참고문헌
- H. Okubo, N. Hayakawa, and G. C. Montanari, IEEE TRNS. DIELECTR. ELECTR. INSUL., 14, 6, 1516-1530 (2007). [DOI: http://dx.doi.org/10.1109/TDEI.2007.4401236]
- H. Kikuchi and H. Hanawa, IEEE TRNS. DIELECTR. ELECTR. INSUL., 19, 1, 99-106 (2012). [DOI: http://dx.doi.org/10.1109/TDEI.2012.6148507]
- Y. Kikuchi. T. Murata, Y. Uozumi, N. Fukumoto, M. Nagata, Y. Wakimoto, and T. Yoshimitsu, IEEE TRNS. DIELECTR. ELECTR. INSUL., 15, 6, 1617-1625 (2008). [DOI: http://dx.doi.org/10.1109/TDEI.2008.4712665]
- E. Ildstad and S. R. Chalise, Proc. IEEE Conf. (2009) p. 85-88. [DOI: http://dx.doi.org/10.1109/ceidp.2009.5377720]
- G. C. Stone, I. Culbert, E. A. Boulter, and H. Dhirani, IEEE Press Series on Power Engineering (2004).
- E. Sugimoto, IEEE Electrical Insulation Magazine, 5, 1, 15-23, 1989. [DOI: http://dx.doi.org/10.1109/57.16949]
- Indian Standard Winding Wires-Test Methods Part 5 Electrical Properties (First Revision) ICS 29.060.10 (2012).
- J. J. Park, Y. B. Park, and J. Y. Lee, Trans. Electr. Electron. Mater., 12, 93 (2011). [DOI: http://dx.doi.org/10.4313/TEEM.2011.12.3.93]
- Y. Kikuchi, T. Murata, Y. Uozumi, N. Fukumoto, M. Nagata, Y. Wakimoto, and T. Yoshimitsu, IEEE TRNS. DIELECTR. ELECTR. INSUL., 15, 6, 1617-1625 (2008) [DOI: http://dx.doi.org/10.1109/TDEI.2008.4712665]
- H. Kikuchi and H. Hanawa, IEEE TRNS. DIELECTR. ELECTR. INSUL., 19, 1, 99-106 (2012). [DOI: http://dx.doi.org/10.1109/TDEI.2012.6148507]
- M. Q. Nguyen, D. Malec, D. Mary, P. Werynski, B. Gornicka, L. Therese, and Ph. Guillot, Proc. IEEE Electrical Insulation Conference (2009) p. 377-381.
- M. Q. Nguyen, D. Malec, D. Mary, P. Werynski, B. Gornicka, L. Therese, and P. Guillot, IEEE TRNS. DIELECTR. ELECTR. INSUL., 17, 5 (2010). https://doi.org/10.1109/TDEI.2010.5411996
- G. Zhang, T. Lin, L. Zhang, and G. Wu, Proc. IEEE International Conf., 2, 904-907 (2004).
- F. Guastavino and A. Ratto, IEEE Electrical Insulation Magazine, 28, 4, 35-41 (2012). [DOI: http://dx.doi.org/10.1109/MEI.2012.6232008]