• Korean Journal of Materials Research
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• v.14 no.11
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• pp.764-768
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• 2004

Perovskite Pb(Mn_{1/3}Sbu_{2/3})O_2-Pb(Zr,Ti)O_3\;(PMS-PZT) was prepared and ZnO doping effects on its piezoelectric properties were investigated. Pyrochlore phase was not identified in the PMS-PZT ceramics with $0\sim5\;mol\%$ ZnO sintered at $1100^{\circ}C$ for 2 hrs, and maximum sintered density of $7.92 g/cm^3$ was obtained. Piezoelectric charge constant and voltage constant increased to $359{\times}10^{-12}\;C/N\;and\;22.5{\times}10^{-13}\;Vm/N$, respectively, with increasing ZnO content. Mechanical quality factor reduced considerably with increasing ZnO content. When the ZnO content was 3 $mol\%$, electromechanical coupling factor and relative dielectric constant showed maximum values of $56\%$ and 1727, respectively. This should be evaluated by complicated variations of sintered density, tetragonality of lattice, grain size, and A-site vacancy generated by ZnO addition and $Zn^{2+}$ substitution.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2004.07b
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• pp.802-805
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• 2004

압전 액츄에이터는 다른 종류의 액츄에이터와 비교할 때 높은 강성, 빠른 응답성의 우수한 특성을 가지고 있다. 벤더형 액츄에이터는 높은 변위의 장점을 가지나 높은 전기장과 기계적 부하인가시에는 내부 응력이 증가하므로서 신뢰성이 감소한다는 단점을 가지고 있다. 이러한 단점을 보완하기 위하여 여러 방법으로 내부 응력을 줄이려는 시도가 있으며 그중 하나는 경사기능 소재나 경사기능 구조를 가지는 액츄에이터의 개발이다. 본 연구에서는 경사기능 특성을 모사한 액츄에이터 구조를 제작하고 그 특성을 조사하였다. 두 가지의 압전상수 d31= - 220 pC/N, d31 =- 100 pC/N를 가지는 세라믹층을 적층하여 벤더형 액츄에이터의 특성을 관찰하였다. 그 결과 두 종류의 세라믹층으로 적층한 액츄에이터가 한가지 특성의 세라믹으로 제작한 액츄에이터 보다 전압인가시 20%이상의 우수한 변위 특성을 나타내었다. 이러한 변화는 내부 응력의 감소에 기인한 것으로 예상된다.

• Proceedings of the Korea Association of Crystal Growth Conference
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• 1996.06b
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• pp.259-279
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• 1996

