Fig. 2. Raman spectra B-DLC thin films.
Fig. 3. XPS result of B-DLC film (#4 sample).
Fig. 4. Schematic diagram of a laser micromachining system and Galvano scanner.
Fig. 5. Graph of single pulse ablation threshold on B-DLC on the wafer at 1030 nm, 300 fs.
Fig. 6. Graph of single pulse ablation threshold on B-DLC on the wafer at 343 nm, 300 fs.
Fig. 7. Optical microscope images of DLC.(a) Non boron doped DLC, (b) Boron doped B-DLC (#3 sample).
Fig. 8. Optical microscope images of #1 sample.
Fig. 9. Optical microscope images of #3 sample.
Table 1. B-DLC deposition conditions
Table 2. Peak position of G peaks and I(D)/I(G) ratio as B-DLC samples
Table 3. Absorption of B-DLC film on boron ratio
Table 4. Single pulse ablation threshold of B-DLC on the Si wafer
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