• Title/Summary/Keyword: $TeO_2$

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2×2Ti:LiNbO3 Integrated Optical Add/Drop Multiplexers utilizing Strain-Optic Effect (스트레인광학효과를 이용한 2×2Ti:LiNbO3 삽입/분기 집적광학 멀티플렉서)

  • Jung, Hong-Sik;Choi, Yong-Wook
    • Korean Journal of Optics and Photonics
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    • v.17 no.5
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    • pp.430-436
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    • 2006
  • Polarization-independent $Ti:LiNbO_3\;2{\times}2$ optical add/drop multiplexer for the 1550nm wavelength region is fabricated. The device consists of two input waveguides, two polarization beam splitters. two polarization conversion/electrooptic tuning waveguide sections, and two output waveguides. The single mode channel waveguides for both TE and TM polarizations are fabricated on a x-cut $Ti:LiNbO_3$substrate by Ti diffusion. Spectral section is based on phase-matched polarization conversion due to shear strain induced by a thick $SiO_2$ grating overlay film. An applied voltage tunes the device by changing the waveguide birefringence, hence the optical wavelength at which most efficient polarization conversion occurs. Tuning rate of 0.094nm/V with a maximum range of 17nm has been obtained. The nearest side-lobe is about 8.2dB. The FWHM is 3.72nm.

A novel approach in voltage transient technique for the measurement of electron mobility and mobility-lifetime product in CdZnTe detectors

  • Yucel, H.;Birgul, O.;Uyar, E.;Cubukcu, S.
    • Nuclear Engineering and Technology
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    • v.51 no.3
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    • pp.731-737
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    • 2019
  • In this study, a new measurement method based on voltage transients in CdZnTe detectors response to low energy photon irradiations is applied to measure the electron mobility (${\mu}_e$) and electron mobility-lifetime product $({\mu}{\tau})_e$ in a CdZnTe detector. In the proposed method, the pulse rise times are derived from low energy photon response to 59.5 keV($^{241}Am$), 88 keV($^{109}Cd$) and 122 keV($^{57}Co$) ${\gamma}-rays$ for the irradiation of the cathode surface at each detector for different bias voltages. The electron $({\mu}{\tau})_e$ product was then determined by measuring the variation in the photopeak amplitude as a function of bias voltage at a given photon energy using a pulse-height analyzer. The $({\mu}{\tau})_e$ values were found to be $(9.6{\pm}1.4){\times}10^{-3}cm^2V^{-1}$ for $1000mm^3$, $(8.4{\pm}1.6){\times}10^{-3}cm^2V^{-1}$ for $1687.5mm^3$ and $(7.6{\pm}1.1){\times}10^{-3}cm^2V^{-1}$ for $2250mm^3$ CdZnTe detectors. Those results were then compared with the literature $({\mu}{\tau})_e$ values for CdZnTe detectors. The present results indicate that, the electron mobility ${\mu}_e$ and electron $({\mu}{\tau})_e$ values in CdZnTe detectors can be measured easily by applying voltage transients response to low energy photons, utilizing a fast signal acquisition and data reduction and evaluation.

Lithogeochemistry on the Dukum and Jeonjuil gold - silver deposits in Southern - western part of Korea (한국(韓國) 남서부(南西部)의 덕음(德蔭)과 전주(全州)-금은광상(金銀鑛床)에 대(對)한 암석지구화학적(岩石地球化學的) 연구(硏究))

  • Yoon, Chung Han;John, Yong Won;Chon, Hyo Taek
    • Economic and Environmental Geology
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    • v.21 no.4
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    • pp.389-400
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    • 1988
  • Minor elements such as Ag, As, Au, Bi, Cd, Cu, Co, Ni, Pb, Rb, Sb, Sr and Te were analyzed by atomic absorption spectrophotometry and induced coupled plasma spectrophotometry in order to investigate pathfinders for gold in quartz porphyry, granite porphyry and vein materials in Jeonjuil gold - silver mine, and in altered biotite granites and vein materials in Dukum gold - silver mine. In Dukum gold - silver mine, it is observed that Au contents have positive relation with As, Co, and Rb contents, but negative relation with Bi contents in altered biotite granites. Au contents have positive relation with Ag, As, Co and Te contents in vein materials. In Jeonjuil gold - silver mine, it is observed that Cd, Rb, Sr and Te are enriched near ore vein in quartz porphyry and granite porphyry. Au contents have positive relation with As, Cd, Cu, $Fe_2O_3$ and $K_2O$ in vein materials.

