• Title/Summary/Keyword: $Cd_{0.85}Zn_{0.15}Te$

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The Comparison of X-ray Response Characteristics of Vacuum Evaporated (진공증착된 CdTe와 $Cd_{0.85}Zn_{0.15}Te$ 필름의 X선 반응특성 비교)

  • Kang, S.S.;Choi, J.Y.;Cha, B.Y.;Moon, C.W.;Kim, J.H.;Nam, S.H.
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2002.07b
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    • pp.845-848
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    • 2002

  • The study of photoconductor materials is demanded for development for flat-panel digital x-ray Imager. In this paper, We investigated the feasibility of application as x-ray image sensor using Cd(Zn)Te compound with high stopping power on high radiation. These Cd(Zn)Te samples were fabricated by vacuum thermal evaporation method to large area deposition and investigated I-V measurement as applied voltage. The experimental results show that the additional injection Zn in CdTe film reduced the leakage current, for the $Cd_{0.85}Zn_{0.15}Te$ detector, the net charge had the highest value as $144.58pC/cm^2$ at 30 V.

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