• 센서학회지
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• 제16권3호
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• pp.240-245
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• 2007

AlN thin film for SAW filter application was deposited on (100) silicon, sapphire, $Si_{3}N_{4}$/Si, and $Al_{2}O_{3}$/Si substrates by reactive magnetron sputtering method, respectively. The structural characteristics were dependent on the structure of substrates. Scanning Electron Microscope (SEM), X-ray Diffraction (XRD) and Atomic Force Microscope (AFM) have been used to analyze structural properties and preferred orientation of AlN thin films. Preferred orientation and SAW characteristic of AlN were improved by insertion of $Al_{2}O_{3}$ buffer layer. Insertion loss of SAW devices using AlN/Si and AlN/$Al_{2}O_{3}$/Si were about 33.27 dB and 30.20 dB, respectively.

• 한국진공학회:학술대회논문집
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• 한국진공학회 2012년도 제42회 동계 정기 학술대회 초록집
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• pp.457-457
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• 2012

We presented plasma processing using a DC Arc Plasmatron for diamond deposition on Al2O3 ceramic substrates. Plasma surface treatments were conducted to improve deposition condition before processing for diamond deposition. The Al2O3 ceramic substrates deposited, $5{\times}15mm^2$, were investigated by Scanning Electron Microscopy (SEM), Fourier Transform Infrared Spectroscopy (FTIR) and X-ray Diffraction (XRD). Properties of diamond (111), (220) and (311) peaks were shown in XRD. We identified nanocrystalline diamond films on substrates. The results showed that deposition rate was approximately $2.2{\mu}m/h$ after plasma surface treatments. Comparing the above result with a common processing, deposition rate was improved. Also, the surface condition was improved more than a common processing for diamond deposition on Al2O3 ceramic substrates.

• Progress in Superconductivity
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• 제2권2호
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• pp.71-75
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• 2001

The effect of annealing step-edges of LaAlO$_3$ and MgO single crystal substrates on YBa$_2$Cu$_3$O$_{7}$ junction has been studied. The step-edge was fabricated by argon ion milling and was annealed at 105$0^{\circ}C$ in 1 attn oxygen pressure. We compared AFM image near step-edge of the substrates between before and after annealing process. And YBa$_2$Cu$_3$O$_{7}$ thin film was deposited on the step-edge by a standard pulsed laser deposition. The step-edge junctions were characterized by current-voltage curves at 77 K. The annealing of step-edges of MgO substrate improved the current-voltage characteristic of Josephson junction: double steps in the current-voltage characteristic disappeared. However the annealing for LaAlO$_3$ did not improve the junction property.rty.

• 청정기술
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• 제28권2호
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• pp.154-162
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• 2022

알루미늄 (Al) 금속을 전구체 및 구조체로 이용, 수열 반응을 통하여 Al@Al₂O₃와 Al@Ni-Al LDH (LDH = layered double hydroxide) 코어-쉘 복합 구조체를 합성하였다. 제조된 구조체의 형상, 조성, 결정 구조는 수용액에 존재하는 이온들에 의하여 크게 영향을 받았으며, 이를 활용하여 다양한 특성의 촉매 구조체 유도가 가능하였다. Al@Ni-Al LDH 코어-쉘 구조체의 환원을 통하여 Ni 나노 입자가 고정화된 Ni/Al@Al₂O₃ 촉매를 제조하였고, CO₂ 메탄화 반응에 적용하여 촉매의 특성을 평가하였다. Ni/Al@Al₂O₃ 촉매는 전통적 incipient wetness impregnation 방법에 의하여 제조된 Ni/Al₂O₃ 촉매에 비교하여 Ni 입자의 분산도와 균일성이 매우 높았으며 약 2 배 이상의 CO₂ 전환율로 높은 촉매적 활성과 더불어 구조의 안정성을 보여 주었다. 이러한 Ni/Al@Al₂O₃ 구조체 촉매의 우수한 특성은 Al 금속을 기반으로 한 새로운 개념의 촉매 구조체 설계와 합성 방법의 타당성을 보여준다.

• The Korean Journal of Ceramics
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• 제3권4호
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• pp.253-256
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• 1997

Epitaxially grown Pb(Zr, Ti)O$_3$thin films were prepared on LaAlO$_3$substrates by the dipping pyrolysis process using metal naphthenates as starting materials Homogeneous Pb-Zr-Ti solutions with toluene were spin-coated onto the substrates and pyrolyzed at 50$0^{\circ}C$ Highly oriented Pb(Zr, Ti)O$_3$films confirmed by X-ray diffraction $\theta$-2$\theta$ scans were obtained by heat-treated at 75$0^{\circ}C$ in air The X-ray pole-figure analysis and reciprocal-space mapping of the resulting 0.6$\mu\textrm{m}$ films showed that the thin films comprising the c-axis oriented tetragonal phase have an epitaxial relationship with the LaAlO$_3$substrates.

