• Journal of the Korean Chemical Society
• /
• v.40 no.8
• /
• pp.557-564
• /
• 1996

FAB CAD MS/MS(Fast Atom Bombardment Collision Activated Dissociation Mass Spectrometry/Mass Spectrometry) was used to study different degree of bond stability according to the linkage positions of alkali cationized $(Na^+, Li^+, K^+, NH_4^+)$ stereoisomeric and synthetic oligosaccharides. The alkali metal cations were much more stable, requiring over -40 eV of collision energy vs. only -10 eV for the protonated forms. Of the cations, the potassium cationized trisaccharides were more stable than the others. They would not yield fragment ions under the conditions of collision available in triple quadrupole. Other cationized species exhibited decreasing stability in the series $Nap^+>Li^+>NH_4^+$ using 0.8 mTorr argon pressure in the collision cell. Metal cations of the oligosaccharides maintained charge principally on the amino sugar as shown by shift of all the fragment ions containing the amino sugar. The reason for the higher stability of the metal cationized form is the formation of crown ether-like bond around metal cations, N-acetyl group on GlcNAc and oxygens on fucose moiety. Depending on the metal sizes and the conformation of linkage-isomeric region, cationized species gave linkage dependent fragment patterns and exhibited stability in the series 1-6 > 1-4 > 1-3 linkage.

• Journal of the Korean Institute of Telematics and Electronics
• /
• v.25 no.1
• /
• pp.27-32
• /
• 1988

Electron Spectroscopy for Chemical Analysis(ESCA) allowes the determination of the elemental composition and the bonding state of the surface atomes in the interface between two materials. In the binding energies of ESCA spectrum, there are zero error, voltage scaling error and random error. Accurate analysis of the intensity energy response functions and accurate calibration of the energy scale are essential to use X-ray photoelectron spectron meter. At the results of the calibration of the ESCA spectra in the copper and cordierite (Mg2Al4Si5kO18) interfaces, the errors relative to the copper are -3.03 eV for the zero error -z,-197 ppm for the voltage scaling error -V and 6.9 meV for the random error -R. The method of the calibration is able to apply for the binding energy calibration of the another ESCA spectra.

• Journal of the Korean Crystal Growth and Crystal Technology
• /
• v.24 no.5
• /
• pp.202-206
• /
• 2014

In order to investigate the photoluminescence (PL) properties of $V_2O_5$ films, amorphous and crystalline films were prepared by using RF sputtering system, and the PL spectra of the films were measured at the temperatures ranging from 300 K to 10 K. In the amorphous $V_2O_5$ film grown at room temperature, a PL peak centered at ~505 nm was only observed, and in the crystalline $V_2O_5$ film, two peaks centered at ~505 nm and ~695 nm, which is known to correspond to oxygen defects, were revealed. The position of PL peak centered at 505 nm for both the amorphous and crystalline $V_2O_5$ films showed a strong dependence on temperature, and the positions were 2.45 eV at 300 K and 2.35 eV at 10 K, respectively. The PL at 505 nm was due to the band energy transition in $V_2O_5$, and also, the reduction of the peak position energy with decreasing temperature was caused by a decrement of the lattice dilatation effect with reducing electron-phonon interaction.

• Journal of Sensor Science and Technology
• /
• v.11 no.5
• /
• pp.301-308
• /
• 2002

BaFBr:$Eu^{2+}$ phosphors were prepared, and the thermoluminescence(TL) and photostimulated luminescence(PSL) of the prepared phosphors were measured. Two glow peaks around 352 and 448 K are observed for x-ray irradiated BaFBr:$Eu^{2+}$ phosphors, and the activation energy of the main glow peak(352 K) was about 0.96 eV. The spectral range of the PSL was $350{\sim}450\;nm$, and the activation energy of the trap giving rise to PSL was about 0.98 eV. The activation energy of the traps giving rise to TL is agreed to those giving rise to PSL within experimental error.

