Modeling and Analysis of Accelerated Degradation Testing Data for a Solid State Drive (SSD)

Solid State Drive(SSD)에 대한 가속열화시험 데이터 모델링 및 분석

  • 문병민 (한양대학교 산업공학과) ;
  • 최영진 (한양대학교 산업공학과) ;
  • 지유민 (SK하이닉스 NAND개발사업총괄) ;
  • 이용중 (SK하이닉스 NAND개발사업총괄) ;
  • 이근우 (SK하이닉스 NAND개발사업총괄) ;
  • 나한주 (SK하이닉스 NAND개발사업총괄) ;
  • 양중섭 (SK하이닉스 NAND개발사업총괄) ;
  • 배석주 (한양대학교 산업공학과)
  • Received : 2018.01.05
  • Accepted : 2018.01.12
  • Published : 2018.03.25

Abstract

Purpose: Accelerated degradation tests can be effective in assessing product reliability when degradation leading to failure can be observed. This article proposes an accelerated degradation test model for highly reliable solid state drives (SSDs). Methods: We suggest a nonlinear mixed-effects (NLME) model to degradation data for SSDs. A Monte Carlo simulation is used to estimate lifetime distribution in accelerated degradation testing data. This simulation is performed by generating random samples from the assumed NLME model. Conclusion: We apply the proposed method to degradation data collected from SSDs. The derived power model is shown to be much better at fitting the degradation data than other existing models. Finally, the Monte Carlo simulation based on the NLME model provides reasonable results in lifetime estimation.

Keywords

References

  1. Pinheiro, E., Weber, W., and Barroso, L. A. (2007). "Failure Trends in a Large Disk Drive Population". In 5th USENIX Conference on File and Storage Technologies (FAST'07).
  2. Prabhakaran, V., Balakrishnan, M., Davis, J. D., and Wobber, T. (2010). "Depletable Storage Systems". In 2nd USENIX Workshop on Hot Topics in Storage and File Systems (HotStorage'10).
  3. Kim, S., Lee, S., Jeon, J., Choi, J., Yang, J., Mo, Y., and Shin, Y. (2011). "SMART based Dependability Analysis Methodology for SSD: Measurements and Implications". Journal of KIISE: Computer Systems and Theory, Vol. 38, No. 5, pp. 207-215.
  4. Marquart, T. A. (2015). "Solid-State-Drive Qualificati- on and Reliability Strategy". In Integrated Reliability Workshop (IIRW), pp. 3-6.
  5. JEDEC JEP122G (2009). "Failure Mechanisms and Models for Semiconductor Devices". JEDEC Publication.
  6. Schroeder, B., Lagisetty, R., and Merchant, A. (2016). "Flash Reliability in Production: The Expected and the Unexpected". Procedings of the 14th USENIX conference, pp. 67-80.
  7. Meeker, W., Escobar, L., and Lu, C. (1998). "Accelerated Degradation Tests: Modeling and Analysis". Technometrics, Vol. 40, No. 2, pp. 89-99. https://doi.org/10.1080/00401706.1998.10485191
  8. Bae, S. J. (2005). "Application of Accelerated Degradation Testing for VFD (Vacuum Fluorescent Display)". Journal of Applied Reliability, Vol. 5, No. 4, pp. 413- 425.
  9. Bae, S. J., Kim, S. J., Kim, M. S., Lee, B. J., and Kang, C. W. (2008). "Degradation Analysis of Nano-con- tamination in Plasma Display Panels". IEEE Transactions on Reliability, Vol. 57, No. 2, pp. 222-229. https://doi.org/10.1109/TR.2008.917823
  10. Bae, S. J., Kim, S. J., Um, S. K., Park, J. Y., Lee, J. H., and Cho, H. J. (2009). "A Prediction Model of Degradation Rate for Membrane Electrode Assemblies in Direct Methanol Fuel Cells". International Journal of Hydrogen Energy, Vol. 34, No. 14, pp. 5749-5758. https://doi.org/10.1016/j.ijhydene.2009.04.071
  11. Lindstrom, M. J. and Bates, D. M. (1990), "Nonlinear Mixed Effects Models for Repeated Measures Data". Biometrics, Vol. 46, No. 3, pp. 673-687. https://doi.org/10.2307/2532087
  12. Beal, S. L. and Sheiner, L. B. (1982). "Estimating Population Kinetics". CRC Critical Reviews in Biomedical Engineering, Vol. 8, pp. 195-222.