• 한국재료학회:학술대회논문집
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• 한국재료학회 2002년도 추계학술발표강연 및 논문개요집
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• pp.101-101
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• 2002

• 한국결정성장학회지
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• 제16권3호
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• pp.116-120
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• 2006

반도체 드라이 에처 시스템의 웨이퍼 정전기 척에 적용하기 위해 플라즈마 스프레이 방법으로 Al-60 계열 기판에 코팅한 $Al_2O_3$ 코팅 막의 특성을 조사하였다. 시편 뒷면에 냉각봉이 장착되었을 때와 없을 때, 용사거리와 분말공급량을 변형하면서 $Al_2O_3$ 막 코팅을 하여 시편을 제작 하였다. 시편 뒷면에 냉각봉이 없을 때는 크랙과 기공이 많이 발생하였다. 시편 뒷면에 냉각봉을 장착하고 분말공급량을 15g/min로 한 경우에 용사거리 60, 70, 80mm에 따른 $Al_2O_3$ 코팅에서는 크랙과 기공은 거의 찾아볼 수 없었다. 용사거리 변화에 따른 $Al_2O_3$ 막 코팅의 표면형태 변화는 없었다. 같은 공정조건에서 분말 공급량을 20g/min로 한 경우에도 크랙은 볼 수 없었으나 약간의 기공이 생겼고, 분말공급량을15g/min로 하였을 때 보다 작은 입자들이 많이 증착되었다. 시편 뒷면에 냉각봉이 없을 때가 시편 뒷면에 냉각봉이 장착된 경우에 비하여 증착 속도가 빨랐다.

• 한국재료학회지
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• 제16권4호
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• pp.218-224
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• 2006

RF sputtering process was applied to produce thin hydroxyapatite(HAp) films on Ti-6Al-4V alloy substrates. The effects of different heat treatment conditions on the hardness between HAp thin films and Ti-6Al-4V alloy substrates were studied. Before deposition, the Ti-6Al-4V alloy substrates were heat treated for 1h at $850^{\circ}C\;under\;3.0{\times}10^{-3}torr$, and after deposition, the HAp thin films were heat treated for 1h at $400^{\circ}C,\;600^{\circ}C\;and\;800^{\circ}C$ under the atmosphere, and analyzed FESEM-EDX, FTIR, XRD, nano-indentor, micro-vickers hardness, respectively. Experimental results represented that the surface defects of thin films decreased by relaxation of internal stress and control of substrate structure followed by heat treatment of substrates before the deposition, and the HAp thin films on the heat-treated substrates had higher hardness than none heattreated substrates before the deposition, and the hardness properties of HAp thin films and Ti-6Al-4V alloy substrates appeared independent behavior, and the hardness of HAp thin films decreased by formation of $VTiO_3(OH),\;{\theta}-Al_{0.32}V_2O_5,\;Al_{0.33}V_2O_5$.

• 한국전기전자재료학회논문지
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• 제22권8호
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• pp.641-644
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• 2009

We have studied on the microwave characteristics for the meander type inductors on the MgO substrates and $Al_2O_3$ substrates by employing 3-D high frequency simulation, respectively. Proper designs of meander type inductors were proposed and confirmed through the high frequency simulations, 5, 7, 9, 11, and 13 turns meander type inductors have been choose to analyze the electrical properties for the microwave passive component applications. The Al top electrodes have 282 nm length, 45 nm width, 100 nm thickness and 15 nm gap. The simulations were carried out from 50 MHz to 30 GHz, Frequency dependent inductances and quality factor were calculated by employing the equivalent circuit model of meander type inductors. The self resonances frequency of meander type inductor were shifted from high frequency to low frequency range as the number of the turn of inductors was increased. From the microwave simulations, the inductances and quality factors of meander type inductors were extracted through the scattering parameter.

• 한국전기전자재료학회논문지
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• 제19권10호
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• pp.923-929
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• 2006

Single crystalline ZnO films were successfully grown on R-plane sapphire substrates by plasma-assisted molecular beam epitaxy. Epitaxial relationship between the ZnO film and the R-plane sapphire was determined to be $[-1101]Al_2O_3{\parallel}[0001]ZnO,\;[11-20]Al_2O_2{\parallel}[-1100]ZnO$ based on the in-situ reflection high-energy electron diffraction analysis and confirmed again by high-resolution X-ray diffraction measurements. Grown (11-20) ZnO films surface showed mound-like morphology along the <0001>ZnO direction and the RMS roughness was about 4 nm for $2{\mu}m{\times}2{\mu}m$ area.