KIISE Transactions on Computing Practices (정보과학회 컴퓨팅의 실제 논문지)

Korean Institute of Information Scientists and Engineers (한국정보과학회)
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CTIS: Cross-platform Tester Interface Software for Memory Semiconductor

메모리 반도체 검사 장비 인터페이스를 위한 크로스플랫폼 소프트웨어 기술

  • 김동수 (성균관대학교 정보통신대학) ;
  • 강동현 (성균관대학교 정보통신대학) ;
  • 이은석 (삼성전자 설비혁신팀) ;
  • 이규성 (삼성전자 TEST기술팀) ;
  • 엄영익 (성균관대학교 정보통신대학)
  • Received : 2015.05.21
  • Accepted : 2015.07.08
  • Published : 2015.10.15
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Abstract

Tester Interface Software (TIS) provides all software functions that are necessary for a testing device to perform the test process on a memory semiconductor package from the time the device is put into the test equipment until the device is discharged from the equipment. TIS should perform the same work over all types of equipment regardless of their tester models. However, TIS has been developed and managed independently of the tester models because there are various equipment and computer models that are used in the test process. Therefore, more maintenance, time and cost are required for development, which adversely affects the quality of the software, and the problem becomes more serious when the new tester model is introduced. In this paper, we propose the Cross-platform Tester Interface Software (CTIS) framework, which can be integrated and operated on heterogeneous equipment and OSs.

메모리 반도체 패키지 검사 공정에서 TIS(Tester Interface Software)는 디바이스가 검사 장비에 투입 될 때부터 배출될 때까지 검사 장비가 디바이스 검사를 진행하는데 필요한 모든 소프트웨어 기능을 제공한다. 하지만, 공정에서 사용되는 장비와 장비를 제어하기 위한 컴퓨터 및 운영체제의 종류가 다양하여 동일한 기능을 수행해야 하는 TIS가 테스터 장비마다 독립적으로 개발 및 운영되고 있다. 이는 많은 시간과 비용을 요구할 뿐만 아니라 소프트웨어의 품질에도 많은 영향을 미치고 있으며, 이러한 문제는 추가되는 장비의 종류가 증가할수록 심화될 것이다. 본 논문에서는 이러한 문제를 해결하기 위해 이종 장비와 운영체제에 적용 가능한 CTIS(Cross-platform Tester Interface Software)을 제안한다.

Keywords

Acknowledgement

Supported by : 한국연구재단

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