• Title/Summary/Keyword: $E_{v2}$

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A Study on Deep Levels in Rapid Thermal Annealed PICTS Semi-Insulating InP(100) by PICTS (PICTS 방법에 의한 급속열처리시킨 반절연성 InP(100)에서 깊은준위에 관한 연구)

  • 김종수;김인수;이철욱;이정열;배인호
    • Electrical & Electronic Materials
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    • v.10 no.8
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    • pp.800-806
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    • 1997
  • The behavior of de levels in rapid thermal annealed Fe-doped semi-insulating InP(100) was studied by photoinduced current transient spectrocopy(PICTS). In bulk InP, T2(Ec-0.24 eV), T3(Ec-0.30 eV) and T5(Ec-0.62 eV) traps were observed. After annealing the T2 trap was annihilated at 20$0^{\circ}C$ and recreated at 35$0^{\circ}C$. T3 trap was not affected below 40$0^{\circ}C$. With increasing temperature the concentration of T5 trap reduced and it was annihilated at 30$0^{\circ}C$. However the T1(Ec-0.16 eV) and T4(Ec-0.42 eV) traps were began to appear at 40$0^{\circ}C$and these concentrations were increased with annealing temperature. The T1 and T4 traps seem to be related to the isolated phosphorus vacancy( $V_{p}$) and $V_{p}$-indium antisite( $V_{p}$- $P_{in}$ ) or $V_{p}$-indium interstitial( $V_{p}$-I $n_{I}$) respectiely.respectiely.

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Photoluminescence Properties of $TlGaS_2:Er^{3+}$ Single Crystal ($TlGaS_2:Er^{3+}$ 단결정의 Photoluminescence 특성 연구)

  • 송호준;윤상현;김화택
    • Journal of the Korean Vacuum Society
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    • v.2 no.3
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    • pp.299-303
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    • 1993
  • Erbium metal을 불순물로서 2mol% 첨가한 TlGaS2:Er3+ 단결정을 수평전기로에서 합성한 ingot를 사용하여 수직 Bridgman 방법으로 성장시켰다. 성장된 결정은 층상으로 이루어진 monoclinic 구조였으며, 10K에서 간접전이형 및 직접전이형 energy band gap은 각각 2.55eV, 2.57eV이었고, Er3+ 이온에 의한 두 개의 불순물 광흡수 peak가 524.9nm와 656.4nm에서 관측되었다. Themally stimulated current(TSC)를 측정하여 0.21eV와 0.38eV의 donor 준위와 0.71eV의 accptor 준위를 구하였다. 10K에서 측정된 photoluminescence(PL) spectrum에서는 632nm와 759nm에서 D-A pair에 의한 broad한 peak와 552, 559, 666, 813, 816, 827nm에서 Er3+ 이온에 의한 sharp한 peak들이 나타났다.

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Analysis of Electron Swarm Transport Coefficients by Collision Cross Section in Na-He Gas Mixtures (Na-He 혼합증기중에서 충돌단면적에 의한 전자군의 수송계수 해석)

  • 하성철;백수현
    • Electrical & Electronic Materials
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    • v.3 no.2
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    • pp.138-146
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    • 1990
  • 볼츠만 수송방정식에 관한 홀스타인의 식을 사용하여 온도는 273.deg.K, 상대전계의 세기가 1.leq.E/P..leq.30(V/cm Torr)인 때의 Na와 He 단일기체중을 통과하는 전자의 에너지분포함수와 수송계수를 계산하였다. 그리고 전자 이동속도의 결과치를 실험값과 비교하였으며 실험치와 계산치가 일치하도록 충돌단면적을 수정하여 계산에 적용하였다. 이러한 방법으로 Hesms 0.1[eV]-50[eV]까지 Na는 0.1[eV]-5[eV]까지의 에너지범위에서 결정된 운동량변환단면적의 값은 제한된 범위에서 Crompton 및 Nakamura의 값과 거의 일치하였다. 또한 이와 같이하여 계산된 Na와 He 단일기체의 충돌단면적을 이용하여 온도는 273.degK, 상대전계의 세기는 1.leq.E/P$_{o}$ .leq.30(V/cm Torr)의 범위에서 Na-He 혼합증기의 혼합비율을 He:Na는 99.5:0.5, 99:1, 9:1. 1:1로 변화시켜 특성에너지, 평균에너지, 전자이동속도, 전자에너지 분포함수를 게산하였다.

