DOI QR코드

DOI QR Code

Initial-phase Sensitivity Analysis of Harmonic Measurements via Windowed DFT

  • Song, Shuping (College of Energy and Electrical Engineering, Hohai University) ;
  • Wang, Fuzong (Architects & Engineers Co., Ltd., of SouthEast University) ;
  • Cheng, Guozhu (STARSOFT Technology Co., Ltd.)
  • Received : 2013.12.04
  • Accepted : 2014.06.02
  • Published : 2014.08.25

Abstract

When the windowed DFT algorithm is applied in harmonic measurements, the problem of initial-phase sensitivity will be encountered, this has an effect on harmonic amplitude accuracy. In this paper, the origin of initial-phase sensitivity is analyzed and the main factors that influence the level of initial-phase sensitivity are demonstrated. A method of reducing initial-phase sensitivity is proposed to increase the stability of harmonic measurements. We found that initial-phase sensitivity is determined by the side lobe peak level of the window functions when synchronous deviation is fixed. In addition, increasing the length of the time recorded can be used to remove initial-phase sensitivity. The correctness and validity of our conclusions have been confirmed through numerical results and field tests.

Keywords

References

  1. C. I. Chen and G. W. Chang, IEEE T. Ind. Electron., 7, 3334 (2010) [DOI: http://dx.doi.org/10.1109/TIE.2010.2040553
  2. T. Grandke, IEEE T Instrum Meas., 32, 350 (1983) [DOI: http://dx.doi.org/10.1109/TIM.1983.4315077].
  3. T. Lobos and J. Rezmer, IEEE T Instrum Meas., 46, 877 (1997) [DOI: http://dx.doi.org/10.1109/19.650792].
  4. IEC Std. 61000-4-7 (2009).
  5. D. Belega, D. Dallet, and D. Petri, IEEE T Instrum. Meas., 59, 2808 (2010) [DOI: http://dx.doi.org/10.1109/TIM.2010.2060870].
  6. G. W. Chang, C. I. Chen, Y. J. Liu, and M. C. Wu, IET Gener Transm Dis., 2, 193 (2008) [DOI: http://dx.doi.org/10.1049/ietgtd:20070205].
  7. F. J. Harris, P IEEE., 66, 51 (1978) [DOI: http://dx.doi.org/10.1109/PROC.1978.10837].
  8. Nuttall, IEEE T Acoust Speech. ASSP, 29, 84 (1981). https://doi.org/10.1109/TASSP.1981.1163506
  9. D. Belega and D. Dallet, Meas. Technol., 2, 1 (2008).
  10. H. Wen, T. Z. Teng, Y. Wang, B. Zeng, and X. G. Hu, IEEE T Power Electr., 26, 2570 (2011) [DOI: http://dx.doi.org/10.1109/TPEL.2011.2111388].
  11. J. Barros and R. I. Diego, IEEE T Power Deliver., 21, 538 (2006) [DOI: http://dx.doi.org/10.1109/TPWRD.2005.852339].
  12. F. Zhang, Z. Geng, and W. Yuan, IEEE T Power Deliver., 16, 160 (2001). https://doi.org/10.1109/61.915476
  13. D. Rife and R. Boorstyn, IEEE T Inform Theory. IT, 20, 591 (1974) [DOI: http://dx.doi.org/10.1109/TIT.1974.1055282].
  14. L. Salvatore and A. Trotta, IEE P-Elect Pow Appl., 135, 346 (1988). http://dx.doi.org/10.1049/ip-b.1988.0038].
  15. S. Reljin, B. D. Reljin, V. D. Papic, I. S. Reljin, B. D. Reljin, and V. D. Papic, IEEE T Instrum Meas., 56, 1025 (2007) [DOI: http://dx.doi.org/10.1109/TIM.2007.894889].
  16. H. Wen, Z. S. Teng, and S. Y. Guo, IEEE T Instrum. Meas., 59, 543 (2010) [DOI: http://dx.doi.org/10.1109/TIM.2009.2024702].
  17. B. Zeng and T. Z. Teng, IEEE T Power Deliver., 26, 250 (2011) [DOI: http://dx.doi.org/10.1109/TPWRD.2010.2083701].
  18. H. Wen, Z. S. Teng, Y. Wang, and X. G.Hu, IEEE T Ind. Electron., 60, 1001 (2013) [DOI: http://dx.doi.org/10.1109/TIE.2012.2189531].
  19. Ferrero and R. Ottobni, IEEE T Instrum. Meas., 41, 780 (1992) [DOI: http://dx.doi.org/10.1109/19.199406].
  20. G. W. Chang, I. C. Cheng, and T. Yu-Feng, IEEE T Ind. Electron., 57, 2171 (2010) [DOI: http://dx.doi.org/10.1109/TIE.2009.2034681].
  21. C. Offelli, D. Petri, IEEE T. Instrum Meas., 40, 972 (1991) [DOI:http://dx.doi.org/10.1109/19.119777].
  22. O. Solomon, IEEE T Instrum. Meas., 43, 194 (1994) [DOI: http://dx.doi.org/10.1109/19.293419].
  23. D. Belega and D. Dallet, Measurement., 42, 420 (2009) [DOI:http://dx.doi.org/10.1016/j.measurement.2008.08.006].
  24. D. Gallo, R. Langella, and A. Testa, IEEE T Power Deliver., 19, 993 (2004) [DOI: http://dx.doi.org/10.1109/TPWRD.2004.829941].
  25. H. C. Lin, IEEE T Power Electr., 23, 1309 (2008). https://doi.org/10.1109/TPEL.2008.921067
  26. C. X. Hong and Y. P. Guo, Sciencepaper Online, 1 (2008).
  27. A. M. Stankovic and Edwin, IEEE T Power Syst., 13, 442 (1998). https://doi.org/10.1109/59.667366
  28. M. Branislav, A. M. Santrac, and Sokola, IEEE T Instrum. Meas., 58, 3434 (2009). https://doi.org/10.1109/TIM.2009.2017661
  29. J. F. Xiong, B. L.Wang, and Y. Sun, Proc. Automation Instrumentation (SIPAI), 30, 9 (2009).
  30. A. Ferrero, S. Salicone, and S. Toscani, IEEE T Instrum. Meas., 60, 1579 (2011) [DOI: http://dx.doi.org/10.1109/TIM.2010.2090051].
  31. J. T. Cui, An Introduction to Wavelet Analysis, (Xi'an Jiao Tong University Press, Xi'an, 1995) p. 31.
  32. M. Xie and K. Ding, J Vib Eng., 20, 274 (1998).