과제정보
Project supported by National Natural Science Foundation of China (Grant Nos. 11575138, 11835006, 11690040, and 11690043). We thank the engineers of the accelerator center at the CIAE.
참고문헌
- F. Wang, V.D. Agrawal, Single event upset: an embedded tutorial, in: 21st International Conference on VLSI Design, 2008.
- C. Peng, W. Chen, Y. Luo, F. Zhang, X. Tang, Z. Wang, L. Ding, X. Guo, Low-energy proton-induced single event effect in NAND flash memories, Nucl. Instrum. Methods Phys. Res. A. 969 (2020), 164064.
- M. Violante, C. Meinhardt, R. Reis, M.S. Reorda, A low-cost solution for deploying processor cores in harsh environments, IEEE Trans. Ind. Electron. 58 (2011) 2617-2626. https://doi.org/10.1109/TIE.2011.2134054
- T.S. Nidhin, A. Bhattacharyya, R.P. Behera, T. Jayanthi, K. Velusamy, Understanding radiation effects in SRAM-based field programmable gate arrays for implementing instrumentation and control systems of nuclear power plants, Nucl. Eng. Technol. 49 (2017) 1589-1599. https://doi.org/10.1016/j.net.2017.09.002
- H. Zheng, Y. Zhao, S. Yue, L. Fan, S. Du, M. Chen, C. Yu, The single-event effect evaluation technology for nano integrated circuits, J. Semiconductors 36 (2015), 115002.
- W. Yang, Y. Li, C. He, Fault injection and failure analysis on Xilinx 16 nm FinFET ultrascale MPSoC, Nucl. Eng. Technol. 54 (2022) 2031-2036. https://doi.org/10.1016/j.net.2021.12.022
- E. Simoen, M. Gaillardin, P. Paillet, R.A. Reed, R.D. Schrimpf, M.L. Alles, F. El-Mamouni, D.M. Fleetwood, A. Griffoni, Radiation effects in advanced multiple gate and silicon-on-insulator transistors, IEEE Trans. Nucl. Sci. 60 (2013) 1970-1991. https://doi.org/10.1109/TNS.2013.2255313
- D.Y.W. Lin, C.H.P. Wen, DAD-FF: hardening designs by delay-adjustable D-flip-flop for soft-error-rate reduction, IEEE Trans. Very Large Scale Integr. (VLSI) Syst. 28 (2020) 1030-1042. https://doi.org/10.1109/TVLSI.2019.2962080
- L.A. Tambara, P. Rech, E. Chielle, J. Tonfat, F.L. Kastensmidt, Analyzing the impact of radiation-induced failures in programmable SoCs, IEEE Trans. Nucl. Sci. 63 (2016) 2217-2224. https://doi.org/10.1109/TNS.2016.2522508
- L.A. Tambara, J. Tonfat, A. Santos, F.L. Kastensmidt, N.H. Medina, N. Added, V.A.P. Aguiar, F. Aguirre, M.A.G. Silveira, Analyzing reliability and performance trade-offs of HLS-based designs in SRAM-based FPGAs under soft errors, IEEE Trans. Nucl. Sci. 64 (2017) 874-881. https://doi.org/10.1109/TNS.2017.2648978
- M. Amrbar, F. Irom, S.M. Guertin, G.R. Allen, Heavy ion single event effects measurements of Xilinx Zynq-7000 FPGA, in: Proc. IEEE Radiat. Effects Data Workshop, REDW, Boston, MA, USA, 2015.
- A. Stoddard, A. Gruwell, P. Zabriskie, M. Wirthlin, High-speed PCAP configuration scrubbing on zynq-7000 all programmable SoCs, in: 2016 26th International Conference on Field Programmable Logic and Applications, FPL, Lausanne, Switzerland, 2016.
- F. Benevenuti, F. Libano, V. Pouget, F.L. Kastensmidt, P. Rech, Comparative analysis of inference errors in a neural network implemented in SRAM-based FPGA induced by neutron irradiation and fault injection methods, in: 31st Symposium on Integrated Circuits and Systems Design, SBCCI, Bento Goncalves, Brazil, 2018.
