Current Optics and Photonics

  • 제2권2호
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  • Pages.165-171
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  • 2018
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  • 2508-7266(pISSN)
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  • 2508-7274(eISSN)
한국광학회 (Optical Society of Korea)
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Background-noise Reduction for Fourier Ptychographic Microscopy Based on an Improved Thresholding Method

  • Hou, Lexin (Shanghai Engineering Center of Ultra-precision Optical Manufacturing, Department of Optical Science and Engineering, Fudan University) ;
  • Wang, Hexin (CRT Lab, China Innovation and R&D Center, Carl Zeiss (Shanghai) Co., Ltd., Zeiss Group) ;
  • Wang, Junhua (Shanghai Engineering Center of Ultra-precision Optical Manufacturing, Department of Optical Science and Engineering, Fudan University) ;
  • Xu, Min (Shanghai Engineering Center of Ultra-precision Optical Manufacturing, Department of Optical Science and Engineering, Fudan University)
  • 투고 : 2017.12.12
  • 심사 : 2018.02.12
  • 발행 : 2018.04.25
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초록

Fourier ptychographic microscopy (FPM) is a recently proposed computational imaging method that achieves both high resolution (HR) and wide field of view. In the FPM framework, a series of low-resolution (LR) images at different illumination angles is used for high-resolution image reconstruction. On the basis of previous research, image noise can significantly degrade the FPM reconstruction result. Since the captured LR images contain a lot of dark-field images with low signal-to-noise ratio, it is very important to apply a noise-reduction process to the FPM raw dataset. However, the thresholding method commonly used for the FPM data preprocessing cannot separate signals from background noise effectively. In this work, we propose an improved thresholding method that provides a reliable background-noise threshold for noise reduction. Experimental results show that the proposed method is more efficient and robust than the conventional thresholding method.

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참고문헌

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