Applied Microscopy

Korean Society of Microscopy (한국현미경학회)
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Technical Investigation into the In-situ Electron Backscatter Diffraction Analysis for the Recrystallization Study on Extra Low Carbon Steels

  • Kim, Ju-Heon (High Temperature Energy Materials Research Center, Korea Institute of Science and Technology) ;
  • Kim, Dong-Ik (High Temperature Energy Materials Research Center, Korea Institute of Science and Technology) ;
  • Kim, Jong Seok (Department of Materials Science and Metallurgical Engineering, Sunchon National University) ;
  • Choi, Shi-Hoon (Department of Materials Science and Metallurgical Engineering, Sunchon National University) ;
  • Yi, Kyung-Woo (Department of Materials Science and Engineering, Seoul National University) ;
  • Oh, Kyu Hwan (Department of Materials Science and Engineering, Seoul National University)
  • Received : 2013.06.12
  • Accepted : 2013.06.20
  • Published : 2013.06.30
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Abstract

Technical investigation to figure out the problems arising during in-situ heating electron backscatter diffraction (EBSD) analysis inside scanning electron microscopy (SEM) was carried out. EBSD patterns were successfully acquired up to $830^{\circ}C$ without degradation of EBSD pattern quality in steels. Several technical problems such as image drift and surface microstructure pinning were taking place during in-situ experiments. Image drift problem was successfully prevented in constant current supplying mode. It was revealed that the surface pinning problem was resulted from the $TiO_2$ oxide particle formation during heating inside SEM chamber. Surface pinning phenomenon was fairly reduced by additional platinum and carbon multi-layer coating before in-situ heating experiment, furthermore was perfectly prevented by improvement of vacuum level of SEM chamber via leakage control. Plane view in-situ observation provides better understanding on the overall feature of recrystallization phenomena and cross sectional in-situ observation provides clearer understanding on the recrystallization mechanism.

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References

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