References
- Y. H. Hwang, J. S. Seo, J. M. Yun, H. Park, S. Yang, S.H.K. Park, and B. S. Bae, NPG Asia Mater., 5, e45 (2013). [DOI: http://dx.doi.org/10.1038/am.2013.11]
- X. Yu, L. Zeng, N. Zhou, P. Guo, F. Shi, D. B. Buchholz, Q. Ma, J. Yu, V. P. Dravid, R.P.H. Chang, M. Bedzyk, T. J. Marks, and A. Facchetti, Adv. Mater., 27, 2390 (2015). [DOI: http://dx.doi.org/10.1002/adma.201405400]
- L. Huang, D. Han, Y. Zhang, P. Shi, W. Yu, G. Cui, Y. Cong, J. Dong, S. Zhang, X. Zhang, and Y. Wang, Electron. Lett,. 51, 1595 (2015). [DOI: http://dx.doi.org/10.1049/el.2015.2041]
- W. Yang, K. Song, Y. Jung, S. Jeong, and J. Moon, J. Mater. Chem. C, 1, 4275 (2013). [DOI: http://dx.doi.org/10.1039/c3tc30550c]
- B. W. An, B. G. Hyun, S. Y. Kim, M. Kim, M. S. Lee, K. Lee, J. B. Koo, H. Y. Chu, B. S. Bae, and J. U. Park, Nano Lett. 14, 6322 (2014). [DOI: http://dx.doi.org/10.1021/nl502755y]
- M. K. Dai, J. T. Lian, T. Y. Lin, and Y. F. Chen, J. Mater. Chem. C, 1, 5064 (2013). [DOI: http://dx.doi.org/10.1039/c3tc30890a]
- M. N. Fujii, Y. Ishikawa, M. Horita, and Y. Uraoka, ECS J. Solid State Sci. Technol., 3, Q3050 (2014). [DOI: http://dx.doi.org/10.1149/2.011409jss]
- G. J. Lee, J. Kim, J.-H. Kim, S. M. Jeong, J. E. Jang, and J. Jeong, Semicond. Sci. Technol., 29, 035003 (2014). [DOI: http://dx.doi.org/10.1088/0268-1242/29/3/035003]
- A. Tari, and W. S. Wong, Appl. Phys. Lett., 107, 193502 (2015). [DOI: http://dx.doi.org/10.1063/1.4934869]
- J.-S. Park, J. K. Jeong, Y.-G. Mo, and H. D. Kim, Appl. Phys. Lett., 90, 262106 (2007). [DOI: http://dx.doi.org/10.1063/1.2753107]
- X. Ding, H. Zhang, H. Ding, J. Zhang, C. Huang, W. Shi, J. Li, X. Jiang, and Z. Zhang, Superlattices Microstruct., 76, 156 (2014). [DOI: http://dx.doi.org/10.1016/j.spmi.2014.10.007]