• Journal of the Korean Vacuum Society
• /
• v.6 no.4
• /
• pp.337-342
• /
• 1997

We have investigated Mossbauer effect and emission properties of the Fe-doped GaAs grown by liquid phase epitaxy (LPE). The powder type of isotope $^{57}Fe$ was used as a dopant source in LPE-GaAs. From the analysis of Mossbauer effect the value of isomer shift, 0.303$\pm$0.018 mm/sec, is calculated at low temperature. This means that charge state of Fe ion in GaAs is 3+. The results of double crystal x-ray rocking curve (DCRC) and low temperature photoluminescence (PL) show the crystal quality of the epitaxial layers are good. Unusual luminescence peaks from the Fe-GaAs epitaxial layers appeared at emission energy of 0.99 eV and 1.15 eV. We attribute these emissions to Fe-acceptor related two deep radiative centers.

• Korean Journal of Materials Research
• /
• v.8 no.7
• /
• pp.591-595
• /
• 1998

In this work, the freestanding GaN single crystalline substrates without cracks were grown by hydride vapor phase epitaxy (HVPE) and its some properties were investigated. The GaN substrate, having a current maximum size of 350 $\mu\textrm{m}$-thickness and 100$\textrm{mm}^2$ area, were obtained by HVPE growth of thick film GaN on sapphire substrate and subsequent mechanical removal of the sapphire substrate. A lattice constant of $C_o$= 5.18486 $\AA$ and a FWHM of DCXRD was 650 arcsec for the single crystalline GaN substrate. The low temperature PL spectrum consist of three excitonic emission and a deep D- A pair recombination at 1.8eV. The Raman E, (high) mode frequency was 567$cm^{-1}$ which was the same as that of strain free bulk single crystals. The Hall mobility and carrier concentration was 283$cm^3$<\ulcornerTEX>/ V.sand 1.1$\times$$10^{18}cm^{-3}$, respectively.

• Korean Journal of Materials Research
• /
• v.8 no.3
• /
• pp.229-237
• /
• 1998

We grew the hexagonal GaN films on (100) Si and (00.1) sapphire substrates in the temperature range of $300~730^{\circ}C$ by the direct reaction between thermally ionized N-source and thermally evaporated Ga-source. The GaN growth rates are increased at the initial stage of GaN formation and it was saturated to some values by the coalescence of each crystallites. The oxygen signal was observed in XPS spectra for all the GaN films grown in this work, especially low- temperature grown GaN film may due to incorporation of the residual oxygen in the growth chamber. The surface of low-temperature and shorter time grown films covered only Ga-droplets. however, with increasing the both substrate temperature and the growth time GaN is growth to crystallites. and coalescence to ring-type crystallites. With sufficient supply of N-source, they were changed to platelets. In the PL spectrum measured at 20 K, we observed the impurity related emission at 3.32eV and 3.38eV.

• Proceedings of the Korean Vacuum Society Conference
• /
• 2014.02a
• /
• pp.243.2-243.2
• /
• 2014

기존의 저압 플라즈마에 비해 여러 장점을 가지는 중간압력 플라즈마 및 대기압 플라즈마는 수년전부터 많은 관심을 받고 있으며 다양한 응용분야에서 활발히 이용되고 있다. 기초과학으로서의 플라즈마 측면뿐만 아니라 플라즈마 응용의 결과들은 플라즈마의 특성에 따라 좌우되므로 플라즈마 진단 역시 최근 플라즈마 연구에 중요한 부분을 차지하고 있다. 일반적으로 플라즈마 내의 모든 화학적 반응 및 물리적 반응에 있어 전자가 결정적인 역할을 하기 때문에 플라즈마 내의 전자의 정보를 대표하는 지표인 전자온도($n_e$) 및 전자밀도($T_e$)의 측정이 중요하다. 본 연구에서는 대기압 플라즈마에서 중성원자와 전자의 상호작용에 의한 연속 방출광을 자외선-가시광 영역에서 측정하고, 이를 기반으로 $n_e$ 및 $T_e$를 측정하였다. 높은 압력에서 불완전 전리된 플라즈마는 이온화율이 낮고 중성원자의 밀도가 이온밀도보다 훨씬 높기 때문에 중성 제동복사(Neutral bremsstrahlung)의 방사도를 이용한 ne 및 Te의 측정이 가능하다. 특히 아르곤 대기압 플라즈마에서 측정된 연속 방출광 스펙트럼의 자외선 영역(280~450 nm)에서는 중성 제동복사에 의한 연속 방출광뿐만 아니라 수소분자에 의한 dissociative 연속 방출광이 함께 존재하는 것이 확인되어 최종적으로 두 연속 방출광을 고려하여 정확한 ne 및 Te를 측정할 수 있었다. 대기압 아르곤 축전결합방전에서 입력전력에 따라 전자온도는 2.5 eV로 유지되었으며, 전자밀도는 $(0.7-1.1){\times}10^{12}cm^{-3}$ 범위에서 $j_d{\propto}n_e{\propto}P_{rf}$ 관계를 따르며 변화하는 것이 관찰되었다.

