그림 1 트래킹 실험시스템 Fig. 1 Tracking experiment system
그림 2 실리콘/나노실리카 콤포지트 누설전류 (정극성) Fig. 2 SiR/Nano silica composites leakage current(Positive)
그림 3 실험시작으로부터 끝까지 정극성 누설전류 값 Fig. 3 Positive leakage current maximum value from start to end of experiment
그림 4 SiR/Nano Silica 콤포지트 누설전류 최대값 Fig. 4 SiR/Nano silica composites leakage current maximum value (Negative)
그림 5 실험시작으로부터 끝까지 부극성 누설전류 최대값 Fig. 5 Negative leakage current maximum value from start to end of experiment
그림 6 정극성 DC(3.5kV), SiR/nano silica composite의 트래킹 및 침식 영상 (a) 27분, (b) 55분, (c) 60분, (d) 320분 Fig. 6 Tracking and erosion imaging of positive DC (3.5 kV), SiR/nano silica composite
그림 7 부극성 DC(-3.5kV), SiR/nano silica composite의 트래킹 및 침식 영상 (a) 27분, (b) 44분, (c) 71분, (d) 220분 Fig. 7 Tracking and erosion imaging of negative DC (-3.5 kV), SiR/nano silica composite (a) 27min, (b) 44min, (c) 71min, (d) 220min
그림 8 트래킹 실험 전후 샘플 (b) 정극성 (c) 부극성) Fig. 8 Sample before and after tracking experiment (b) Positive (c) Negative
그림 9 누설전류 크기와 전류 펄스 수 Fig. 9 Leakage Current Amplitude and Count
표 4 정극성 및 부극성 트래킹 후 침식량 Table 4 Erosion weight of positive and negative polarity after tracking
표 5 그림 9 누설전류 크기의 분류 Table 5 Classification of leakage current amplitude
표 6 그림 9의 10mA 이상 누설전류 상세분류 Table 6 Leakage current classification of more than 10 mA in Fig. 9
References
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