9 no.8
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    • pp.775-781
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    • 1999
  • Palladium thin films of uniform and highly dense microstructure were prepared by the eletroplating method using novel PdCl$_2$-based plating bath. Principal variables taken into account in this study were the plating temperature and the current density. Electroplated Pd films were characterized for Crystalline orientation, morphology and hardness. The optimal temperature and current density were found be $50^{\circ}C$ and 5mA/$\textrm{cm}^2$, repectively. The measured hardness value for the Pd films when prepared under the optimal condition was as high as 600kg/$\textrm{mm}^2$. A correlation study between variables and properties seems to indicate that the hardness was significantly affected by the microstructure, but not by crystallite orientation.

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