Sputtering Growth of ZnO Thin-Film Transistor Using Zn Target

Zn 타겟을 이용한 ZnO 박막트랜지스터의 스퍼터링 성장

  • Yu, Meng (Department of Electrical and Computer Engineering, Ajou University) ;
  • Jo, Jungyol (Department of Electrical and Computer Engineering, Ajou University)
  • 우맹 (아주대학교 정보통신대학 전자공학과) ;
  • 조중열 (아주대학교 정보통신대학 전자공학과)
  • Received : 2014.09.01
  • Accepted : 2014.09.22
  • Published : 2014.09.30

Abstract

Flat panel displays fabricated on glass substrate use amorphous Si for data processing circuit. Recent progress in display technology requires a new material to replace the amorphous Si, and ZnO is a good candidate. ZnO is a wide bandgap (3.3 eV) semiconductor with high mobility and good optical transparency. ZnO is usually grown by sputtering using ZnO ceramic target. However, ceramic target is more expensive than metal target, and making large area target is very difficult. In this work we studied characteristics of ZnO thin-film transistor grown by rf sputtering using Zn metal target and $CO_2$. ZnO film was grown at $450^{\circ}C$ substrate temperature, with -70 V substrate bias voltage applied. By using these methods, our ZnO TFT showed $5.2cm^2/Vsec$ mobility, $3{\times}10^6$ on-off ratio, and -7 V threshold voltage.

Keywords

References

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