• Applied Chemistry for Engineering
• /
• v.19 no.3
• /
• pp.299-303
• /
• 2008

A thermally cross-linkable polymer, poly[(2,5-dimethoxy-1,4-phenylenevinylene)-alt-(1,4-phenylenevinylene)] (Cross-PPV), was synthesized by the Heck coupling reaction. In order for the polymer to be cross-linkable, 20 mol% excess divinylbenzene was added. The chemical structure of Cross-PPV and thermally crosslinked Cross-PPV were confirmed by FT-IR spectroscopy. From the FT-IR, UV-Vis, and PL spectral data, thermally crosslinked Cross-PPV was insoluble in common organic solvents. The HOMO and LUMO energy level of thermally cross-linked Cross-PPV were estimated -5.11 and -2.56 eV, respectively, which were determined by the cyclic voltammetry and UV-Vis spectroscopy. From the energy level data, one can easily notice that thermally crosslinked Cross-PPV can be used for hole injection layer effectively. Bilayer structured device (ITO/crosslinked Cross-PPV/PM-PPV/Al) was fabricated using poly(1,4-phenylenevinylene-(4-dicyanomethylene-4H-pyran)-2,6-vinylene-1,4-phenylenevinylene-2,5-bis(dodecyloxy)-1,4-phenylenevinylene (PM-PPV) as the emitting layer, which have HOMO and LUMO energy levels of -5.44 eV and -3.48 eV, respectively. The bilayered device had much enhanced the maximum efficiency (0.024 cd/A) and luminescence ($45cd/m^2$) than those of a single layer device (ITO/PM-PPV/Al, 0.003 cd/A, $3cd/m^2$). The enhanced performance originated from that fact that cross-linked Cross-PPV facilitatse the hole injection to the emissive layer and the injected hole and electron from ITO and Al are recombined in emitting layer (PM-PPV) effectively.

• Journal of the Korean Crystal Growth and Crystal Technology
• /
• v.21 no.3
• /
• pp.99-104
• /
• 2011

A stoichiometric mixture of evaporating materials for $MgGa_2Se_4$ single crystal thin films was prepared from horizontal electric furnace. The crystal structure of these compounds has a rhombohedral structure with lattice constants $a_0=3.953\;{\AA}$, $c_0=38.890\;{\AA}$. To obtain the single crystal thin films, $MgGa_2Se_4$ mixed crystal was deposited on thoroughly etched semi-insulating GaAs(100) substrate by the Hot Wall Epitaxy (HWE) system. The source and substrate temperatures were $610^{\circ}C$ and $400^{\circ}C$, respectively. The crystalline structure of the single crystal thin films was investigated by the double crystal X-ray rocking curve and X-ray diffraction ${\omega}-2{\theta}$ scans. The carrier density and mobility of $MgGa_2Se_4$ single crystal thin films measured from Hall effect by van der Pauw method were $6.21{\times}10^{18}\;cm^{-3}$ and 248 $cm^2/v{\cdot}s$ at 293 K, respectively. The optical absorption of $MgGa_2Se_4$ single crystal thin films was investigated in the temperature range from 10 K to 293 K. The temperature dependence of the optical energy gap of the $MgGa_2Se_4$ obtained from the absorption spectra was well described by the Varshni's equation, $E_g(T)=E_g(0)-({\alpha}T^2/T+{\beta})$. The constants of Varshni's equation had the values of $E_g(0)=2.34\;eV$, ${\alpha}=8.81{\times}10^{-4}\;eV/K$ and ${\beta}=251\;K$, respectively.