반도체디스플레이기술학회지 (Journal of the Semiconductor & Display Technology)

한국반도체디스플레이기술학회 (The Korean Society Of Semiconductor & Display Technology)
권호 표지

Array Testing of TFT-LCD Panel with Integrated Gate Driver Circuits

  • Lee, Jonghwan (Department of System Semiconductor Engineering, Sangmyung University)
  • 투고 : 2020.09.01
  • 심사 : 2020.09.11
  • 발행 : 2020.09.30
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초록

A new method for array testing of TFT-CD panel with the integrated gate driver circuits is presented. As larger size/high resolution TFT-LCD with the peripheral driver circuits has emerged, one of the important problems for manufacturing is array testing on the panel. This paper describes the technology of detecting defective arrays and optimizing the array testing process. For the effective characterization of pixel array, the pixel storage capability is simulated and measured with voltage imaging system. This technology permits full functional testing during the manufacturing process, enabling fabrication of large TFT-LCD panels with the integrated driver circuits.

키워드

참고문헌

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