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Photoluminescence Characteristics of the Light-Emitting Chromophores Obtained from Organic-Inorganic Hybrid Silica Spheres

  • Park, Eun-Hye;Jeong, Chang-Gi;Kang, Kwang-Sun
    • Current Photovoltaic Research
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    • v.4 no.3
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    • pp.93-97
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    • 2016
  • Light-emitting chromophores have been separated from silica spheres modified the surface with 3-(trimethoxysilyl)propylmethacrylate (TMSPM). The photoluminescence characteristics of the chromophores were investigated with various excitation wavelengths. The TMSPM was attached to the surface of silica spheres at $75^{\circ}C$. Large number of round shaped particles of the TMSPM was on the surface of silica spheres after 3 h reaction. The TMPSM was completely covered on the surface of the spheres after 6 h reaction. The surface modified silica spheres were soaked into acetone and stored for 20 days at ambient condition. The solution color slowly changed from light yellow to deep yellow with the increase of the storing time. The FTIR absorption peaks at 3348, 2869, 2927, 1715, 1453/1377, 1296, and $1120cm^{-1}$ represent C-OH, $R-CH_3$, $R_2-CH_2$, -C=O, C-H, C=C-H, and Si-O-Si absorption, respectively. The FTIR absorption peak at $1715cm^{-1}$ representing the ester -C=O stretching vibration for silica spheres stored for 20 days was increased compared with the spheres without aging. The UV-visible absorption peaks were at 4.51 eV (275 nm) and 3.91 eV (317 nm). There were two luminescence peaks at 2.51 eV (495 nm) and 2.25 eV (550 nm). The emission at 2.51 eV was dominant peak when the excitation energy was higher than 2.58 eV, and emission at 2.25 eV became dominant peak when the excitation energy was lower than 2.58 eV.

NEIGHBORHOOD CONDITION AND FRACTIONAL f-FACTORS IN GRAPHS

  • Liu, Hongxia;Liu, Guizhen
    • Journal of applied mathematics & informatics
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    • v.27 no.5_6
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    • pp.1157-1163
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    • 2009
  • Let G be a graph with vertex set V(G) and let f be a nonnegative integer-valued function defined on V(G). A spanning subgraph F of G is called a fractional f-factor if $d^h_G$(x)=f(x) for all x $\in$ for all x $\in$ V (G), where $d^h_G$ (x) = ${\Sigma}_{e{\in}E_x}$ h(e) is the fractional degree of x $\in$ V(F) with $E_x$ = {e : e = xy $\in$ E|G|}. In this paper it is proved that if ${\delta}(G){\geq}{\frac{b^2(k-1)}{a}},\;n>\frac{(a+b)(k(a+b)-2)}{a}$ and $|N_G(x_1){\cup}N_G(x_2){\cup}{\cdots}{\cup}N_G(x_k)|{\geq}\frac{bn}{a+b}$ for any independent subset ${x_1,x_2,...,x_k}$ of V(G), then G has a fractional f-factor. Where k $\geq$ 2 be a positive integer not larger than the independence number of G, a and b are integers such that 1 $\leq$ a $\leq$ f(x) $\leq$ b for every x $\in$ V(G). Furthermore, we show that the result is best possible in some sense.

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Surface Defects States on a SiO2/Si Observed by REELS

  • Kim, Juhwan;Kim, Beomsik;Park, Soojeong;Park, Chanae;Denny, Yus Rama;Seo, Soonjoo;Chae, Hong Chol;Kang, Hee Jae
    • Proceedings of the Korean Vacuum Society Conference
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    • 2013.02a
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    • pp.271-271
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    • 2013
  • The defect states of a Ar-sputtered SiO2 surface on Si (001) were investigated using Auger electron spectroscopy (AES) and reflection electron energy loss spectroscopy (REELS). The REELS spectra at the primary electron energy of 500 eV showedthat three peaks at 2.5, 5.1, and 7.2 eV were found within the band gap after sputtering. These peaks do not appear at the primary electron energies of 1,000 and 1,500 eV, which means that the defect states are located at the extreme surface of a SiO2/Si thin film. According to the calculations, two peaks at 7.2 and 5.1 eV are related to neutral oxygen vacancies. However, the third peak at 2.5 eV has never been previously reported and the theories proposed that this defect state may be due to Si-Si bonding. Our Auger data showed that a peak for Si-Si bonding at 89 eV appears after Ar ion sputtering on the surface of the sample, which is consistent with the theoretical models.

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Optical and Optoelectric Properties of PbCdS Ternary Thin Films Deposited by CBD

  • Mohammed, Modaffer. A.;Mousa, Ali M.;Ponpon, J.P.
    • JSTS:Journal of Semiconductor Technology and Science
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    • v.9 no.2
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    • pp.117-123
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    • 2009
  • $Pb_{x}Cd_{1-x}S$ films are prepared in the composition range of 0.05${\leq}x{\leq}$0.25, using a chemical bath deposition growth technique under optimum conditions amide at realizing good photo response. The x-ray diffraction results show that the films are of PbS-CdS composite with individual CdS and PbS planes. The films exhibit two direct band gaps, 2.4 eV attributed to CdS, while the other varies continuously from 2.4 eV to 1.3 eV. The films surface morphology is smooth with crystallite, whose grain size increases with increasing mole fraction (x). The decrease in band gap with increase in lead concentration suggests inter-metallic compound of PbS (Eg=0.41 eV) with CdS (Eg=2.4 eV)

