DPSS UV laser projection ablation of 10μm-wide patterns in a buildup film using a dielectric mask

Dielectric 마스크 적용 UV 레이저 프로젝션 가공을 이용한 빌드업 필름 내 선폭 10μm급 패턴 가공 연구

  • 손현기 (한국기계연구원 광응용기게연구실) ;
  • 박종식 ((주)리스광시스템 기술부설연구소) ;
  • 정수정 ((주)큐엠씨 연구소) ;
  • 신동식 (한국기계연구원 광응용기게연구실) ;
  • 최지연 (한국기계연구원 광응용기게연구실)
  • Received : 2013.09.12
  • Accepted : 2013.09.24
  • Published : 2013.09.30

Abstract

To engrave high-density circuit-line patterns in IC substrates, we applied a projection ablation technique in which a dielectric ($ZrO_2/SiO_2$) mask, a DPSS UV laser instead of an excimer laser, a refractive beam shaping optics and a galvo scanner are used. The line/space dimension of line patterns of the dielectric mask is $10{\mu}m/10{\mu}m$. Using a ${\pi}$ -shaper and a square aperture, the Gaussian beam from the laser is shaped into a square flap-top beam; and a telecentric f-${\theta}$ lens focuses it to a $115{\mu}m{\times}105{\mu}m$ flat-top beam on the mask. The galvo scanner before the f-${\theta}$ lens moves the beam across the scan area of $40mm{\times}40mm$. An 1:1 projection lens was used. Experiments showed that the widths of the engraved patterns in a buildup film ranges from $8.1{\mu}m$ to $10.2{\mu}m$ and the depths from $8.8{\mu}m$ to $11.7{\mu}m$. Results indicates that it is required to increase the projection ratio to enhance profiles of the engraved patterns.

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