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The Preferred Orientation of CdSe and CdS Thin Films on the AlOx and SiO2 Templates (AlOx와 SiO2 형판위 CdSe와 CdS 박막의 우선방위(Preferred Orientation) 특성)

  • Lee, Young-Gun;Chang, Ki-Seog
    • Journal of the Korea Institute of Military Science and Technology
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    • v.15 no.4
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    • pp.502-506
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    • 2012
  • In order to find the structural characteristics of the thin films of group II-VI semiconductor compounds compared with those of powder materials, films were made of 4 powders of ZnS, CdS, CdSe, and CdTe(Aldrich), each with 99.99 % purity. For the ZnS/CdS multi-layers, the ZnS layer was coated over the CdS layer on an $AlO_x$ membrane, which served as a protective layer within a vacuum at the average speed of 1 ${\AA}$/sec. After studying the structures of the group II-VI semiconductor thin films by using X-ray spectroscopy, we found that the ZnS, ZnS/CdS, CdS, and CdSe films were hexagonal and exhibited some degree of preferred orientation. Also, the particles of the thin films of II-VI semiconductor compounds proved to be more homogeneous in size compared to those of the powder materials. These results were further verified through scanning electron microscopy(SEM), EDX analysis, and powder and thin film X-ray diffraction.

Laser Damage Threshold Increase of A/R Coating Films for 200MHz AOM (A/R 코팅 변화에 따른 200MHz AOM의 laser damage threshold 증가)

  • Kim, Yong-Hun;Lee, Hang-Hun;Lee, Jin-Ho;Park, Yeong-Jun;Park, Jeong-Ho
    • Korean Journal of Materials Research
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    • v.7 no.3
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    • pp.213-217
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    • 1997
  • AOhf(Hcousto-r)l)tic niodulator) with :!OOlIiz freclucncl- and Sfi(;(Seconrl harmonic generation) green lasel-Lvith 53% nm wavelength were used for Il\'IIII~Dii.it,ii v~ilco disk recorder) FOI rhe appli~aptin of high densit]. optical recording, a high po\ver I ~ c r is r c ~ ~ l i ~ i l - u l ic I !tic. s\-sti,m a n d optic.,~I io;iting l,t)c>rs of each optical device must have a high laser damage threshoid hie rn;itie ant] retlwtive coatings on a $TeO_{2}$ singlc crystal. which is used as an acoustooptic material, by E-beam evaporation method. Laser damage threshold \vas nicdsureci hy Ar laser with the input power oi 0.55LV 1,aser damage threiholti 01 $ZrO_{2}$ and $SiO_{2}$. filn-is were higher than $AI_{2}O_{3}$ f i l m U'e also investigated a long--tern1 stability of the output po\ver of St{(; green laser

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6FDA-p-TeMPD막의 투과특성에 미치는 UV처리의 영향

  • 임철수;남세종
    • Proceedings of the Membrane Society of Korea Conference
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    • 1997.04b
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    • pp.62-63
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    • 1997
  • Polyimide는 내열성과 기계적, 화학적 특성이 다른 고분자막에 비해 뛰어나며 선택도 또한 비교적 높기 때문에($\alpha$=3~7) 최근 많은 연구의 대상이 되고 있다. 그러나 소위 trade-off현상으로 알려진 바와 같이 선택도가 높은 고분자 재료는 투과계수가 낮은 단점을 가지고 있어서 (P${_O_2}$=0.1~122) 실용적인 막으로 사용되기 위해서는 이를 개선하는 연구가 필요하다. 본 연구에서는 polyimide 중 투과계수가 가장 큰 것으로 보고된 6FDA-p-TeMPD 막을 제조하여 여러 방법으로 UV처리를 하고 UV처리의 변수에 따른 막의 투과특성을 조사하여 가장 뛰어난 투과특성을 나타내는 최적조건을 찾고자 하였다.

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Effectiveness of parylene coating on CdZnTe surface after optimal passivation

  • B. Park;Y. Kim;J. Seo;K. Kim
    • Nuclear Engineering and Technology
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    • v.54 no.12
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    • pp.4693-4697
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    • 2022
  • Parylene coating was adopted on CdZnTe (CZT) detector as a mechanical protection layer after wet passivation with hydrogen peroxide (H2O2) and ammonium fluoride (NH4F). Wet chemical passivant lose their effectiveness when exposed to the ambient conditions for a long time. Parylene coating could protect the effectiveness of passivation, by mechanically blocking the exposure to the ambient conditions. Stability of CZT detector was tested with the measurement of leakage current density and response to radio-isotopes. When the enough thickness of parylene (>100 ㎛) is adopted, parylene is a promising protection layer thereby ensuring the performance and long-term stability of CZT detectors.