- O.O. Kibar, P. Mohan, P. Rech, K. Mai, Evaluating the impact of repetition, redundancy, scrubbing, and partitioning on 28-nm FPGA reliability through neutron testing, IEEE Trans. Nucl. Sci. 66 (2019) 248-254. https://doi.org/10.1109/TNS.2018.2885066
- X. Du, S. Liu, D. Luo, Y. Zhang, X. Du, C. He, X. Ren, W. Yang, Y. Yuan, Single event effects sensitivity of low energy proton in Xilinx Zynq-7010 system-on-chip, Microelectron. Reliab. 71 (2017) 65-70. https://doi.org/10.1016/j.microrel.2017.02.014
- X. Du, C. He, S. Liu, D. Luo, X. Du, W. Yang, Y. Li, Y. Fan, Analysis of sensitive blocks of soft errors in the Xilinx Zynq-7000 System-on-Chip, Nucl. Instrum. Methods Phys. Res. A. 940 (2019) 125-128. https://doi.org/10.1016/j.nima.2019.06.015
- X. Du, C. He, S. Liu, Y. Zhang, Y. Li, C. Xiong, P. Tan, Soft error evaluation and vulnerability analysis in Xilinx Zynq-7010 system-on-chip, Nucl. Instrum. Methods Phys. Res. A. 831 (2016) 344-348. https://doi.org/10.1016/j.nima.2016.04.046
- W. Yang, Q. Yin, Y. Li, G. Guo, Y. Li, C. He, Y. Zhang, F. Zhang, J. Han, Single-event effects induced by medium-energy protons in 28 nm system-on-chip, Nucl. Sci. Tech. 30 (2019) 151.
- W. Yang, Y. Li, Y. Li, Z. Hua, F. Xie, C. He, S. Wang, B. Zhou, Huan He, W. Khana, T. Liang, Atmospheric neutron single event effect test on Xilinx 28 nm system on chip at CSNS-BL09, Microelectron. Reliab. 99 (2019) 119-124. https://doi.org/10.1016/j.microrel.2019.05.004
- W. Yang, Y. Li, W. Zhang, Y. Guo, H. Zhao, J. Wei, Y. Li, C. He, K. Chen, G. Guo, B. Du, S. Luca, Electron inducing soft errors in 28 nm system-on-Chip, Radiat. Eff. Defects Solids 175 (2020) 745-754. https://doi.org/10.1080/10420150.2020.1759067
- W. Yang, X. Du, C. He, S. Shi, L. Cai, N. Hui, G. Guo, C. Huang, Microbeam heavy-ion single-event effect on Xilinx 28-nm system on chip, IEEE Trans. Nucl. Sci. 65 (2018) 545-549. https://doi.org/10.1109/TNS.2017.2776244
- W. Yang, X. Du, J. Guo, J. Wei, G. Du, C. He, W. Liu, S. Shen, C. Huang, Y. Li, Y. Fan, Preliminary single event effect distribution investigation on 28 nm SoC using heavy ion microbeam, Nucl. Instrum. Methods Phys. Res. B. 450 (2019) 323-326. https://doi.org/10.1016/j.nimb.2018.09.038
- ARM, Application Note Cortex-M33 Dual Core Lockstep, 2017.
- Xilinx, XAPP1079 (v1.0.1), Simple AMP: Bare-Metal System Running on Both Cortex-A9 Processors, 2014.
- A. Oliveira, G.S. Rodrigues, F.L. Kastensmidt, N. Added, E.L.A. Macchione, V.A.P. Aguiar, N.H. Medina, M.A.G. Silveira, Lockstep dual-core ARM A9: implementation and resilience analysis under heavy ion-induced soft errors, IEEE Trans. Nucl. Sci. 65 (2018) 1783-1790. https://doi.org/10.1109/TNS.2018.2852606
- Single Event Effects Mitigation Techniques Report, February 2016. DOT/FAA/TC-15/62.
- Xilinx, Inc., Zynq-7000 All Programmable SoC Technical Reference Manual, 2015. UG585(v1.10).
- DS190 (v1.11.1), Zynq-7000 SoC Data Sheet: Overview, July 2, 2018.
- F. Zhang, G. Guo, J. Liu, Q. Chen, Study on experimental ability of 100 MeV proton single event effect test facility in China institute of atomic energy, At. Energy Sci. Technol. 52 (2018) 2101-2105.
- J. Han, G. Guo, J. Liu, L. Sui, F. Kong, S. Xiao, Y. Qin, Y. Zhang, Design of 100-MeV proton beam spreading scheme with double-ring double scattering method, Acta Physica Sinica 68 (2019), 054104.
- A.B. de Oliveira, L.A. Tambara, F.L. Kastensmidt, Applying lockstep in dual-core ARM Cortex-A9 to mitigate radiation-induced soft errors, in: 2017 IEEE 8th Latin American Symposium on Circuits & Systems, LASCAS, Bariloche, Argentina, 2017.