The Comparison of X-ray Response Characteristics of Vacuum Evaporated

진공증착된 CdTe와 $Cd_{0.85}Zn_{0.15}Te$ 필름의 X선 반응특성 비교

  • Published : 2002.07.08

Abstract

The study of photoconductor materials is demanded for development for flat-panel digital x-ray Imager. In this paper, We investigated the feasibility of application as x-ray image sensor using Cd(Zn)Te compound with high stopping power on high radiation. These Cd(Zn)Te samples were fabricated by vacuum thermal evaporation method to large area deposition and investigated I-V measurement as applied voltage. The experimental results show that the additional injection Zn in CdTe film reduced the leakage current, for the $Cd_{0.85}Zn_{0.15}Te$ detector, the net charge had the highest value as $144.58pC/cm^2$ at 30 V.

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