최근 정보·전자산업의 발전으로 고 신뢰성 전자재료에 대한 수요가 증대되고 있으며 이러한 첨단산업의 기반의 될 신소재 중 전자세라믹스가 차지하는 비중이 그 대부분을 차지하고 있으며 이에 대한 수요와 기대가 점점 커지고 있다. 이러한 전자세라믹스는 유전재료, 자성재료, 압전재료, 도전성 재료 등으로 나뉘게 된다. 어떠한 분류에 들어가든 그 조성은 금속의 산화물 형태가 일반적이며 미세한 분말의 성형체를 소결(sintering) 함으로써 최종제품으로 완성된다. 이러한 전잣라믹스가 최근 요구되는 고 신뢰성, 고 밀도화를 달성하기 위해선 원료 분말 제조단계부터 제어가 필요하다. 원료분말의 균일·균질성과 그 입도는 소결특성 뿐만아니라 전기적 특성에도 큰 영향을 미치기 때문이다. 세라믹스의 분말제조 방법 중 일반적으로 사용되는 방법으로는 고상 산화물을 혼합하여 하소(calcination)한 후 분쇄하는 '고상합성법'과 금속의 염 또는 alkoxide 용액을 이용하여 화학적으로 제조하는 '습식 화학적 합성법'이 있다. 고상합성법은 합성온도가 높고 기계적 분쇄와 혼합에 의존하므로 균일·균질성이 떨어지고 분말크기를 1㎛ 이하로 만들기 힘들다. 반면에 습식화학적 합성법은 기계적인 분쇄와 혼합에선 얻을 수 없는 원자 혹은 분자단위의 균일한 혼합과 submicron 이하의 미세한 분말을 얻을 수 있다. 따라서 이러한 습식 화학적 합성으로 얻은 분말을 사용하면 미세한 입자의 특성으로 인해 소결온도를 낮출 수 있으며 균일한 미세구조와 균질한 조성을 갖게되어 기계적·전기적 물성증진도 가져올 수 있게 된다. 습식 화학적 분말합성법은 전술하였듯이 alkoxide의 가수분해를 이용하는 sol-gel 법과 금속의 염(salt) 용액을 이용하여, 화학적으로 화합물 침전을 얻거나 또는 공침전물(coprecipitate) 형태의 분말을 얻는, 침전법으로 나뉠 수 있다. 침전법의 근본원리는 pH 및 pCO3 등에 따른 이온종의 용해도 차이를 이용하는 것으로써 각 이온종에 따른 solubility product(ksp)를 이용하여 설명된다. 본 연구에서는 침전법을 사용한 Ba-, Pb-계 전자세라믹스의 분말합성에 대한 이론적 고찰과 공정개발 및 실험을 통한 물성증진 효과에 대해 알아보았다. 본 실험상의 전자세라믹스 조성은 강유전체, 세라믹반도체, 압효과에 대해 알아보았다. 본 실험상의 전자세라믹스 조성은 강유전체, 세라믹 반도체, 압전재료로 널리 사용되는 BaTiO3, PZT(PbZrO3-PbTiO3)와 수직 자기기록매체로 큰 가능성이 있으며 hard ferrite로 널리쓰이는 Ba-feerite(BaFe12O19)로써 수산화물 형태의 침전에 대한 기구(mechanism)와 물성에 대해 살펴보았다. 이러한 침전법에 의한 분말합성 과정에는 소결체의 물성에 영향을 미치는 pH 조절제나 원료에서 혼입될 수 있는 Na+, K+, Cl-, SO4- 등의 제거(washing 혹은 filtering)가 필수적이다. 그러나 침전법에서 얻게 되는 분말은 매우 미세하여 colloid를 형성하게 되며, 이러한 colloid 상태의 미세한 침전입자가 filtering media에 끼이게 되어 견고하면서도 상당한 부피를 가지는 filter cake을 형성하기 때문에 filtering에 많은 시간과 다량의 filtering agent (본 실험의 경우엔 증류수)가 필요하게 된다. 따라서 이러한 문제점을 해결하기 위하여 colloid 상태의 침전물을 얼렸다 녹이는 freezing process를 개발, 적용하여 그 원리 및 효과, 그로인한 분말형태를 관찰하여 보았다.

• The Transactions of the Korean Institute of Electrical Engineers C
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• v.52 no.10
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• pp.458-463
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• 2003

In order to develope piezoelectric transformer for the ballast of fluorescent lamp, a new shape and electrode pattern of piezoelectric transformer has been investigated in this work. The composition of piezoelectric ceramics was 0.95Pb(Zr$_{0.51}$Ti$_{0.49}$)O$_3$+0.03Pb(Mn$_{1}$3/Nb$_{2}$3/)O$_3$+0.02Pb(Sb$_{1}$2/Nb$_{1}$2/)O$_3$. The sample prepared by this composition system showed the characteristics which has about 1200 of relative dielecric constant, 1100 of the mechanical quality factor, 0.53 of the electromechanical coupling coefficient, 320 pC/N of the piezoelectric constant d$_{33}$, 0.3 % of the dissipation factor. Diameter and thickness of disk-type piezoelectric transformer was 45 mm and 4 mm, respectively. The driving and generating electrode with their gap of 1mm were fabricated on the top surface. But the common electrode was fabricated on the whole bottom surface. The electrode surface ratio of driving and generating part on the top surface ranges from 1.4:1 to 3:1. We investigated the electrical characteristics with the variation of the electrode surface ratio of driving and generating part in the range of load resistance of 100 $\Omega$～70 k$\Omega$. The set-up voltage ratio of this piezoelectric transformer increases with increasing both the electrode surface of driving part and the load resistance. The set-up voltage ratio at no load resistance was more than 60 times. On the other hand, the efficiency decreases with increasing the electrode surface of driving part. In the case of the electrode surface of both 1.4:1 and 2:1, maximum efficiency showed above 97 % at load resistance of 2 k$\Omega$. However, in the case of the electrode surface of 3:1, maximum efficiency showed about 94 % at load resistance of 3 k$\Omega$.>.>.>.

