참고문헌
- Abernethy, R. B. (2004), The New Weibull Handbook, 5th ed., Published by R. B. Abernethy, North Palm Beach, USA.
- Beyer, R. and Lauster, E. (1990), Statistische Lebensdauerprufplane Bei Berucksichtigung von Vorkenntnissen, Qualitat und Zuverlassigkeit, 35(2), 93-98.
- Coolen, F. P. A. and Coolen-Schijerner, P. (2006), On Zero-Failure Testing for Bayesian High-Reliability Demonstration, Proceedings of the Institution of Mechanical Engineers, Part O : Journal of Risk and Reliability, 220(1), 35-44. https://doi.org/10.1243/1748006XJRR3
- Fitzgerald, M., Martz, H. F., and Parker, R. L. (1999), Bayesian Single-Level Binomial and Exponential Reliability Demonstration Test Plans, International Journal of Reliability Quality and Safety Engineering, 6(2), 123-137. https://doi.org/10.1142/S0218539399000139
- Hamada, M. Wilson, A., Reese, S., and Martz, H. (2008), Bayesian Reliability, Springer, New York, USA.
- Guo, H. and Liao, H. (2012), Methods of Reliability Demonstration Testing and Their Relationships, IEEE Transactions on Reliability, 61(1), 231-237. https://doi.org/10.1109/TR.2011.2167782
- Ke, H.-Y. (2000), A Bayesian/Classical Approach to Reliability Demonstration, Quality Engineering, 12(3), 365-370. https://doi.org/10.1080/08982110008962600
- Kececioglu, D. B. (1994), Reliability & Life Testing Handbook, Prentice-Hall, Englewood Cliffs, USA.
- Kleyner, A., Bhagath, S., Gasparani, M., Robinson, J., and Berder, M., (1997), Bayesian Techniques to Reduce the Sample Size in Automotive Electronics Attribute Testing, Microelectronics Reliability, 37(6), 879-883. https://doi.org/10.1016/S0026-2714(96)00253-3
- Kleyner, A., Elmore, D., and Boukai, B. (2015), A Bayesian Approach to Determine Test Sample Size Requirements for Reliability Demonstration Retesting after Product Design Change, Quality Engineering, 27(3), 289-295. https://doi.org/10.1080/08982112.2014.990035
- Krolo, A. and Bertsche, B. (2003), An Approach for the Advanced Planning of a Reliability Demonstration Test Based on a Bayes Procedure, Reliability and Maintainability Symposium (RAMS) Proceedings, 288-294.
- Kwon, Y. I. (2006), A Two-Stage Reliability Demonstration Test for Mechanical Components, Journal of the Korean Society for Quality Management, 34(1), 20-26.
- Kwon, Y. I. (2014), Design of Bayesian Zero-Failure Demonstration Test for Products with Weibull Lifetime Distribution, Journal of Applied Reliability, 14(4), 220-224.
- Martz, H. F. Jr. and Waller, R. A. (1979), A Bayesian Zero-Failure (BAZE) Reliability Demonstration Testing Procedure, Journal of Quality Technology, 11(3), 128-138. https://doi.org/10.1080/00224065.1979.11980894
- McKane, S. W., Meeker, W. Q., and Escobar, L. A. (2005), Sample Size and Number of Failure Requirements for Demonstration Tests with Log-Location-Scale Distributions and Failure Censoring, Technometrics, 47(2), 182-192. https://doi.org/10.1198/004017005000000030
- Meeker, W. Q. and Escobar, L. A. (1998), Statistical Methods for Reliability Data, John Wiley & Sons, New York, USA.
- Sarakakis, G., Gerokostopoulos, A., and Mettas, A. (2011), Special Topics for Consideration in a Design for Reliability Process, Reliability and Maintainability Symposium (RAMS) Proceedings, 6.
- Seo, S.-K. (2011), Statistical Design of Two-Stage Reliability Demonstration Tests, Journal of the Korean Society for Quality Management, 39(2), 313-319.
- Seo, S.-K. (2015), Development of Mixed Reliability Demonstration Test Plans, Journal of Applied Reliability, 15(3), 170-175.
- Wang, C. J. and Lu, M. W. (1992), A Two-Stage Sampling Plan for Bogey Tests, Quality and Reliability Engineering International, 8(1), 29-35. https://doi.org/10.1002/qre.4680080106
- Wasserman, G. S. (2003), Reliability Verification, Testing, and Analysis in Engineering Design, Marcel Dekker, New York, USA.
- Yang, G. (2009), Methods of Reliability Demonstration Through Degradation Bogey Testing, IEEE Transactions on Reliability, 58(4), 604-610. https://doi.org/10.1109/TR.2009.2033733
- Yang, G. (2013), Heuristic Degradation Test Plans for Reliability Demonstration, IEEE Transactions on Reliability, 62(1), 305-311. https://doi.org/10.1109/TR.2013.2241200
- Yates, S. W. and Mosleh, A. (2006), A Bayesian Approach to Reliability Demonstration for Aerospace Systems, Reliability and Maintainability Symposium(RAMS) Proceedings, 611-617.
- Yum, B.-J., Seo, S.-K., Yun, W. Y., and Byun, J.-H. (2014), Trends and Future Directions of Quality Control and Reliability Engineering, Journal of the Korean Institute of Industrial Engineers, 40(6), 526-554. https://doi.org/10.7232/JKIIE.2014.40.6.526
- Zhang, J. and Geiger, C. (2015), Leveraging Prior Knowledge into Life Test Design, Reliability and Maintainability Symposium(RAMS) Proceedings, 5.