Effects on Properties of $V_2O_5$-added $TiO_2$ Ceramics ($V_2O_5$ 첨가가 $TiO_2$ 세라믹스의 물성에 미치는 효과)

  • You, Do-Hyun
    • Proceedings of the KIEE Conference
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    • 2007.11c
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    • pp.138-140
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    • 2007
  • $TiO_2-V_2O_5$ sol was fabricated using sol-gel method and $TiO_2-V_2O_5$ thin films were fabricated using dip-coating method. $V_2O_5$ sol was added 0.01mo1e, 0.03mo1e, 0.05mo1e into $TiO_2$ sol. Viscosity of sol increased fast from about 1,000 minutes and sol began gelation from about 10,000 minutes. As a results of crystalline properties, $V_2O_5$ peaks were not found despite of $V_2O_5$ addition. Endothermic reaction occurred due to evaporation of solvent and dissociation of OH at $80^{\circ}C$. Exothermic reaction occurred due to combustion and oxidation of solvent at $230^{\circ}C$, occurred to combustion and oxidation of alkyl group at $350^{\circ}C$. Thickness of thin films increased $0.1{\sim}0.25{\mu}m$ every a dipping.

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Low Temperature Sintering of (Bi1/2Na1/2)TiO3-SrTiO3 Ceramics and Their Ferroelectric and Piezoelectric Properties (BNT-ST 세라믹스의 저온 소결과 강유전 및 압전 특성)

  • Hyunhee Kwon;Ga Hui Hwang;Chae Il Cheon;Ki-Woong Chae
    • Journal of Sensor Science and Technology
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    • v.32 no.4
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    • pp.238-245
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    • 2023
  • 0.75(Bi1/2Na1/2)TiO3-0.25SrTiO3 (BNT-25ST) ceramics with high densities were successfully prepared at a sintering temperature of 1,000℃ by adding a mixture of 1 mol% CuO and 0.5 mol% Na2CO3 or 0.5 mol% CuO and 0.25 mol% Na2CO3. Double polarization-electric field (P-E) hysteresis curves and sprout-shaped bipolar strain-electric field (S-E) hysteresis curves with small negative strains were observed in the pristine and CuO-added BNT-25ST ceramics whereas the Na2CO3-added sample showed similar P-E and S-E curves to a typical ferroelectric. The pristine BNT-25ST ceramics showed an extremely large strain and a large-signal piezoelectric strain constant (d33*): 0.287 % at 80 kV/cm and 850 pm/V at 20 kV/cm. Similar values, 0.248 % at 80 kV/cm and 655 pm/V at 20 kV/cm, were obtained in the CuO-added sample. However, the pristine and CuO-added samples showed large hysteresis in unipolar S-E curves at an electric field of less than 20 kV/cm. The Na2CO3-added sample showed smaller values of the strain and d33* but displayed a linear change and small hysteresis in the unipolar S-E curve. The co-added sample with CuO and Na2CO3 displayed intermediate P-E and S-E hysteresis curves.

Polarographic Behavior of Cadmium (II) and Copper (II) Complexes of 1,5-Diphenylcarbohydrazide in Dimethylsulfoxide (디메틸술폭시드 속에서 1,5-디페닐카르보히드라지드의 카드뮴 (II) 및 구리 (II) 착물에 대한 폴라로그래피적 거동)

  • Chil-Nam Choe
    • Journal of the Korean Chemical Society
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    • v.30 no.1
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    • pp.51-56
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    • 1986
  • Polarographic behavior of cadmium(II) and copper (II) complexes of 1,5-diphenylcarbohydrazide in dimethylsulfoxide have been investigated by the DC polarography. The reduction processes are estimated as follows; Cd(II)${\cdot}$DPH Complex$\frac{e^-}{(E_{\frac{1}{2}}=-0.12V)}$${\to}$Cd(I)${\cdot}$DPH Complex. Cd(I)${\cdot}$DPH Complex$\frac{e^-}{(E_{\frac{1}{2}}=-0.74V)}$${\to}$Cd(Hg) + nDPH. Cu(II)${\cdot}$DPH Complex$\frac{e^-}{(E_{\frac{1}{2}}=-0.44V)}$${\to}$Cu(I)${\cdot}$DPH Complex. Cu(I)${\cdot}$DPH Complex$\frac{e^-}{(E_{\frac{1}{2}}=-0.84V)}$${\to}$Cu(Hg) + nDPH. The limiting currents of all reduction wave are irreversible. The number of ligand and the dissociation constant for Cu(I)${\cdot}$1.5-diphenylcarbohydrazide complex were found to be 2 and 5.12 ${\times}10^{-8}$, respectively. All reduction waves of complexes are irreversible. Based on the experimental results, the polarographic reductions of complexes in dimethylsulfoxide solution occurred in two one-electron steps.

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