• Proceedings of the KIEE Conference
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• 2000.07c
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• pp.1661-1663
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• 2000

This study was to measure the dielectric characteristics of 0.05Pb($Al_{0.5}Nb_{0.5}$)-0.95Pb($Zr_{0.52}Ti_{0.48})O_3$[PAN-PZT] system ceramics according to the variation of $Cr_{2}O_3$, $Fe_{2}O_3$ addition amount. 0.0$\sim$1.2[wt%] and according to sintering temperature after creating the specimens with a general sintering way. The results of this study were summarized as follows : the dielectric constant at 20[$^{\circ}C$] reduced dy increasing additive on the whole. The dielectric loss was minimum value of 12.77[%], sintered at 1200[$^{\circ}C$], dopped with $Cr_{2}O_3$ 0.3[wt%] and minimum value of 10.89[%], sintered at 1200[$^{\circ}C$], dopped with $Fe_{2}O_3$ 0.6[wt%]. The variation rate of dielectric constant according to the change of frequency was decreased slowly by increasing frequency. The temperature coefficient of capacitance turned out increasing the stability of the temperature, decreased $Cr_{2}O_3$ 0.3wt% showed its minimum value 0.59[%/$^{\circ}C$], the maximum value 0.9[%/$^{\circ}C$] with $Cr_{2}O_3$ 3wt%.

• Proceedings of the KIEE Conference
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• 2008.07a
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• pp.1244-1245
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• 2008

Recently, piezoelectric transformer is applied to wide fields. Multi layer piezoelectric transformer has the advantage of high step up ratio, electromechanical coupling coefficient(Kp) and mechanical quality factor(Qm), but is indicated of peeling-phenomenon of electrode, rising sintering temperature made price of costly electrode. So in this study, it discuss on method for fabrication of rosen type piezoelectric transformers. For the fabrication as rosen type piezoelectric transformers, synthesized the powder using 0.01Pb$(ni_{1/3}Nb_{2/3})O_3$ - 0.08Pb$(Mn_{1/3}Nb_{2/3})O_3$ - 0.91Pb$(Zr_{0506}Ti_{0496})O_3$ (abbreviated as PNN-PMN-PZT) ceramics. The density, microstructure, dielectric and piezoelectric properties as a function of sintering temperature were investigated. The results indicated that the optimized properties of ceramics were obtained at sintering temperature of 1200$^{\circ}C$, showed the value of $d_{33}$=273pC/N, $K_p$=0.60 $Q_m$=1585, ${\varepsilon}_r$=1454, density=7.917$g/cm^3$ and $tan{\delta}$=0.0064.

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
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• v.13 no.1
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• pp.60-65
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• 2000

The structural and electrical characteristics of PLZT thin films fabricated onto Pt/Ti/SiO\ulcorner/Si substrates by a pulsed laser deposition were investigated to develop the high dielectric thin films were fabricated with different energy density by pulsed laser deposition. This PLZT thin films of 5000 thickness were crystallized at 600 $^{\circ}C$, 200 mTorr O\ulcorner pressure for 2 J/$\textrm{cm}^2$ laser energy density, the arain structure was transformed from planar to columnar grain. It was clearly noted from the SEM observations that oxygen pressured laser powers affect microstructures of the PLZT thin films. 14/50/50 PLZT this film showed a maximum dielectric constant value of $\varepsilon$\ulcorner=1289.9. P-E hysteresis loop of 14/50/50 PLZT thin film was flim ferro-electric. Leakage current density of 14/50/50 PLZT thin film was 10\ulcorner A/$\textrm{cm}^2$.

