• 제목/요약/키워드: $BiNbO_4$

검색결과 108건 처리시간 0.023초

RF 스퍼터링법에 의한 SBN 박막의 미세구조 특성

  • 김진사;송민종;최운식;박건호;조춘남;김충혁
    • 한국전기전자재료학회:학술대회논문집
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    • 한국전기전자재료학회 2010년도 춘계학술대회 논문집
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    • pp.6-6
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    • 2010
  • The $Sr_{0.7}Bi_{2.3}Nb_2O_9$(SBN) thin films are deposited on Pt-coated electrode (Pt/Ti/$SiO_2$/Si) using RF sputtering method at various deposition temperature. The crystallinity of SBN thin films were increased with increase of deposition temperature in the temperature range of 100~400[$^{\circ}C$]. The surface roughness of deposition temperature($300^{\circ}C$) showed about 4.33[nm]. The grain and crystallinity of SBN thin films were increased with the increase of annealing temperature.

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Structural and Electrical Properties of Bismuth Magnesium Niobate Thin Films deposited at Various Temperatures

  • Park, Jong-Hyun;Yoon, Soon-Gil
    • Transactions on Electrical and Electronic Materials
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    • 제8권4호
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    • pp.153-156
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    • 2007
  • Structural and electrical properties of the fully crystallized-bismuth magnesium niobate ($Bi_2Mg_{2/3}Nb_{4/3}O_7$, BMN) films with 15 mol% excess bismuth deposited on Pt bottom electrode by pulsed laser deposition are characterized for various deposition temperatures. The BMN films were crystallized with a monoclinic structure from $300^{\circ}C$ and the surface roughness slightly decreases with increasing deposition temperature. The capacitance density of the films increases with increasing deposition temperature and especially, films deposited at $400^{\circ}C$ exhibit a capacitance density of approximately $620nF/cm^2$. The crystallized BMN films with approximately 170 nm thickness exhibit breakdown strength above 600 kV/cm (${\leq}10V$) irrespective of deposition temperature and a leakage current density of approximately $2{\times}10^{-8}A/cm^2$ at 590kV/cm (at 10 V).

Effect of Low-Temperature Sintering on Electrical Properties and Aging Behavior of ZVMNBCD Varistor Ceramics

  • Nahm, Choon-Woo
    • 한국재료학회지
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    • 제30권10호
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    • pp.502-508
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    • 2020
  • This paper focuses on the electrical properties and stability against DC accelerated aging stress of ZnO-V2O5-MnO2-Nb2O5-Bi2O3-Co3O4-Dy2O3 (ZVMNBCD) varistor ceramics sintered at 850 - 925 ℃. With the increase of sintering temperature, the average grain size increases from 4.4 to 11.8 mm, and the density of the sintered pellets decreases from 5.53 to 5.40 g/㎤ due to the volatility of V2O5, which has a low melting point. The breakdown field abruptly decreases from 8016 to 1,715 V/cm with the increase of the sintering temperature. The maximum non-ohmic coefficient (59) is obtained when the sample is sintered at 875 ℃. The samples sintered at below 900 ℃ exhibit a relatively low leakage current, less than 60 mA/㎠. The apparent dielectric constant increases due to the increase of the average grain size with the increase of the sintering temperature. The change tendency of dissipation factor at 1 kHz according to the sintering temperature coincides with the tendency of the leakage current. In terms of stability, the samples sintered at 900 ℃ exhibit both high non-ohmic coefficient (45) and excellent stability, 0.8% in 𝚫EB/EB and -0.7 % in 𝚫α/α after application of DC accelerated aging stress (0.85 EB/85 ℃/24 h).

Transparent Capacitor of the $Bi_2Mg_{2/3}Nb_{4/3}O_7$(BMNO)-Bi Nanostructured Thin Films grown at Room Temperature

