• Title/Summary/Keyword: 가속도 스위치

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Accelerated Life Test for Door Switch of Refrigerator (냉장고 도어스위치의 가속수명시험)

  • Ryu Dong Su;Kim Sang Uk;Jang Young Kee;Moon Chul Hui
    • Journal of Applied Reliability
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    • v.5 no.2
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    • pp.273-287
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    • 2005
  • Accelerated life test models and procedure are developed to assess the reliability of Refrigerator door switch. The main function of door switch is to operate bulb lamp and fan motor in the refrigerating room. The accelerated life test method and test equipments are developed using the relationship between stresses and life characteristics of the products. Using the developed accelerated life test method, the parameters of the ALT model and life time distribution are estimated and the reliability of the Door S/W at use condition if assessed. The proposed accelerated life test method and procedure may be extended and applied to testing similar kinds of products to reduce test time and costs of the tests remarkably.

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Case Study of Intermittent Poor Acceleration Fault Diagnosis by Brake Switch Fault (브레이크 스위치 결함에 의한 간헐적인 가속불량 현상의 고장진단 사례연구)

  • Kim, Sung Mo;Jo, Haeng Deug
    • Journal of the Korean Society of Manufacturing Technology Engineers
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    • v.24 no.2
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    • pp.203-210
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    • 2015
  • This paper investigates the failure of a car with a 2.5-liter CRDi engine of the Hyundai Company. The failure is caused by intermittent poor acceleration while driving. To analyze the cause, we investigated the air intake volume, the fuel injection, and the air-fuel ratio, which were determined to be normal. The brake switch signal error was discovered while analyzing the function that limits the output of the engine. While investigating the cause, we discovered the corrosion of the pins on the connector of the brake switch. We determined that it was generated by soapy water flowing in the solar film. Therefore, the cause of the failure was the brake switch signal errors. Additionally, we determined that ECM was the normal fail-safe mode that implemented the override device for safety during normal acceleration. Based on these results, further solar film experiments must be conducted to fully elucidate the causes.

Implementation of a QoS routing path control based on KREONET OpenFlow Network Test-bed (KREONET OpenFlow 네트워크 테스트베드 기반의 QoS 라우팅 경로 제어 구현)

  • Kim, Seung-Ju;Min, Seok-Hong;Kim, Byung-Chul;Lee, Jae-Yong;Hong, Won-Taek
    • Journal of the Institute of Electronics Engineers of Korea TC
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    • v.48 no.9
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    • pp.35-46
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    • 2011
  • Future Internet should support more efficient mobility management, flexible traffic engineering and various emerging new services. So, lots of traffic engineering techniques have been suggested and developed, but it's impossible to apply them on the current running commercial Internet. To overcome this problem, OpenFlow protocol was proposed as a technique to control network equipments using network controller with various networking applications. It is a software defined network, so researchers can verify their own traffic engineering techniques by applying them on the controller. In addition, for high-speed packet processing in the OpenFlow network, programmable NetFPGA card with four 1G-interfaces and commercial Procurve OpenFlow switches can be used. In this paper, we implement an OpenFlow test-bed using hardware-accelerated NetFPGA cards and Procurve switches on the KREONET, and implement CSPF (Constraint-based Shortest Path First) algorithm, which is one of popular QoS routing algorithms, and apply it on the large-scale testbed to verify performance and efficiency of multimedia traffic engineering scheme in Future Internet.

A 12b 1kS/s 65uA 0.35um CMOS Algorithmic ADC for Sensor Interface in Ubiquitous Environments (유비쿼터스 환경에서의 센서 인터페이스를 위한 12비트 1kS/s 65uA 0.35um CMOS 알고리즈믹 A/D 변환기)

  • Lee, Myung-Hwan;Kim, Yong-Woo;Lee, Seung-Hoon
    • Journal of the Institute of Electronics Engineers of Korea SD
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    • v.45 no.3
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    • pp.69-76
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    • 2008
  • This work proposes a 12b 1kS/s 65uA 0.35um CMOS algorithmic ADC for sensor interface applications such as accelerometers and gyro sensors requiring high resolution, ultra-low power, and small size simultaneously. The proposed ADC is based on an algorithmic architecture with recycling techniques to optimize sampling rate, resolution, chip area, and power consumption. Two versions of ADCs are fabricated with a conventional open-loop sampling scheme and a closed-loop sampling scheme to investigate the effects of offset and 1/f noise during dynamic operation. Switched bias power-reduction techniques and bias circuit sharing reduce the power consumption of amplifiers in the SHA and MDAC. The current and voltage references are implemented on chip with optional of-chip voltage references for low-power SoC applications. The prototype ADC in a 0.35um 2P4M CMOS technology demonstrates a measured DNL and INL within 0.78LSB and 2.24LSB, and shows a maximum SNDR and SFDR of 60dB and 70dB in versionl, and 63dB and 75dB in version2 at 1kS/s. The versionl and version2 ADCs with an active die area of $0.78mm^2$ and $0.81mm^2$ consume 0.163mW and 0.176mW at 1kS/s and 2.5V, respectively.

Space Qualification of MMICs for COMS Communications Transponder (통신해양기상위성 통신 중계기용 MMIC의 우주인증)

  • Jang, Dong-Pil;Yeom, In-Bok;O, Seung-Yeop
    • Journal of Satellite, Information and Communications
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    • v.1 no.2
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    • pp.56-62
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    • 2006
  • This paper describes the MMIC product qualification of the Ka band satellite transponder for the COMS(Communication, Ocean and Meteorological Satellite). Ka-band active equipment for the COMS communications transponder are being developed by using 12 kinds of MMICs which include low noise amplifiers, medium power amplifiers, frequency mixers, frequency multipliers, RF switch, and HEMT attenuator MMIC, Those MMICs had been fabricated at the MMIC production foundry of northrop Grumman Space Technology (Velocium) which is qualified for space application, and experienced in various space programs during past decades. For the MMIC product qualification, Visual inspection and SEM inspection had been performed, and burn-in test for 240 hours and accelerated life-test for 1000 hours had been done on test fixtures of individual MMIC products at $125^{\circ}C$. Additionally, infrared temperature scanning and finite element simulation were performed to analyze and confirm the channel temperature of semiconductor devices on several representatives of those MMIC products that os one of the most important factors in performance degradation and life reduction.

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A study on the control law of Automatic Rudder Trim System for turbo prop aircraft (터보 프롭 항공기 자동러더트림장치 제어법칙에 관한 연구)

  • 박완기;이광현;김병수
    • Journal of the Korea Institute of Military Science and Technology
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    • v.2 no.1
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    • pp.121-131
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    • 1999
  • Automatic Rudder Trim System(ARTS) is a device to reduce the pilot's work load for rudder trimming greatly required in varying abruptly aircraft's engine power. This paper represents a technical analysis and a design of control law of the ARTS. The control law of the ARTS is designed based on the analysis of aircraft's characteristics, system's requirements, and limitations. The control law is comprised of open loop control using the rudder trim map for a specific aircraft and closed loop control to compensate the error of the open loop control system. flight test results show that the ARTS can reduce pilot's work load for rudder trimming dramatically and can compensate the aircraft's transient yaw motion.

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