Microwave Dielectric Properties of Ti-Te system Ceramics for Triplexer Filter

  • Choi, Eui-Sun;Lee, Moon-Woo;Lee, Sang-Hyun;Kang, Gu-Hong;Kang, Gap-Sul;Lee, Young-Hie
    • Journal of Electrical Engineering and Technology
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    • v.6 no.2
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    • pp.263-269
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    • 2011
  • In this study, the compositions for the microwave dielectric materials were investigated to obtain the improved dielectric properties, the high temperature stability, and the sintering temperature of less than $900^{\circ}C$, which was necessary for cofiring with the internal conductor of silver. In addition, the dielectric sheets were prepared by the tape casting technique, after which the sheets were laminated and sintered. In this process, the optimum ratio of powder and binder, laminating pressure, temperature, and possibility for cofiring with the internal conductor were studied. Finally, multilayer chip treplexer filter for the 800-2,000 MHz range were fabricated, and the frequency characteristics of the triplexer filter were investigated. When the $0.6TiTe_3O_8-0.4MgTiO_3+3wt%SnO+7wt%H_3BO_3$ ceramics were sintered at $820^{\circ}C$ for 0.3 hours, the microwave dielectric properties of the dielectric constant of 29.91, quality factor of 33,000 GHz, and temperature coefficient of resonant frequency of -2.76 ppm/$^{\circ}C$ were obtained. Using the Advanced Design System (ADS) and High Frequency Structure Simulator (HFSS), the multilayer chip triplexer filter acting at the range of 800-2,000 MHz were simulated and manufactured. The manufactured triplexer filter had the excellent frequency properties in the CDAM800, GPS and PCS frequency regions, respectively.

Photonic Crystal Mirror with Ultra Wide-Band omnidirectional-photonic bandgap (초 광대역 옴니-광자 밴드 갭을 갖는 광자결정 미러)

  • Nam, Gi-Yeon;Cho, Sung-June;Lee, Hyun-Yong
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2005.07a
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    • pp.455-458
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    • 2005
  • 옴니(omnidirectional)-PBG(photonic bandgap)의 크기는 쌍을 이루는 광자결정 재료의 고유 굴절률, 충진율 및 두께에 의해 결정되는 것이 일반적이다. 그러나 광자결정체가 다중주기를 가지도록 제작하면 옴니-PBG의 크기를 변화 시킬 수 있다. 본 연구에서는 Si/$SiO_2$를 기본 구조로 하는 광대역 옴니-PBG용 광자결정 구조를 설계, 제작하고 그 특성을 평가 하였다. 각각 단일 주기 $\Lambda_1$(426.9nm) 및 $\Lambda_2$(306.9nm)를 갖는 8N-Si/$SiO_2$ 광자결정에 대해 TE/TM-편광광 $5^{\circ}$$45^{\circ}$ 입사각에 대한 반사-스펙트라 측정결과는 설계값과 일치하였다. 특히 이중주기 $(8N\cdot{\Lambda}_1+8N\cdot{\Lambda}_2)$를 갖도록 제작된 Si/$SiO_2$ 광자결정은 입사각 $5^{\circ}$의 TE-편광광 반사-스펙트라 측정결과, 약 1050-2500nm의 광대역 파장범위에서 광자 밴드 갭을 보였다.

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Preparasion and Characterization of Chalcogenide Glass with IR-Transmittance (적외 광투과 Chalcogenide계 유리의 제조 및 특성)

  • 송순모;최세영
    • Journal of the Korean Ceramic Society
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    • v.32 no.12
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    • pp.1424-1432
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    • 1995
  • Chalcogenide glasses having IR (8~12${\mu}{\textrm}{m}$) transmittance were prepared and their densities, thermal and mechanical properties, IR-transmittances and chemical durabilities were determined. Glass transition temperatures (Tg) of Ge-As-Se, Ge-As-Se-Te and Ge-SE-Te system glasses were in the range of 280~3$65^{\circ}C$, 210~236$^{\circ}C$ and 210~26$0^{\circ}C$, respectively. Crystallization temperature (Tc) of Ge-Se-Te system glass was in the range of 305~40$0^{\circ}C$. Their thermal expansion coefficients($\alpha$) were in the range of 11.7~15.2$\times$10-6/K, 15.4~16.0$\times$10-6/K and 17.4~27.8$\times$10-6/K, respectively. Their MOR, hardness and fracture toughness were in the range of 15.2~18.6MPa, 36.1~58.2Kg/$\textrm{mm}^2$, 1.0~1.3 MPa.mm1/2, 18.9~24.9 MPa, 40.9~65.1Kg/$\textrm{mm}^2$, 1.3~1.5 MPa.mm1/2, and 24.1~30.8 MPa, 40.9~86.0Kg/$\textrm{mm}^2$, 1.4~1.8 MPa.mm1/2, respectively. IR transmittance of Ge-Se-Te system glass was about 60%. Ge-O extrinsic absorption peaks at 8, 12 ${\mu}{\textrm}{m}$ were significantly eliminated by the addition of Mg. Chemical durabilities in deionizied water of Ge-Se-Te system glass were good and IR-transmittances decreased with leaching time and temperature.

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