  • 송현아;나신혜;정현준;윤순길
    • 한국재료학회:학술대회논문집
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    • 한국재료학회 2011년도 추계학술발표대회
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    • pp.20.2-20.2
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    • 2011
  • BMNO dielectric materials with a pyrochlore structure have been chosen and they have quite high dielectric constants about 210 for the bulk material. In the case of thin films, 200-nm-thick BMNO films deposited at room temperature showed a low leakage current density of about $10^{-8}\;A/cm^2$ at 3 V and a dielectric constant of about 45 at 100 kHz. Because high dielectric constant BMNO thin films kept an amorphous phase at a high temperature above $900^{\circ}C$. High dielectric constant BMNO thin films grown at room temperature have many applications for flexible electronic devices. However, because the dielectric constant of the BMNO films deposited at room temperature is still low, percolative BMNO films (i.e., those were grown in a pure argon atmosphere) sandwiched between ultra-thin BMNO films grown in an oxygen and argon mixture have greater dielectric constants than standard BMNO films. However, they still showed a leakage problem at a high voltage application. Accordingly, a new nano-structure that uses BMNO was required to construct the films with a dielectric constant higher than that of its bulk material. The fundamental reason that the BMNO-Bi nano-composite films grown by RF-Sputtering deposition had a dielectric constant higher than that of the bulk material was addressed in the present study. Also we used the graphene as bottom electrode instead of the Cu bottom electrode. At first, we got the high leakage current density value relatively. but through this experiment, we could get improved leakage current density value.

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임베디드 커패시터의 응용을 위해 다양한 기판 위에 평가된 BMN 박막의 특성 (Characteristics of BMN Thin Films Deposited on Various Substrates for Embedded Capacitor Applications)

  • 안경찬;김혜원;안준구;윤순길
    • 한국전기전자재료학회논문지
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    • 제20권4호
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    • pp.342-347
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    • 2007
  • $Bi_6Mg_2Nb_4O_{21}(BMN)$ thin films were deposited at various substrates by sputtering system for embedded capacitor applications. BMN thin films deposited at room temperature are manufactured as MIM(Metal/Insulator/Metal) structures. Dielectric properties and leakage current density were investigated as a function of various substrates and thickness of BMN thin films. Leakage current density of BMN thin films deposited on CCL(Copper Clad Laminates) showed relatively high value ($1{\times}10^{-3}A/cm^2$) at an applied field of 300 kV/cm on substrates, possibly due to relatively high value of roughness(rms $50{\AA}$) of CCL substrates. 100 nm-thick BMN thin films deposited on Cu/Ti/Si substrates showed the capacitance density of $300 nF/cm^2$, a dielectric constant of 32, a dielectric loss of 2 % at 100 kHz and the leakage current density of $1{\times}10^{-6}A/cm^2$ at an applied field of 300 kV/cm. BMN capacitors are expected to be promising candidates as embedded capacitors for printed circuit board(PCB).

삼광광상의 모암변질과 원소분산 (Element Dispersion and Wallrock Alteration from Samgwang Deposit)

  • 유봉철;이길재;이종길;지윤경;이현구
    • 자원환경지질
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    • 제42권3호
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    • pp.177-193
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    • 2009
  • 삼광광상은 선캠브리아기 경기육괴의 화강편마암내에 발달된 단열대(NE, NW)를 따라 충진한 8개의 괴상맥으로 구성된 중열수 석영맥광상이다. 이 광상의 광화작용은 여러번의 단열작용에 의해 형성된 두시기의 석영+방해석시기(광화I시기)와 방해석시기(광화II시기)로 구성된다. 광화I시기의 열수작용에 의한 변질작용은 견운모화, 녹니석화, 탄산염화, 황철석화, 규화, 및 점토화작용등이 관찰되며 견운모대는 석영맥과 접촉한 부분에서 녹니석대는 석영맥으로부터 멀어짐에 따라 관찰된다. 견운모대의 모암변질광물은 대부분이 견운모 및 석영이며 일부 일라이트, 탄산염광물, 녹니석으로 구성된다. 녹니석대의 모암변질광물은 주로 녹니석, 석영과 소량 견운모, 탄산염광물 및 녹염석으로 구성된다. 견운모의 Fe/(Fe+Mg) 값은 0.45${\sim}$0.50(0.48$\pm$0.02)이며 백운모-펜자이트족에 해당되고 녹니석의 Fe/(Fe+Mg) 값은 0.74${\sim}$0.81(0.77$\pm$0.03)이고 대부분 브런스비자이트에 해당된다. 견운모와 녹니석에 대한 $Al_{IV}$-FE/(FE+Mg)의 다이어그램은 변질시 같은 광종의 견운모와 녹니석의 형성온도를 나타내는 지시자로써 유용하다. 이것은 계산된 녹니석 단종의 활동도가 $a3(Fe_5Al_2Si_3O_{10}(OH)_6$=0.0275${\sim}$0.0413, $a2(Mg_5Al_2Si_3O_{10}(OH)_6$=1.18E-10${\sim}$7.79E-7, $a1(Mg_6Si_4O_{10}(OH)_6$=4.92E-10${\sim}$9.29E-7로서 삼광광상의 녹니석은 iron-rich 녹니석으로 비교적 고온 (T>450$^{\circ}C$에서 모암과 평형상태에서 온도가 감소함에 따라 형성되었음을 알 수 있다. 모암변질시 ${\alpha}Na^+$, ${\alpha}K^+$, ${\alpha}Ca^{2+}$${\alpha}Mg^{2+}$는 각각 ${\alpha}Na^+$=0.0476($400^{\circ}C$), 0.0863($350^{\circ}C$), ${\alpha}K^+$=0.0154($400^{\circ}C$), 0.0231($350^{\circ}C$), ${\alpha}Ca^{2+}$=2.42E-11($400^{\circ}C$), 7.07E-10($350^{\circ}C$), ${\alpha}Mg^{2+}$=1.59E-12($400^{\circ}C$), 1.77E-11($350^{\circ}C$)이며 열수용액의 pH는 5.4${\sim}$6.4($400^{\circ}C$), 5.3${\sim}$5.7($350^{\circ}C$)로서 모암변질시 열수용액는 약산성이었음을 알 수 있다. 모암변질시 이득원소(부화원소)는 $TiO_2$, $Fe_2O_3(T)$,CaO, MnO, MgO, As, Ag, Cu, Zn, Ni, Co, W, V, Br, Cs, Rb, Sc, Bi, Nb, Sb, Se, Sn 및 Lu 등이며 특히 대부분의 광상에서 Ag, As, Zn, Sc, Sb, S,$CO_2$ 등의 원소가 현저하게 증가하므로 중열수 및 천열수 금-은광상의 탐사에 지시원소로서 활용될 수 있을 것이다.

