References
- W. K. Lee, I. H. Choi, K. Y Shin, K. C. Hwang, and S.W. Han, Trans. Electr. Electron. Mater., 9, 147 (2008). [DOI: http://dx.doi.org/10.4313/TEEM.2008.9.4.147]
- S. W. Han, H. G. Cho, K. H. Park, D. I. Lee, and I. H. Choi, J. Kor. Inst. Electr. Electron. Mater. Eng., 16, 842 (2003). [DOI: http://dx.doi.org/10.4313/JKEM.2003.16.9.842]
- W. M. Carty and U. Senapati, J. Am. Ceram. Soc., 81, 3 (1998). [DOI: http://dx.doi.org/10.1111/j.1151-2916.1998.tb02290.x]
- K. Hamano, Z. Nakagawa, and M. Hasegawa, J. Ceram. Soc. Jpn., 100, 1066 (1992). [DOI: http://doi.org/10.2109/jcersj.100.1066]
- J. E. Schroeder, Am. Ceram. Soc. Bull., 57, 526 (1978).
- M. Amin, M. Akbar, and M. Salman, Sci. China Ser. E-Tech. Sci., 50, 697 (2007). [DOI: http://dx.doi.org/10.1007/s11431-007-0053-x]
- L. Mattyasovszky-Zsolnay, J. Am. Ceram. Soc., 40, 299 (1957). [DOI: http://dx.doi.org/10.1111/j.1151-2916.1957.tb12626.x]
- G. Gralik, A. L. Chinelatto, and A.S.A. Chinelatto, Ceramica, 60, 471 (2014). [DOI: http://dx.doi.org/10.1590/S0366-69132014000400004]
- W. E. Blodgett, Am. Ceram. Soc. Bull., 40, 74 (1961).
- G. Blaise and W. J. Sarjeant, Electrical aging and breakdown in dielectric materials (Academic press, 1999). p. 29.
- P. W. Olupot, S. Jonsson, and J. K. Byaruhanga, Int. J. Chem. Mol. Nucl. Mater. Metall. Eng., 7, 267 (2013). [DOI: http://waset.org/publications/11565]
- E. Akbari, M. Mirzaie, A. Rahimnejad, and M. B. Asadpoor, Int. J. Eng. Tech., 1, 407 (2012).
- W. Chen, W. Wang, Q. Xia, B. Luo, and L. Li, Energies, 5, 2594 (2012). [DOI: http://dx.doi.org/10.3390/en5072594]
- K. Morita, Y. Susuki, and H. Nozaki, IEEE Trans. Power Del., 12, 850 (1997). [DOI: http://ieeexplore.ieee.org/document/584404/] https://doi.org/10.1109/61.584404
- S. W. Han, I. H. Choi, and D. I. Lee, Proc. Electrical Insulation Conference and Electrical Manufacturing Expo (Nashville, USA, 2007). [DOI: https://doi.org/10.1109/EEIC.2007.4562601]
- N.A.B. Thazali, Ph. D Investigations of ageing mechanism and electrical withstand performances of the field aged 132 kv pmu skudai's ceramic post insulator, p. 13, Universiti Tun Hussien Onn Malaysia, Johor (2013).
- J. Zheng, Q. Yu, and X. Chen, Proc. Second International Conference on properties and Applications of Properties and Applications of Dielectric Materials (Beijing, China, 1988). p. 16. [DOI: https://doi.org/10.1109/ICPADM.1988.38320]
- Shodhganga, Chapter 1, Introduction; http://shodhganga.inflibnet.ac.in/bitstream/10603/16454/6/06_chapter%201.pdf
- K. Morita and Y. Suzuki, IEEE Trans. Power Del., 12, 850 (1997). https://doi.org/10.1109/61.584404
- C. Sumereder, M. Muhr, and R. Woschitz, Unpublished material; https://online.tugraz.at/tug_online/voe_main2.getVo llText?pDocumentNr=36597&pCurrPk=9093.
- U. Schichler and E. Kynast, Proc. Presented originally at HIGHVOLT Kolloquium (Dresden, Germany, 2007).
- A. Roula, K. Boudeghdegh, and N. Boufafa, Ceramica, 55, 206 (2009). [DOI: http://dx.doi.org/10.1590/S0366-69132009000200014]
- M. Amin and M. Salman, Rev. Adv. Mater. Sci., 13, 93 (2006).
- S. W. Han, H. G. Cho, I. H. Choi, and D. I. Lee, Proc. IEEE International Symposion on Electrical Insulation (Toronto, Canada, 2006) p. 118. [DOI: https://doi.org/10.1109/ELINSL.2006.1665271]
- E. L. Brancato, IEEE Trans. Electr, Insul., 13, 308 (1978). [DOI: https://doi.org/10.1109/TEI.1978.298079]
- I. H. Choi, J. H. Choi, D. I. Lee, Y. G. Choi, H. G. Cho, S. W. Han, and Y. C. Park, J. Kor. Inst. Electr. Electron. Mater. Eng., 18, 96 (2005). [DOI: https://doi.org/10.4313/JKEM.2005.18.1.096]
- A. L. Hartzell, M. G. da Silva, and H. Shea, MEMs reliability, (Springer, 2011). p. 15. [ISBN: 978-1-4419-6017-7]