한국전기전자재료학회논문지 (Journal of the Korean Institute of Electrical and Electronic Material Engineers)

  • 제29권8호
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  • Pages.489-493
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  • 2016
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  • 1226-7945(pISSN)
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  • 2288-3258(eISSN)
한국전기전자재료학회 (The Korean Institute of Electrical and Electronic Material Engineers)
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OLED 레이저 실링용 글라스 프릿에서 V2O5 함량 및 가소성 분위기가 접합 특성에 미치는 영향

Effect of V2O5 Content and Pre-Sintering Atmosphere on Adhesive Property of Glass Frit for Laser Sealing of OLED

  • 정현진 (한국세라믹기술원 광.디스플레이소재센터) ;
  • 이미재 (한국세라믹기술원 광.디스플레이소재센터) ;
  • 이영진 (한국세라믹기술원 광.디스플레이소재센터) ;
  • 김진호 (한국세라믹기술원 광.디스플레이소재센터) ;
  • 전대우 (한국세라믹기술원 광.디스플레이소재센터) ;
  • 황종희 (한국세라믹기술원 광.디스플레이소재센터) ;
  • 이정수 ((주) 베이스 R & D 센터) ;
  • 양윤성 ((주) 베이스 R & D 센터) ;
  • 육수경 ((주) 베이스 R & D 센터) ;
  • 박태호 ((주) 베이스 R & D 센터) ;
  • 문윤곤 ((주) 악셀 R & D 센터)
  • Jeong, HyeonJin (Optical & Display Material Center, Korea Institute of Ceramic Engineering & Technology) ;
  • Lee, Mijai (Optical & Display Material Center, Korea Institute of Ceramic Engineering & Technology) ;
  • Lee, Youngjin (Optical & Display Material Center, Korea Institute of Ceramic Engineering & Technology) ;
  • Kim, Jin-Ho (Optical & Display Material Center, Korea Institute of Ceramic Engineering & Technology) ;
  • Jeon, Dae-Woo (Optical & Display Material Center, Korea Institute of Ceramic Engineering & Technology) ;
  • Hwang, Jonghee (Optical & Display Material Center, Korea Institute of Ceramic Engineering & Technology) ;
  • Lee, Jungsoo (R & D Center, Bass Co., Ltd.) ;
  • Yang, Yunsung (R & D Center, Bass Co., Ltd.) ;
  • Youk, Sookyung (R & D Center, Bass Co., Ltd.) ;
  • Park, Tae-Ho (R & D Center, Bass Co., Ltd.) ;
  • Moon, Yun-Gon (R & D Center, Axel Co., Ltd.)
  • 투고 : 2016.07.05
  • 심사 : 2016.07.24
  • 발행 : 2016.08.01
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초록

In this study, the effect of vanadium oxide ($V_2O_5$) content and pre-sintering atmosphere on sealing property of glass frit that consisted of $V_2O_5-BaO-ZnO-P_2O_5-TeO_2-CuO-Fe_2O_3-SeO_2$ was investigated by XPS (X-ray photoelectron spectroscopy). The content of V2O5 was changed to 15, 30, and 45 mol%, and the pre-sintering was carried out in air and $N_2$ condition, respectively. XPS analysis conducted before and after laser irradiation with identical sample. Before laser treatment, glass frits that were pre-sintered at air condition showed both $V^{4+}$ and $V^{5+}$, but the valence state was changed to $V^{5+}$ after laser irradiation when the glass frits contained 30 and 45 mol% $V_2O_5$; this change led to non-adhesive property. On the other hand, glass frits that were pre-sintered at $N_2$ condition exhibited only $V^{4+}$ and it showed fine adhesion irrespective of the $V_2O_5$ content. As a result, the existence of $V^{4+}$ seems to be a major factor for controlling the adhesive property of glass frit for laser sealing.

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참고문헌

  1. H. Kind, E. Gehlen, M. Aden, A. Olowinsky, and A. Gillner, Phys. Procedia, 56, 673-680 (2014). [DOI: http://dx.doi.org/10.1016/j.phpro.2014.08.075]
  2. S. J. Cho and K. Lee, J. Kor. Ceram. Soc., 52, 103-107 (2015). [DOI: http://dx.doi.org/10.4191/kcers.2015.52.2.103]
  3. S. J. Cho and K. H. Lee, J. Kor. Ceram. Soc., 51, 170-176 (2014). [DOI: http://dx.doi.org/10.4191/kcers.2014.51.3.170]
  4. K. Sharma, G. P. Kothiyal, L. Montagne, F. O. Mear, and B. Revel, Int. J. Hydrogen. Energy, 38, 15542-15552 (2013). [DOI: http://dx.doi.org/10.1016/j.ijhydene.2013.09.052]
  5. C. G. Pantano, C. J. Simmons, and O. H. El-Bayoumi eds., X-ray Photoelectron Spectroscopy of Glass: An Introduction (Amer. Ceramic Society, USA, 1993) p. 129.
  6. K. L. Smith and K. M. Black, J. Vac. Sci. Technol. A, 2, 744-747 (1984). [DOI: http://dx.doi.org/10.1116/1.572562]
  7. J. Kasperkiewicz, J. A. Kovacich, and D. Lichtman, J. Electron Spectros. Relat. Phenomena, 32, 123-132 (1983). [DOI: http://dx.doi.org/10.1016/0368-2048(83)85090-7]
  8. W. E. Slink and P. B. DeGroot, J. Catal., 68, 423-432 (1981). [DOI: http://dx.doi.org/10.1016/0021-9517(81)90113-5]
  9. P. Mezentzeff, Y. Lifshitz, and J. W. Rabalais, Nucl. Instrum. Methods Phys. Res. B, 44, 296-301 (1990). [DOI: http://dx.doi.org/10.1016/0168-583X(90)90642-8]
  10. Y. Li, S. Ji, Y. Gao, H. Luo, and M. Kanehira, Sci. Rep., 3, 1370 (2013). [DOI: http://dx.doi.org/10.1038/srep01370]
  11. G. A. Khan and C. A. Hogarth, J. Mater. Sci., 26, 412-416 (1991). [DOI: http://dx.doi.org/10.1007/BF00576535]