Journal of the Korean Society for Aeronautical & Space Sciences (한국항공우주학회지)

The Korean Society for Aeronautical and Space Sciences (한국항공우주학회)
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Built-In-Test Coverage Analysis Considering Failure Mode of Electronics Components

전자부품 고장모드를 고려한 Built-In-Test 성능분석

  • Received : 2014.10.18
  • Accepted : 2015.03.26
  • Published : 2015.05.01
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Abstract

Built-In-Test(hereafter: BIT) is necessary functionality for aircraft flight safety and it requires a high failure detection capacity of more than 95 % in the case of avionics equipment. The BIT coverage analysis is needed to make sure that BIT meets its fault diagnosis capability. FMECA is used a lot of for the BIT coverage analysis. However, in this paper, the BIT coverage analysis based on electronic components is introduced to minimize the analytical error. Further, by applying the failure mode of the electronic components and excluding electronic components that do not affect flight safety, the BIT coverage analysis can be more accurate. Finally, BIT demo was performed and it was confirmed that the performance of the actual BIT matches the analysis of BIT performance.

Built-In-Test(이하: BIT)는 항공기 비행안전을 위해 반드시 필요한 기능으로 항공전자 장비의 경우 95% 이상의 높은 고장 진단능력을 요구하고 있다. BIT가 요구도에 명시된 고장 진단능력을 만족시키는지 확인하기 위해 BIT 성능분석이 필요하다. BIT 성능분석을 위해 FMECA (Failure Mode Effect Critical Analysis)에 기술된 고장모드를 활용하는 방법이 많이 사용되고 있으나, 본 논문에서는 분석 오류를 최소화할 수 있는 전자부품 기반의 BIT 성능분석 방법론을 소개한다. 또한, BIT 성능분석에서 제외될 수 있는 비행안전에 영향을 미치지 않는 전자부품 및 전자부품의 고장모드를 실제 개발사례에 적용하여 불필요한 BIT 기능 구현을 방지하고 정확한 BIT 성능분석을 수행할 수 있도록 하였다. BIT Demo를 수행하여 BIT 성능분석 결과와 실제 BIT 성능이 일치함을 확인하였다.

Keywords

References

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