Journal of the Institute of Electronics and Information Engineers (전자공학회논문지)

The Institute of Electronics and Information Engineers (대한전자공학회)
권호 표지
DOI QR코드

DOI QR Code

Sequential Defect Detection According to Defect Possibility in TFT-LCD Panel Image

TFT-LCD 패널 영상에서 결함 가능성에 따른 순차적 결함 검출

  • Lee, SeungMin (Graduate School of Electronics Engineering, Kyungpook National University) ;
  • Kim, Tae-Hun (Graduate School of Electronics Engineering, Kyungpook National University) ;
  • Park, Kil-Houm (Graduate School of Electronics Engineering, Kyungpook National University)
  • Received : 2013.12.20
  • Accepted : 2014.03.31
  • Published : 2014.04.25
Download PDF
⟨ Previous Next ⟩

Abstract

In TFT-LCD panel images, defects are typically detected by using a large difference in the brightness compared to the background. In this paper, we propose a sequential defect detection algorithm according to defect possibility caused by difference of brightness. By using this method, pixels with high defect probabilities are preferentially detected and defects with a large brightness difference are accurately detected. Also, limited defects with a small brightness difference is detected more reliably, eventually minimizing the degree of over-detection. We have experimentally confirmed that our proposed method showed an excellent detection result for detecting limited defects as well as defects with a large brightness difference.

TFT-LCD 영상에서 결함은 일반적으로 배경과 비교하여 밝기 차이가 큰 특징을 사용하여 검출된다. 본 논문에서는 휘도 차에 따른 결함 가능성이 높은 순으로 결함을 검출하는 순차적 결함 검출 방법을 제안한다. 제안한 방법은 배경과의 휘도 차가 큰 결함은 정확히 검출하고, 배경과의 휘도 차가 작은 결함인 한도결함도보다 신뢰있게 검출하여 과검출을 최소화할 수 있다. 실험을 통해 제안한 방법은 배경과의 휘도 차가 큰 결함뿐만 아니라 한도결함에 대해서도 우수한 검출 결과를 나타냄을 확인하였다.

Keywords

References

  1. J. Jang, S. K. Lim and M. H. Oh, "Technology development and production of flat panel displays in Korea," Proceedings of the IEEE. Vol. 90, no. 4, pp. 501-513, 2002. https://doi.org/10.1109/JPROC.2002.1002522
  2. S. W. Sohn, G. T. Ryu and H. D. Bae, "An Image Processing Technique for Polarizing Film Defects Detection," Journal of The Institute of Electronics Engineers of Korea, Vol. 45, no. IE-2, pp. 20-27, 2008.
  3. J. H. Ko, "LCD Defect Detection using Neural-network based on BEP," Journal of The Institute of Electronics Engineers of Korea, Vol. 48, no. IE-2, pp. 26-31, 2011.
  4. Y. C. Chuang and S. K. S. Fan, "Automatic TFT-LCD Mura Inspection Based on Studentized Residuals in Regression Analysis," Industrial Engineering & Management Systems, Vol. 8, no. 3, pp. 148-154, 2009.
  5. G. B. Lee, C. G. Lee, S. Y. Kim and K. H. Park, "Adaptive surface fitting for inspection of FPD devices using multilevel B-spline approximation," 21st International Technical Conference on Circuits/Systems, Computers and Communications, Vol. 2, pp, 205-208, 2006.
  6. N. Otsu, "A Threshold Selection Method from Gray-Level Histograms," IEEE Transactions on Systems, Man, and Cybernetics, Vol. 9, No. 1, pp. 62-66, 1979. https://doi.org/10.1109/TSMC.1979.4310076
  7. W. S. Kim, D. M. Kwak, Y. C. Song, D. H. Choi and K. H. Park, "Detection of Spot-Type Defects on Liquid Crystal Display Modules," Key Engineering Materials, Vol. 270-273, pp. 808-813, 2004. https://doi.org/10.4028/www.scientific.net/KEM.270-273.808
  8. M. Lysaker, S. Osher and X. C. Tai, "Noise Removal Using Smoothed Normals and Surface Fitting," IEEE Transactions on Image Processing, Vol. 13, No. 10, pp. 1345-1357, pp. 2004. https://doi.org/10.1109/TIP.2004.834662

Cited by

  1. Adaptive Detection of Unusual Heartbeat According to R-wave Distortion on ECG Signal vol.51, pp.9, 2014, https://doi.org/10.5573/ieie.2014.51.9.200
  2. 블랍 크기와 휘도 차이에 따른 결함 가능성을 이용한 TFT-LCD 결함 검출 vol.19, pp.6, 2014, https://doi.org/10.9723/jksiis.2014.19.6.043
  3. TFT-LCD 영상에서 누적히스토그램을 이용한 STD 결함검출 알고리즘 vol.19, pp.8, 2014, https://doi.org/10.9717/kmms.2016.19.8.1288