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Solution of TM Scattering by a Conductive Strip Grating Over the Grounded Two Dielectric Layers with Edge Boundary Condition

모서리 경계조건을 만족하는 접지된 2개의 유전체층 위의 도체띠 격자구조에 의한 TM 산란의 해

  • Received : 2013.07.08
  • Accepted : 2013.08.30
  • Published : 2013.08.30

Abstract

In this paper, the TM (Transverse Magnetic) scattering problems by a perfectly conducting strip grating over a grounded two dielectric layers with edge boundary condition are analyzed by applying the FGMM (Fourier Galerkin Moment Method). For the TM scattering problem, the induced surface current density is expected to the very high value at both edges of the strip, then the induced surface current density on the conductive strip is expanded in a series of the multiplication of the Chebyshev polynomials of the first kind and the functions of appropriate edge boundary condition. Generally, when the value of the relative permittivity of dielectric layers over the ground plane increased, the strip width according to the sharp variation points of the reflected power is shifted to a higher value. The numerical results shown the fast convergent solution and good agreement compared to those of the existing papers.

본 논문에서는 모서리 경계조건을 만족하는 접지된 2개의 유전체층 위의 완전도체띠 격자구조에 의한 TM(Transverse Magnetic) 산란 문제를 수치해석 방법인 FGMM (Fourier Galerkin Moment Method)를 이용하여 해석하였다. TM 산란에 대하여 도체띠에 유도되는 표면 전류밀도는 스트립 양 끝에서 매우 큰 값이 예측되므로, 이때 도체띠에 유도되는 표면 전류밀도는 1종 Chebyshev 다항식과 적절한 모서리 경계조건을 만족하는 함수의 곱의 급수로 전개하였다. 전반적으로, 접지평면 위에 유전체층의 비유전율의 값이 증가하면, 반사전력의 급변점에 대한 스트립 폭은 더 큰 값으로 이동하였다. 수치결과들은 기존 논문들과 비교하여 급속한 수렴해와 좋은 일치를 보였다.

Keywords

References

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