• Transactions on Electrical and Electronic Materials
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• v.18 no.4
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• pp.181-184
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• 2017

Multilayer ceramics in which piezoelectric layers of $0.90Pb(Zr_{0.48}Ti_{0.52})O_3-0.05Pb(Mn_{1/3}Sb_{2/3})O_3-0.05Pb(Zn_{1/3}Nb_{2/3})O_3$ (0.90PZT-0.05PMS-0.05PZN) stack alternately with silver electrode layers were prepared by an advanced low-temperature co-fired ceramic (LTCC) method. The electrical properties and bonding strength of the multilayers were associated with the interface morphologies between the piezoelectric and silver-electrode layers. Usually, the inner silver electrodes are fabricated by sintering silver paste in multi-layer stacks. To improve the interface bonding strength, piezoelectric powders of 0.90PZT-0.05PMS-0.05PZN with an average particle size of $23{\mu}m$ were added to silver paste to form a gradient interface. SEM observation indicated clear interfaces in multilayer ceramics without powder addition. With the increase of piezoelectric powder addition in the silver paste, gradient interfaces were successfully obtained. The multilayer ceramics with gradient interfaces present greater bonding strength as well as excellent piezoelectric properties for 30~40 wt% of added powder. On the other hand, over addition greatly increased the resistance of the inner silver electrodes, leading to a piezoelectric behavior like that of bulk ceramics in multilayers.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2010.06a
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• pp.20-20
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• 2010

The effect of excimer laser annealing on the structural and dielectric behaviors of $PbZr_{0.52}Ti_{0.48}O_3$ (PZT) thin films has been investigated. The amorphous PZT thin films were prepared on Pt/Ti/$SiO_2$/Si substrates by a sol-gel method. The PZT precursor was prepared from lead acetate, zirconium acetylacetonate, and titanium isopropoxide. The starting materials were dissolved in n-propanol and 1,3-propanediol. After, the amorphous PZT thin films were laser-annealed (using KrF excimer laser) as a function of the laser energy density and the number of laser pulse. Structural properties of PZT thin films are characterized by using X-ray diffraction (XRD) and scanning electron microscopy (SEM). The dielectric characterization was done on a RT66A test system and a Agilent 4294A impedance analyzer. The PZT thin films show that excimer laser irradiation drastically improved the crystallization and dielectric properties of the PZT thin films, depending on the energy density and the pulse number.

• Bulletin of the Korean Chemical Society
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• v.18 no.1
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• pp.56-61
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• 1997

Lead zirconate titanate (PZT) thin fills were deposited onto the Pt/Ti/SiO2/Si substrate by the pulsed laser deposition with the second harmonic wavelength (532 nm) of Nd:YAG laser. In order to determine the optimum conditions for the film deposition, the phase of the films were investigated as functions of ambient oxygen pressure, substrate temperature, and laser fluence. Also the chemical composition analysis was conducted for the PZT films deposited under various ambient oxygen pressure. When the distance between substrate and bulk PZT target is set to 20 mm, the optimum conditions have been determined to be 3 torr of oxygen pressure, 1.5 J/cm2 of laser fluence, and 823-848(±10) K range of substrate temperature. At these conditions, perovskite phase PZT films were obtained on platinized silicon. The chemical composition of the films is very similar to that of PZT bulk target. The physical structure of the deposited films analyzed by scanning electron microscopy shows a columnar morphology perpendicular to the substrate surface. Capacitance-Voltage hysteresis loop measurements show also a typical characteristics of ferroelectric thin film. The dielectric constant is found to be 528 for the 0.48 μm thickness of PZT thin film.