DOI QR코드

DOI QR Code

Visible Emission Properties of V2O5 Nanorods Prepared by Different Growth Methods

  • Kang, Manil (Department of Physics, University of Ulsan) ;
  • Kim, Sok Won (Department of Physics, University of Ulsan) ;
  • Ryu, Ji-Wook (Department of Physics, Kongju National University)
  • Received : 2014.09.01
  • Accepted : 2014.09.30
  • Published : 2014.09.30

Abstract

${\alpha}-V_2O_5$ nanorods were grown by means of electron beam irradiation and thermal oxidation methods and the visible emission properties of the nanorods grown by both methods were investigated. The growth and crystallinity of the nanorods were greatly enhanced by the insertion of a buffer layer. The emission spectra of the nanorods grown by thermal oxidation and electron beam irradiation showed a peak centered at 710~720 nm, which is believed to be due to oxygen vacancies introduced during the growth process. Also, the emission peak centered at 530 nm observed in the $V_2O_5$ nanorods grown by electron beam irradiation was considered to be due to the band edge transition as a result of the enhanced crystallinity.

Keywords

References

  1. G. Golan, A. Axelevitch, B. Sigalov, and B. Gorenstein, J. Optoelectron. Adv. Mater. 6, 189 (2004).
  2. P. Singh and D. Kaura, J. Appl. Phys. 103, 043507 (2008). https://doi.org/10.1063/1.2844438
  3. S. P. Lim, J. D. Long, S. Xu and K. Ostrikov, J. Phys. D: Appl. Phys. 40, 1085 (2007). https://doi.org/10.1088/0022-3727/40/4/026
  4. G. E. Jellison, L. A. Boatner, D. H. Lowndes, R. A. McKee and M. Godbole, Appl. Opt. 33, 6053 (1994). https://doi.org/10.1364/AO.33.006053
  5. Y. S. Yoon, J. S. Kim, and S. H. Choi, Thin Solid Films 460, 41 (2004). https://doi.org/10.1016/j.tsf.2004.01.075
  6. M. Losurdo and G. Bruno, Appl. Phys. Lett. 77, 1129 (2000). https://doi.org/10.1063/1.1289658
  7. M. I. Kang, I. K. Kim, E. J. Oh, S. W. Kim, J. W. Ryu, and H. Y. Park, Thin Solid Films 520, 2368 (2012). https://doi.org/10.1016/j.tsf.2011.11.028
  8. C. G. Granqvist, Handbook of Inorganic Electrochromic Materials (Elsevier, Amsterdam, 1995).
  9. A. Talledo and C. G. Granqvist, J. Appl. Phys. 77, 4655 (1995). https://doi.org/10.1063/1.359433
  10. V. Petkov, P. Y. Zavalij, S. Lutta, M. S. Whittingham, V. Parvanov, and S. Shastri, Phys. Rev. B 69, 085410 (2004). https://doi.org/10.1103/PhysRevB.69.085410
  11. B. B. Lakshmi, C. J. Patrissi, and C. R. Martin, Chem. Mater. 9, 2544 (1997). https://doi.org/10.1021/cm970268y
  12. Y. Wang, Z. Li, X. Sheng, and Z. Zhang, J. Chem. Phys. 126, 164701 (2007). https://doi.org/10.1063/1.2722746
  13. P. M. Ajayan, O. Stephan, and P. Redlih, C. Colliex, Nature 375, 564 (1995). https://doi.org/10.1038/375564a0
  14. K. Takahashi, Y. Wang, and G. Z. Cao, Appl. Phys. Lett. 86, 053102 (2005). https://doi.org/10.1063/1.1857087
  15. B. H. Kim, A. S. Kim, S. Y. Oh, S. S. Bae, Y. J. Yun, and H. Y. Yu, Appl. Phys. Lett. 93, 233101 (2008). https://doi.org/10.1063/1.3044403
  16. Y. Hu, Z. Li, Z. Zhang, and D. Meng, Appl. Phys. Lett. 94, 103107 (2009). https://doi.org/10.1063/1.3095502
  17. C. W. Zou, X. D. Yan, J. M. Bian, and W. Gao, Optics Lett. 35, 1145 (2010). https://doi.org/10.1364/OL.35.001145
  18. N. Fateh, G. A. Fontalvo, and C. Mitterer, J. Phys. D: Appl. Phys. 40, 7716 (2007). https://doi.org/10.1088/0022-3727/40/24/019
  19. M. Kang, I. Kim, S. W. Kim, J. W. Ryu, H. Y. Park, Appl. Phys. Lett. 98, 131907 (2011). https://doi.org/10.1063/1.3571557
  20. S. Krishnakuma, and C. S. Menon, Phys. Stat. Sol. A 153, 439 (1996). https://doi.org/10.1002/pssa.2211530218
  21. J. A. Thornton, J. Vac. Sci. Technol. 11, 666 (1974). https://doi.org/10.1116/1.1312732
  22. G. S. Nadkarni and V. S. Shirodkar, Thin Solid Films 105, 115 (1983). https://doi.org/10.1016/0040-6090(83)90200-6
  23. Z. J. Zhang, Y. Zhao, and M. M. Zhu, Appl. Phys. Lett. 88, 033101 (2006). https://doi.org/10.1063/1.2166479
  24. M. Kang, M. Chu, S. W. Kim, and J. W. Ryu, Thin Solid Films 547, 198 (2013). https://doi.org/10.1016/j.tsf.2013.03.060
  25. P. Clauws and J. Vennik, Phys. Status Solidi B 66, 553 (1974). https://doi.org/10.1002/pssb.2220660218
  26. M. Kang, S. W. Kim, Y. Hwang, Y. Um, and J. W. Ryu, AIP Advances 3, 052129 (2013). https://doi.org/10.1063/1.4808021