References
- Fortunato E, P. Barquinha, A. Pimentel, A. Goncalves, A. Marques, L. Pereira, and R. Martins, Thin Solid Films. 487, 205-211 (2005). https://doi.org/10.1016/j.tsf.2005.01.066
- D. M. Bagnall, Y. F. Chen, Z. Zhu, T. Yao, S. Koyama, M. Y. Shen, and T.Goto, Appl. Phys. Lett. 70, 2230 (1997). https://doi.org/10.1063/1.118824
- M. H. Huang, S. Mao, H. Feick, H. Yan, Y. Wu, H. Kind, E. Weber, R. Russo, and P. Yang, SCIENCE. 292, 1897. (2001)
- K. G. Yim, M. S. Kim, G. S. Kim, H. Y. Choi, S. M. Jeon, M. Y. Cho, H. G. Kim, D. Y. Lee, J. S. Kim, and J. S. Kim, Journal of the Korean Vacuum Society. 19, 281. (2010). https://doi.org/10.5757/JKVS.2010.19.4.281
- M. Y. Choi, D. Choi, M. J. Jin, I. Kim, S. H. Kim, Y. J. Choi, S. Y. Lee. J. M. Kim, and S. W. Kim, Advanced Materials. 21, 2185 (2009). https://doi.org/10.1002/adma.200803605
- H. Yu, Z. Zhang, M. Han, X. Hao, and F. Zhu, J. Am. Chem. Soc. 127, 2378 (2005). https://doi.org/10.1021/ja043121y
- A. Sugunan, H. C. Warad, M. Boman, and J. Dutta, J. of Sol-Gel Science Techn. 39, 49 (2006). https://doi.org/10.1007/s10971-006-6969-y
- P. Bhattacharyya,P. K. Basu, H. Saha, and S. Basu, Sensors and Actuators B. 124, 62 2007). https://doi.org/10.1016/j.snb.2006.11.046
- D. Y. Kim, H. M. Kang, and H. J. Kim, Journal of the korean vacuum society. 19, 177 (2010). https://doi.org/10.5757/JKVS.2010.19.3.177
- D. C. Look, D. C. Reynolds, C. W. Litton, R. L. Jones, D. B. Eason, and G. Cantwell, Appl. Phys. Lett. 81, 1830 (2002). https://doi.org/10.1063/1.1504875
- S. H. Jeong, B. S. Kim, and B. T. Lee, Appl. Phys. Lett. 82, 2625 (2003) https://doi.org/10.1063/1.1568543
- X. W. Sun and H. S. Kwok, J. Appl. Phys. 86, 408 (1999). https://doi.org/10.1063/1.370744
- A. Yamada, B. Sang, and M. Konagai, Applied Surface Science. 112, 216 (1997) https://doi.org/10.1016/S0169-4332(96)01022-7
- D. J. Park, T. H. Kang, D. S. Kim, H. T. Kim, and S. B. Choi, Journal of the Korean Physical Society. 71, 467 (2017) https://doi.org/10.3938/jkps.71.467
- Y. C. Kong, D. P. Yu, B. Zhang, W. Fang, and S. Q. Feng, Appl. Phys. Lett. 78, 407 (2001) https://doi.org/10.1063/1.1342050
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