IMT-2000용 초소헝 적층형 대역 통과 칩 필터 설계 및 제작 (Miniaturized Multilayer Band Pass Chip filter for IMT-2000)

  • 임혁;하종윤;심성훈;강종윤;최지원;최세영;오영제;김현재;윤석진
    • 한국세라믹학회지
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    • 제40권10호
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    • pp.961-966
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    • 2003
  • BiN $b_{0.975}$S $b_{0.025}$ $O_4$저온 동시 소결 세라믹 후막 및 적층 세라믹(Multi-Layer Ceramic, MLC) 공정 기술을 이용한 소형 마이크로파 필터를 설계 및 제작하였다. MLC 칩 대역 통과 필터(BPF)는 소형화와 낮은 가격이라는 장점을 가지고 있다. 제안된 필터는 stripline 공진기와 결합 캐패시터로 구성되며, IMT-2000용 단말기의 수신단 통과 대역에 적합하며 통과 대역 아래쪽 저지 대역에 감쇠극이 형성되도록 설계하였다. 상용 마이크로파 회로 및 구조 설계 tool를 이용하여 제안된 MLC칩 대역 통과 필터의 공진기 전자기적 결합량 변화 및 결합 캐패시턴스에 따른 필터의 주파수 특성, 특히 감쇠극의 위치 변화에 대해 살펴보았다. 제작된 MLC 칩 BPF의 주파수 특성은 시뮬레이션 결과와 매우 일치하였다.

상온분말분사공정을 이용한 고밀도 폴리머-세라믹 혼합 코팅층 제조 및 에너지 저장 특성 향상 (Fabrication of High Density BZN-PVDF Composite Film by Aerosol Deposition for High Energy Storage Properties)

  • 임지호;김진우;이승희;박춘길;류정호;최두현;정대용
    • 한국재료학회지
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    • 제29권3호
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    • pp.175-182
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    • 2019
  • This study examines paraelectric $Bi_{1.5}Zn_{1.0}Nb_{1.5}O_7$ (BZN), which has no hysteresis and high dielectric strength, for energy density capacitor applications. To increase the breakdown dielectric strength of the BZN film further, poly(vinylidene fluoride) BZN-PVDF composite film is fabricated by aerosol deposition. The volume ratio of each composition is calculated using dielectric constant of each composition, and we find that it was 12:88 vol% (BZN:PVDF). To modulate the structure and dielectric properties of the ferroelectric polymer PVDF, the composite film is heat-treated at $200^{\circ}C$ for 5 and 30 minutes following quenching. The amount of ${\alpha}-phase$ in the PVDF increases with an increasing annealing time, which in turn decreases the dielectric constant and dielectric loss. The breakdown dielectric strength of the BZN film increases by mixing PVDF. However, the breakdown field decreases with an increasing annealing time. The BZN-PVDF composite film has the energy density of $4.9J/cm^3$, which is larger than that of the pure BZN film of $3.6J/cm^3$.